IEEE Std C57.21-2008 IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA.pdf
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1、IEEE Std C57.21-2008 (Revision of IEEE Std C57.21-1990) IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA IEEE 3 Park Avenue New York, NY 10016-5997, USA 1 August 2008 IEEE Power Engineering Society Sponsored by the Transformers Committee C57.21 TM IEEE Std
2、 C57.21-2008 (Revision of IEEE Std C57.21-1990) IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 27 March 2008 IEEE-SA Standards Board Abstract: All oil-immersed or dry-type, sin
3、gle-phase or three-phase, outdoor or indoor shunt reactors rated over 500 kVA are covered. Terminology and general requirements are stated, and the basis for rating shunt reactors is set forth. Routine, design, and other tests are described, and methods for performing them are given. Losses and impe
4、dance, temperature rise, dielectric tests, and insulation levels are covered. Construction requirements for oil-immersed reactors and construction and installation requirements for dry-type reactors are presented. This standard also covers thyristor-controlled shunt reactors used in static var compe
5、nsators. Keywords: dielectric tests, dry-type shunt reactor, oil-immersed shunt reactor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published
6、 1 August 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2008 IEEE. A
7、ll rights reserved. Introduction This introduction is not part of IEEE Std C57.21-2008, IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA. IEEE Std C57.21 was first published in 1971. It was subsequently revised in 1981 and 1990 and reaffirmed in 1995 and 2
8、004. The current revision process has focused on the following: a) Annex A (normative) has been added to cover the specific requirements for dry-type air-core thyristor-controlled shunt reactors, which are an important component of static var compensator systems. Specific clauses, subclauses, tables
9、, etc., in the main body of IEEE Std C57.21-2008 are referenced regarding specification and test code. Other aspects of specification and test code are covered in Annex A. b) Annex B (informative) has been added to provide background information on dielectric stresses imposed on shunt reactors durin
10、g switching. The objective of Annex B is to provide guidance regarding the application and design of shunt reactors, especially in consideration of the significant switching duty and the associated repetitive dielectric stresses. As a consequence of the switching stresses seen by shunt reactors, red
11、uced BIL (basic lightning-impulse insulation levels), which is common practice for power transformers, are no longer recommended and are not included in Table 5. Formal input regarding the content of this annex was requested of the IEEE Switchgear Committee and was provided. Input was also received
12、from members of IEC MT32 on Inductive Load Switching. c) Table 5A and Table 5B in the previous version (IEEE Std C57.21-1990) have been combined into one table as Table 5 (insulation levels of shunt reactors). Separate tables for dry-type and oil- immersed shunt reactors were not deemed necessary as
13、 test levels are network-dependent and are independent of shunt reactor technology. Maximum system voltage is introduced to be consistent with terminology in the IEC reactor standard (see IEC 60076-6:2007 B18).a Notice to users Laws and regulations Users of these documents should consult all applica
14、ble laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its s
15、tandards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in
16、 laws and regulations, and use in private self- regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. a The
17、 numbers in brackets correspond to those of the bibliography in Annex D. 标准分享网 w w w .b z f x w .c o m 免费下载 v Copyright 2008 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new edition
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19、cument is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the
20、IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encou
21、raged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matt
22、er covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries
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24、 determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was submitted to the IEEE-SA Standards Board for app
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