BS EN 623-5-2009 先进技术陶瓷.单片陶瓷的一般和结构特性.利用显微图像评估法测定相体积分数.pdf
《BS EN 623-5-2009 先进技术陶瓷.单片陶瓷的一般和结构特性.利用显微图像评估法测定相体积分数.pdf》由会员分享,可在线阅读,更多相关《BS EN 623-5-2009 先进技术陶瓷.单片陶瓷的一般和结构特性.利用显微图像评估法测定相体积分数.pdf(22页珍藏版)》请在三一文库上搜索。
1、 W - - - - - - - - 7- - 7- 7- - 77- 77- - 7 - 7 - - - - - - - - - - - $ - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - W W D - w - - - - EN 623-5:2009 (E) 2 Contents page 1Scope 4 2Normative references 4 3Terms and definitions . 5 4Apparatus . 5 4.1Sectioning equipment . 5 4.2Moun
2、ting equipment 5 4.3Grinding and polishing equipment 5 4.4Microscope . 5 4.5Transparent grid 5 5Test piece preparation 6 5.1Sampling . 6 5.2Cutting 6 5.3Mounting . 6 5.4Grinding and polishing . 6 5.5Etching 6 6Photomicrography . 7 6.1General aspects . 7 6.2Inspection . 7 6.3Number of micrographs 7 6
3、.4Optical microscopy 7 6.5Scanning electron microscopy (SEM) . 7 7Measurement of micrographs 8 8Calculation of results 8 9Interferences and uncertainties . 9 10Test report 9 Annex A (informative) Grinding and polishing procedures . 11 Annex B (informative) Etching procedures . 13 Annex C (informativ
4、e) Use of automatic image analysis (AIA) 14 C.1Background 14 C.2Analysis techniques 14 C.3Micrograph requirements . 14 C.4Calibration 14 Annex D (informative) Setting Khler illumination in an optical microscope 15 D.1Purpose . 15 D.2Definition 15 D.3Setting up for Khler illumination 15 Annex E (info
5、rmative) Round robin verification of this procedure . 16 Annex F (informative) Results sheet 17 Bibliography 18 EN 623-5:2009 (E) 3 Foreword This document (EN 623-5:2009) has been prepared by Technical Committee CEN/TC 184 “Advanced technical ceramics”, the secretariat of which is held by BSI. This
6、European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by January 2010, and conflicting national standards shall be withdrawn at the latest by January 2010. Attention is drawn to the possibility that some of the
7、 elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. This document supersedes ENV 623-5:2002. EN 623 consists of five parts, under the general title “Advanced technical ceramics - Monolithic ce
8、ramics - General and textural properties“: Part 1: Determination of the presence of defects by dye penetration Part 2: Determination of density and porosity Part 3: Determination of grain size and size distribution (characterized by the Linear Intercept Method) Part 4: Determination of surface rough
9、ness Part 5: Determination of phase volume fraction by evaluation of micrographs According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denma
10、rk, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. EN 623-5:2009 (E) 4 1 Scope This part of EN 623 specifies a ma
11、nual method of making measurements for the determination of volume fraction of major phases in advanced technical ceramics using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase. NOTE 1 This method assumes
12、that the true phase volume fractions are equivalent to area fractions on a randomly cut cross- section according to stereological principles. NOTE 2 Guidelines for polishing and etching of advanced technical ceramics can be found in Annexes A and B. The method applies to ceramics with one or more di
13、stinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC,or Al2O3/SiCw. If the test material contains discrete pores, these can be treated as a secondary phase for the purpose of this method provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.
14、 NOTE 3 If the material contains more than about 20 % porosity there is a strong risk that the microstructure will be damaged during the polishing process, and measurement of volume fraction of pores may become misleading. Secondary phase volume fractions or porosity present at levels of less than 0
15、,05 are subject to considerable error and potential scatter in results. A larger number of micrographs than the minimum of three is normally needed to improve the consistency and accuracy of the results. NOTE 4 Many ceramics contain small amounts of secondary glassy phases. In order to make a reason
16、able estimate of glassy phase content, the glass material between crystalline grains should be readily observable, and thus should be at least 0,5 m in width. The method in this European Standard is not considered appropriate for narrow glassy films around grains. This method assumes that the select
17、ed regions of a prepared cross-section are statistically representative of the whole sampled section. NOTE 5 Microstructures are seldom homogeneous, and the phase contents can vary from micrograph to micrograph. It is essential to survey a sufficiently wide area of the prepared section to ensure tha
18、t those areas selected for evaluation are representative, and do not contain eye-catching irregularities. Some users of this European Standard can wish to apply automatic or semiautomatic image analysis to micrographs or directly captured microstructural images. This is currently outside the scope o
19、f this European Standard, but some guidelines are given in Annex C. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced doc
20、ument (including any amendments) applies. EN 1006, Advanced technical ceramics - Monolithic ceramics - Guidance on the selection of test pieces for the evaluation of properties EN ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories (ISO/IEC 17025:2005) EN 6
21、23-5:2009 (E) 5 3 Terms and definitions For the purposes of this part of EN 623, the following terms and definitions apply. 3.1 phase volume fraction volume occupied by a distinct, identifiable phase present in a material expressed as a fraction of the whole 3.2 secondary phase one or more distinct
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- BS EN 623-5-2009 先进技术陶瓷.单片陶瓷的一般和结构特性.利用显微图像评估法测定相体积分数 623 2009 先进技术 陶瓷 单片 一般 结构 特性 利用 显微 图像 评估 测定 体积
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