IEEE Std C37.239-2010 IEEE Standard for Common Format for Event Data Exchange (COMFEDE) for Power Systems.pdf
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1、 IEEE Standard for Common Format for Event Data Exchange (COMFEDE) for Power Systems Sponsored by the IEEE Power System Relaying Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 11 November 2010 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educa
2、tional classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 12:48:44 UTC from IEEE Xplore. Restrictions apply. iv Copyright 2010 IEEE. All rights reserved. Introduction This intro
3、duction is not part of IEEE Std C37.239-2010, IEEE Standard for Common Format for Event Data Exchange (COMFEDE) for Power Systems. Power network fault event data are indispensable to the analysis, testing, evaluation, and simulation of power systems and related protection schemes. The flexibility pr
4、ovided by digital devices in recording such event data has brought about a situation wherein the users of these records are confronted with the difficulty of dealing with the different formats used by each device to generate, store, and transmit the recorded data. Notice to users Laws and regulation
5、s Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory req
6、uirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and p
7、rivate uses. These include both use, by reference, in laws and regulations, and use in private self- regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not
8、waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An offi
9、cial IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrig
10、enda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http
11、:/standards.ieee.org. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 12:48:44 UTC from IEEE Xplore. Restrictions apply. v Copyright 2010 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the follo
12、wing URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is call
13、ed to the possibility that implementation of standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying
14、Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements ar
15、e reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Author
16、ized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 12:48:44 UTC from IEEE Xplore. Restrictions apply. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Common Da
17、ta Format for IED Event Data Working Group had the following membership: Mark Adamiak, Chair Pierre L. Martin, Vice Chair Eric Allen Scott Anderson Alex Apostolov Christoph Brunner Jim Hacket Randy Hamilton Juergen Holbach Mladen Kezunovic Stanley Klein Larry Smith Stan Thompson Benton Vandiver The
18、following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Mark Adamiak S. Aggarwal James Ariza Ali Al Awazi Hugh Barrass Martin Baur Kenneth Behrendt Oscar Bolado Steven Brockschink Gustavo B
19、runello Suresh Channarasappa Arvind K. Chaudhary Keith Chow Stephen Conrad R. W. Corlew James Cornelison Carlo Donati Gary Donner Michael Dood Neal Dowling Gary Engmann Kenneth Fodero Jeffrey Gilbert Manjinder Gill Jalal Gohari Edwin Goodwin Randall Groves Roeer Hedding Gary Heuston Werner Hoelzl St
20、uart Holoman David Horvath C. Huntley Akio Iso R. Jackson Junghoon Jee Piotr Karocki Tanuj Khandelwal Yuri Khersonsky Yongburn Kim James Kinney Stanley Klein J. Koepfinger Jim Kulchisky Chung-Yiu Lam Charles Lennon James Liming G. Luri Pierre L. Martin William McBride John McDonald Gary Michel Keith
21、 Moore Jerry Murphy R. Murphy Bruce Muschlitz Anthony Napikoski Michael S. Newman Robert Orndorff Chris Osterloh Lorraine Padden Bansi Patel Farnoosh Rahmatian R. Ray Robert Robinson Charles Rogers Sukhbir Sachdev Bob Saint Miriam Sanders Steven Sano Bartien Sayogo Thomas Schossig Lubomir Sevov Devk
22、i Sharma Gil Shultz Mark Simon Vesselin Skendzic James Smith Jerry Smith John Spare Gary Stoedter Michael Swearingen Richard Taylor John Tengdin John Toth Demetrios Tziouvaras Joe Uchiyama Eric Udren Sterling Vaden Srinivasa Vemuru John Vergis Jane Verner John Wang Hung-Yu Wei Kenneth White Philip W
23、inston Paul Work Richard Young Oren Yuen Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 12:48:44 UTC from IEEE Xplore. Restrictions apply. vii Copyright 2010 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 30 S
24、eptember 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past President Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick Da
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