BS EN 62132-3-2007 Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz. Bulk current injection (BCI) method.pdf
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1、BRITISH STANDARD BS EN 62132-3:2007 Integrated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 3: Bulk current injection (BCI) method The European Standard EN 62132-3:2007 has the status of a British Standard ICS 31.200 ? BS EN 62132-3:2007 This British Standard was published
2、 under the authority of the Standards Policy and Strategy Committee on 30 November 2007 BSI 2007 ISBN 978 0 580 53403 4 National foreword This British Standard is the UK implementation of EN 62132-3:2007. It is identical to IEC 62132-3:2007. The UK participation in its preparation was entrusted to T
3、echnical Committee EPL/47, Semiconductors. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a
4、British Standard cannot confer immunity from legal obligations. Amendments issued since publication Amd. No. DateComments EUROPEAN STANDARD EN 62132-3 NORME EUROPENNE EUROPISCHE NORM October 2007 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrote
5、chnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62132-3:2007 E ICS 31.200 English version Integrated circuits
6、 - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007) Circuits intgrs - Mesure de limmunit lectromagntique, 150 kHz 1 GHz - Partie 3: Mthode dinjection de courant (BCI) (CEI 62132-3:2007) Integrierte Schaltungen - Messung der el
7、ektromagnetischen Strfestigkeit im Frequenzbereich von 150 kHz bis 1 GHz - Teil 3: Stromeinspeisungs- (BCI-)Verfahren (IEC 62132-3:2007) This European Standard was approved by CENELEC on 2007-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the con
8、ditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in
9、three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotech
10、nical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland a
11、nd the United Kingdom. EN 62132-3:2007 2 Foreword The text of document 47A/773/FDIS, future edition 1 of IEC 62132-3, prepared by SC 47A, Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62132-3 on 2007-10-01.
12、The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2010-10-01 Annex ZA h
13、as been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62132-3:2007 was approved by CENELEC as a European Standard without any modification. _ w w w . b z f x w . c o m 3 EN 62132-3:2007 CONTENTS 1 Scope and object4 2 Normative references .4 3 Terms and definitions
14、 .4 4 General4 5 Test conditions.5 5.1 General.5 5.2 Test equipment6 5.3 Test board.6 6 Test procedure .8 6.1 Hazardous electromagnetic fields.8 6.2 Calibration of forward power limitation8 6.3 BCI test.9 6.4 BCI test set-up characterization procedure.10 7 Test report .11 Annex A (informative) Examp
15、les for test levels and frequency step selection.12 Annex B (informative) Example of BCI test board and set-up 14 Annex C (informative) Example of RF test board and set-up .17 Annex ZA (normative) Normative references to international publications with their corresponding European publications19 Bib
16、liography .18 Figure 1 Principal current path when using BCI.5 Figure 2 Schematic diagram of BCI test set-up .6 Figure 3 Example test board, top view7 Figure 4 Calibration set-up.9 Figure 5 BCI test procedure flowchart for each frequency step10 Figure 6 Impedance validation test set-up 10 Figure B.1
17、 General view.14 Figure B.2 Example of top view of the test board 15 Figure B.3 Test board build-up .15 Figure B.4 Test board and copper fixture16 Figure B.5 Example of a non-conductive probes support fixture 16 Figure C.1 Compact RF coupling to differential IC ports17 Table A.1 Test severity levels
18、 12 Table A.2 Linear frequency step.13 Table A.3 Logarithmic frequency step.13 w w w . b z f x w . c o m EN 62132-3:2007 4 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 kHz TO 1 GHz Part 3: Bulk current injection (BCI) method 1 Scope and object This part of IEC 62132 describes a b
19、ulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is
20、used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals. 2 Normative references The following r
21、eferenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 62132-1:2006, Integrated circuits Measurement of electromagn
22、etic immunity, 150 kHz to 1 GHz Part 1: General conditions and definitions 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 62132-1 apply. 4 General The characterization of RF immunity (or susceptibility) of an integrated circuit (IC) is essential to
23、define the optimum design of a printed circuit board, filter concepts and for further integration into an electronic system. This document defines a method for measuring the immunity of ICs to RF current induced by electromagnetic disturbance. This method is based on the bulk current injection (BCI)
24、 method used for equipment and systems 1, 2, 3. The BCI method simulates the induced current as a result of direct radiated RF signals coupled onto the wires and cables of equipment and systems. In general, in electronic systems, off-board wire connections or traces on the printed circuit board act
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