Standard for Learning Technology - Data Model for Reusable Competency Definitions.pdf
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1、IEEE Std 1484.20.1-2007 IEEE Standard for Learning TechnologyData Model for Reusable Competency Definitions IEEE 3 Park Avenue New York, NY 10016-5997, USA 25 January 2008 IEEE Computer Society Sponsored by the Learning Technology Standards Committee 1484.20.1 TM Authorized licensed use limited to:
2、Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore. Restrictions apply. IEEE Std 1484.20.1TM-2007 IEEE Standard for Learning Tec
3、hnologyData Model for Reusable Competency Definitions Sponsor Learning Technology Standards Committee of the IEEE Computer Society Approved 27 September 2007 IEEE-SA Standards Board Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore
4、. Restrictions apply. This Standard is based on the IMS Reusable Definition of Competency or Educational Objective Specification, Version 1.0, published on October 25, 2002, by the IMS Global Learning Consortium, Inc. Abstract: This Standard defines a data model for describing, referencing, and shar
5、ing competency definitions, primarily in the context of online and distributed learning. This Standard provides a way to represent formally the key characteristics of a competency, independently of its use in any particular context. It enables interoperability among learning systems that deal with c
6、ompetency information by providing a means for them to refer to common definitions with common meanings. Keywords: competency, competency definition, reusable competency definition The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008
7、by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 25 January 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational class
8、room use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore. Restrictions apply. iv Copyright 2008 IEEE. All rights reserved. Introduction This introduction is not part of
9、 IEEE Std 1484.20.1-2007, IEEE Standard for Learning TechnologyData Model for Reusable Competency Definitions. This Standard defines a data model for describing, referencing, and sharing competency definitions, primarily in the context of online and distributed learning. This Standard provides a way
10、 to represent formally the key characteristics of a competency, independently of its use in any particular context. It enables interoperability among learning systems that deal with competency information by providing a means for them to refer to common definitions with common meanings. Dedication T
11、he LTSC Reusable Competency Definitions Working Group dedicates this standard to the memory of Claude Ostyn. As chair of the LTSC 1484.20 Working Group, he provided initiative, guidance, and technical insight that made this standard possible. His hard work is much appreciated and will be remembered.
12、 Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at
13、the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the exist
14、ence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions
15、 are reasonable or non- discriminatory. Further information may be obtained from the IEEE Standards Association. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore. Restrictions apply. v Copyright 2008 IEEE. All rights reserved. Par
16、ticipants At the time this standard submitted to the IEEE-SA Standards Board for approval, the Competency Data Standards Working Group had the following membership: Claude Ostyn, Chair* Scott Lewis, Technical Editor Michael Brown Mike Collett Geoffrey Darnton Geoffrey A. Frank Jason L. Haag Chad J.
17、Kainz Fanny Klett Rolf Lindner Daniel R. Rehak Robby Robson Christian Stracke Schawn E. Thropp Luk Vervenne *Deceased The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Juan C. Carreon Keith
18、Chow Paul Colcher Tommy P. Cooper Geoffrey Darnton Thomas J. Dineen Kameshwar V. Eranki Allan M. Gillard John Garth Glynn Randall C. Groves Jason L. Haag Rutger A. Heunks Werner Hoelzl Dennis Horwitz Atushi Ito Chad J. Kainz Piotr Karocki Robert B. Kelsey Fanny Klett Mark J. Knight Susan Land Rolf L
19、indner Gregory Luri Jonathan C. Mason Gary Michel Georges F. Montillet Michael S. Newman Claude Ostyn Daniel R. Rehak Robert A. Robinson Robby Robson Randall M. Safier Bartien Sayogo Colin Smythe Thomas E. Starai Christian Stracke Schawn E. Thropp Mark A. Tillinghast Derek T. Woo When the IEEE-SA St
20、andards Board approved this guide on 27 September 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B.
21、Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Auth
22、orized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore. Restrictions apply. vi Copyright 2008 IEEE. All rights reserved. Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Mich
23、ael H. Kelley, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Michael D. Kipness IEEE Standards Program Manager, Technical Program Development Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 17:00:07 UTC from IEEE Xplore.
24、 Restrictions apply. Contents 1. Overview 1 1.1 Scope. 1 1.2 Purpose 1 2. Normative references 2 3. Definitions, acronyms, and abbreviations 2 3.1 Definitions. 2 3.2 Acronyms and abbreviations . 3 4. Special terms 3 5. Conformance 3 5.1 Shall and shall not 3 5.2 RCD instances. 3 5.3 Smallest permitt
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