IEEE Std 775-1993 IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment.pdf
《IEEE Std 775-1993 IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment.pdf》由会员分享,可在线阅读,更多相关《IEEE Std 775-1993 IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment.pdf(22页珍藏版)》请在三一文库上搜索。
1、IEEE Std 775-1993 IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in-a Radiation Environment Sponsor Radiation Effects Committee of the IEEE Dielectrics and Electrical Insulation Society Approved June 17,1993 IEEE Standards Board Abstract: Guidelines for evaluating electric
2、al insulation materials that are subjected to more than one significant aging stress are provided. The focus is on materials or equipment intended for use in nuclear facilities, such as power stations, where thermal, moisture, and radiation stresses fre- quently are of importance. Factors to conside
3、r in accelerated aging programs are identified. Only the design of tests is addressed. Specific procedures are not prescribed. Keywords: electrical insulation, multistress aging, single stress aging The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 1001 7-
4、2394, USA Copyright 0 1993 by the Institute of Electrical and Electronics Engineers, Inc All rights reserved Published 1993 Printed in the United States of America ISBN 1-55937-339-3 No part of thrs pubbcatron may be reproduced rn any form. rn an elecfronrc retrreval system or otherwrse, wrthout the
5、 prior wrrnen permrss/on of the publrsher Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:51:39 UTC from IEEE Xplore. Restrictions apply. IEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordin
6、ating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those
7、 activities outside of IEEE that have expressed an interest in partici- pating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, mar- ket, or provide othe
8、r goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is
9、subjected to review at least every five years for revision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned
10、to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Suggestions for changes in docu- ments should be in the form of a proposed change of text, toge
11、ther with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare ap
12、pro- priate responses. Since IEEE Standards represent a consensus of all concerned inter- ests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason IEEE and the members of its technical com- mittees are not able to provide an
13、 instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855- 133 1 USA
14、 I i IEEE Standards documents are adopted by the Institute of Electrical and Electronics Engineers without regard to whether their adoption may involve patents on articles, materials, or processes. Such adoption does not assume any liability to any patent owner, nor does it assume any obligation wha
15、tever to parties adopting the standards documents. A Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:51:39 UTC from IEEE Xplore. Restrictions apply. Introduction (This introduction is not part of IEEE Std 775-1993, IEEE Guide for Designing Multistress Agin
16、g Tests of Electrical Insulation in a Radiation Environment.) This guide, which is intended for use by engineers and researchers designing aging tests, has been compiled from inputs primarily from scientists involved in polymer research. The need for it is made evident by the variety of approaches t
17、o aging program design in current practice that have uncertanities or disagreements regarding their fundamental validity. As a number of research projects now under way bear directly on the fundamental understanding of the chemistry and physics of multifactor aging, standards developers in this fiel
18、d are aiming at a moving target. Thus, the working group acknowledges that any guide will be outdated by the time of its printing. The work- ing group also recognizes that much more material could have been included that might have been of value to some users. Therefore, the working group welcomes i
19、nput from readers, particularly concerning basic concepts of aging mechanisms other than those included in this guide, that lead to an understanding of mul- tistress interactions or the validity of making time extrapolations from accelerated aging tests. At the time that this guide was approved, the
20、 working group had the following membership: J. Laghari, Chair B. Bernstein E. Brancato L. Bustard E Campbell J. Gardner The following persons were on the balloting committee: K. Baker B. Bernstein E. Boulter E. Brancato F. Campbell R. Flaherty J. Gardner K. Gillen J. Laghari K. Gillen W. Sarjeant J
21、. Winslow T. Ling W. Sargeant P. Silverberg J. Tanaka J. Winslow When the IEEE Standards Board approved this standard on June 17. 1993, it had the following membership: Wallace S. Read, Chair Donald C. Loughry, Vice Chair Andrew G. Salem, Secretary Gilles A. Baril JosC A. Berrios de la Paz Clyde R.
22、Camp Donald C. Fleckenstein Jay Forster* David F. Franklin Ramiro Garcia Donald N. Heirman Jim Isaak Ben C. Johnson Walter J. Karplus Lorraine C. Kevra E. G. “AI” Kiener lvor N. Knight Joseph L. Koepfinger* D. N. “Jim” Logothetis *Member Emeritus Also included are the following nonvoting IEEE Standa
23、rds Board liaisons: Satish K. Aggarwal James Beall Richard B. Engelman David E. Soffrin Stanley Warshaw Don T. Michael* Marco W. Migliaro L. John Rankine Arthur K. Reilly Ronald H. Reimer Gary S. Robinson Leonard L. Tripp Donald W. Zipse Adam Sicker IEEE Stundurds Project Editor . Ill Authorized lic
24、ensed use limited to: Peking University. Downloaded on December 26,2010 at 16:51:39 UTC from IEEE Xplore. Restrictions apply. THIS PAGE WAS BLANK IN THE ORIGINAL Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:51:39 UTC from IEEE Xplore. Restrictions apply
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- IEEE Std 775-1993 Guide for Designing Multistress Aging Tests of Electrical Insulation in Radiation Environment 775
链接地址:https://www.31doc.com/p-3658708.html