IEEE Std C37.90.2-2004 IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers.pdf
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1、IEEE Std C37.90.2-2004 (Revision of IEEE Std C37.90.2-1995) IEEE Standards C37.90.2 TM IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers 3 Park Avenue, New York, NY 10016-5997, USA IEEE Power Engineering Society Sponsored by the Power
2、Systems Relaying Committee IEEE Standards 17 December 2004 Print: SH95285 PDF: SS95285 Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Ave
3、nue, New York, NY 10016-5997, USA Copyright 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 17 December 2004. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portion
4、s of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no posi
5、tion is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that a
6、re brought to its attention. Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved.iii Introduction IEEE Standard for Withstand Capability of Relay Systems to Radiated El
7、ectromagnetic Interference from Transceivers was developed and published initially as a Trial Use Standard with an field strength requirement of 10 volts/meter over the frequency range of 25 Mhz. to 1000 Mhz. The Trial Use standard expired after 2 years of publication. Following reviews of inputs re
8、ceived from use of the Trial Use Standard, the final C37.90.2 document was subsequently released with a field strength requirement of 35 volts/meter. This field strength magnitude was established based upon test information received from the Working Group members. This publication is a revision of t
9、he IEEE Std C37.90.2-1995. This revision of IEEE Std C37.90.2 contains changes so it will harmonize more closely with currently published IEC standards whenever possible. The test requirement changes are as described below. a)The minimum test frequency of the sweep range has been changed from 25 Mhz
10、 to 80 Mhz, which is the same as IEC 60255-22-3 B1. b)The maximum sweep rate was changed from 0.005 octave/sec. to 1.5 103 decades per second, which is the same as IEC 60255-22-3 B1. c)Added a Spot Frequency test, as specified in IEC 60255-22-3 B1. Notice to users Errata Errata, if any, for this and
11、 all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/
12、ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection
13、therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. (This introduction is not par
14、t of IEEE Std C37.90.2-2004, IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers.) Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. ivCopyright
15、 2004 IEEE. All rights reserved. Participants This standard was prepared by the I18 Working Group of the Relaying Practices Subcommittee of the IEEE Power System Relaying Subcommittee. At the time this standard was approved, the working group had the following members. Jeffrey A. Burnworth, Chair At
16、 the time this standard was approved, the Relaying Practices and Consumers Interface Subcommittee membership was as follows: J. Gilbert, Chair Jeffrey Gilbert William Higinbotham G. Johnson William C. Kotheimer Robert D. Pettigrew Roger E. Ray Miriam Sanders Mark Simon Veselin Skendzic John Tengdin
17、A. P. Apostolov M. Bajpai B. L. Beckwith J. R. Boyle Jeffrey A. Burnworth M. W. Carpenter Jack Chadwick, Jr. M. Clark M. W. Conroy C. Downs P. R. Drum I. O. Hasenwinkle S. H. Horowitz J. D. Huddleston J. W. Ingleson M. Kezunovic William C. Kotheimer P. A. Kotos E. Kritzauskas W. Lowe W. J. Marsh, Jr
18、. M. J. McDonald P. J. Mclaren M. Meisinger B. Nelson Robert D. Pettigrew T. Phillippee M. M. Renieri M. S. Sachdev T. S. Sidhu Mark Simon L. E Smith J. E. Stephens R. Sullivan Mark Swanson J. Teague J. S. Thorp D. A. Tziouvaras E. A. Udren Y. Young S. E. Zocholl Authorized licensed use limited to:
19、BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved.v The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention.
20、 When the IEEE-SA Standards Board approved this standard on 24 September 2004, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC R
21、epresentative Richard DeBlasio, DOE Representative Alan Cookson, NIST Representative William Ackerman Steve Alexanderson Munnu Bajpai Michael Basler Kenneth Behrendt Robert Beresh Stuart Bouchey Daniel Brosnan Gustavo Brunello John Burger Jeffrey A. Burnworth John W. Chadwick, Jr. R Daubert Byron Da
22、venport Matthew Davis Paul Drum Amir El-Sheikh Walter Elmore Gary Engmann Kenneth Fodero Marcel Fortin Frank Gerleve Jeffrey Gilbert Anthony Giuliante Roger Hedding Charles Henville William Higinbotham Edward Horgan, Jr. John Horwath James D. Huddleston, III Joseph L Koepfinger William Kotheimer Mar
23、c Lacroix Jason Lin William Lowe John McDonald Mark McGranaghan Gary Michel Bruce Muschlitz Gerald Nicely Mario Ranieri Peter Raschio Roger E. Ray Michael Roberts Charles Rogers James Ruggieri Mohindar S. Sachdev Miriam Sanders Tarlochan Sidhu H. Jin Sim Mark Simon H. Lee Smith James Smith John Teng
24、din Ron Westfall Karl Zimmerman Charles Wagner Chuck Adams H. Stephen Berger Mark D. Bowman Joseph A. Bruder Bob Davis Roberto de Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Hermann Koch Thom
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