BS-9300-C841-849-1971.pdf
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1、BRITISH STANDARD CONFIRMED MARCH 1980 BS 9300 C841-849 ISSUE 1 JANUARY 1971 Electronic parts of assessed quality Silicon voltage regulator diode Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C841-849
2、ISSUE 1 JANUARY 1971 BSI 04-2000 ISBN 0 580 34390 1 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal ob
3、ligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 7 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cov
4、er. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C841-849 ISSUE 1 JANUARY 1971 BSI 04-2000i Contents Page Table I Group A Inspection3 Table II
5、 Group B Inspection4 Table III Group C Inspection6 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C841-849 ISSUE 1 JANUARY 1971 ii BSI 04-2000 1. Specifications CV7841-CV7849 Issue 1 dated November 196
6、8 with their existing amendments which are reproduced below are hereby adopted as BS 9300 C841-849. 2. Devices inspected, released and supplied to this specification shall be marked CV7841-CV7849 as appropriate, and, where applicable with the letters KB. 3. The references to “Military specification”
7、, “Commercial equivalents”, “Reliability assurance provisions” or requirements and “Preparation for delivery” shall be disregarded. 4. In the Groups A, B and C inspection tables the references in the “K1007/NATO Ref” column shall be superseded by the appropriate reference given in BS 9300 Appendix C
8、 (Tables 1 to 5 inclusive). 5. Additional requirements not covered by BS 9300 Appendix C are: None 6. Published amendments (consolidated) None Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7841/CV7849
9、 Issue 1 November 1968 BSI 04-20001 Military specification CV7841 7849 Semiconductor devices, voltage regulator diodes Description:This specification covers the detail requirements for Silicon Voltage Regulator diodes and is in accordance with K 1007 Issue 3 except as otherwise stated. Mechanical di
10、mensions and outline: K 1007 Section B 10.3.3.1. Connections: Flange End Cathode. Absolute maximum ratings RatingPTOTTAMBTSTGShockVibration UnitWCCgg Min. 55 55 Max.1.01501501 50020 NoteAB NOTES: A.See derating curve. Figure 1, Page 7. B.Duration 0.5 mS. C.Commercial Equivalent BZY 95 series. Licens
11、ed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7841/CV7849 Issue 1 November 1968 2 BSI 04-2000 This specification has been prepared by, and the Qualification Approval Authority is: The Senior Director of Eng
12、ineering, Post office Telecommunications Headquarters TD 2 Branch, London. Primary electrical characteristics C.V. Number 123456789 VzVzVzIz (Test current) rzSzSz IR At 100 C VR (Test voltage) NomMinMaxMaxMinMax VoltsVoltsVoltsmAOhms%/C%/CmAVolts 7841 7842 7843 7844 7845 7846 7847 7848 7849 36 39 43
13、 47 51 56 62 68 75 34 37 40 44 48 53 58 64 71 38 41 45 50 54 60 66 72 79 10 10 10 10 10 10 10 10 10 55 60 65 70 75 85 95 110 120 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 27 30 33 36 39 43 47 51 56 Iz mA101010101010
14、TAMBC25252525100 Applicable Documents Requirements MarkingK 1007, Section B, 1.3.4. Quality Assurance Provisions Destructive TestsThe tests listed in Table 2. Group B, Sub-groups 2 and 3 and Table 3 Group C, Subgroup 2 are considered destructive. Group C InspectionThis inspection shall be conducted
15、on the initial lot, and thereafter every ninety days, or every fifth lot, whichever occurs first. Preparation for Delivery PackagingThe device shall be packed according to K 1007, Issue 3, Section A, 1.2. c) Joint Service Catalogue Number CV78415961- 99- 037- 5827 CV7842”5828 CV7843”5829 CV7844”5830
16、 CV7845”5831 CV7846”5832 CV7847”5833 CV7848”5834 CV7849”5835 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7841/CV7849 Issue 1 November 1968 BSI 04-20003 Table I Group A Inspection Examination or Test
17、 Test Condition AQL % Insp. Level Symbol Limits Units K 1007/NATO Ref. Specific Conditionsmin.max. SUB GROUP 1 Visual and Mechanical Inspection SUB GROUP 2 Breakdown Voltage Slope Resistance Forward Volt Drop SUB GROUP 3 Reverse Leakage 5.1 8A.2.4 8A.4.1 8A.3.2 8A.2.2.1 Excluding physical dimensions
18、 IZ as Col. 4. Page 2 IZ as Col. 4. page 2 Pulse method TPu 100 4S Duty Cycle u 1.0 % IF= 0.9A Tamb= 100 C VR= see col. 9, page 2 0.65 0.65 2.5 I II 1 VZ RZ VF IR Col. 2 Page 2 Col. 3 Page 2 Col. 5 Page 2 1.1 0.1 V 7 V mA Licensed Copy: London South Bank University, London South Bank University, Fri
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