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1、BRITISH STANDARD BS CECC 32201:1988 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed chip capacitors with metallized electrodes and polyethylene-terephthalate film dielectric for direct current Licensed Copy: London South Bank Unive
2、rsity, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-1999 ISBN 0 580 35551 9 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:3
3、6 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-1999i Contents Page National forewordii Forewordii 1General data1 2Inspection requirements2 Table 11 Table 21 Table 3 Other characteristics2 Table 4A Lot-by-lot inspection (Group A and B)3 Table 4B Periodic tests4 Licensed Copy:
4、London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical
5、 with CENELEC Electronic Components Committee (CECC) 32201:1987 “Blank detail specification: Fixed chip capacitors with metallized electrodes and polyethylene-terephthalate film dielectric for direct current”. This standard is a harmonized specification within the CECC System. Terminology and conven
6、tions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as
7、 a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC 00100 is BS 9000: “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Spec
8、ification for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements that shall be included as mandatory requirements in accordance with BS CECC 32200 in any detail specification for these devices. Inte
9、rnational StandardCorresponding British Standard aIEC 286-3:1986 BS 6062-3 Packaging of electronic components for automatic handling bPart 3: Packaging of leadless components on continuous tapes (Identical) IEC 410:1973BS 6001 Sampling procedures for inspection by attributes. Part 1:1972 Specificati
10、on for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection. (Technically equivalent) CECC 30000:1983BS CECC 30000:1984 Harmonized system of quality assessment for electronic components: Generic specification: Fixed capacitors. (Identical) CECC 32200:1987 bBS CECC 32200
11、: Harmonized system of quality assessment for electronic components: Sectional specification: Fixed chip capacitors with metallized electrodes and polyethylene-terephthalate dielectric for direct current. (Identical) a IEC = International Electrotechnical Commission. b In preparation. Licensed Copy:
12、 London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-1999iii Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be
13、in accordance with PD 9004 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obl
14、igations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, the CECC title page, pages ii to iv, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amen
15、dment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Unc
16、ontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-1999 ii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the
17、 European or Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures
18、 for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by CECC, and has been prepar
19、ed for those countries taking part in the System who wish to issue national harmonized specifications for FIXED CHIP CAPACITORS WITH METALLIZED ELECTRODES AND POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC FOR DIRECT CURRENT. It should be read in conjunction with the current regulations for the CECC Sys
20、tem. At the date of printing of this specification, the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom. Preface This specification was prepared by CECC WG 3 “Ca
21、pacitors”. It is based, wherever possible, on the Publication of the International Electrotechnical Commission. The text of this specification was circulated to the CECC for voting in the document(s) indicated (listed) below and was ratified by the President of the CECC for printing as a CECC Specif
22、ication. Identification of the DS and the component The first page of the DS should have the layout recommended on page iii. The numbers in square brackets correspond to the indications to be completed thereunder: DocumentDate of VotingReport on the Voting CECC(Secretariat)1917April 1986CECC(Secreta
23、riat)2016 1The name of the National Standards Organization under whose authority the DS is published and, if applicable, the organization from whom the DS is available. 2The CECC symbol and the number allotted to the DS by the CECC General Secretariat. 3The number and issue number of the CECC generi
24、c and sectional specification as relevant also national reference if different. 4If different from the CECC number, the national number of the DS, date of issue and any further information required by the national system, together with any amendment numbers. 5A brief description of the component or
25、range of components. 6Information on typical construction (where applicable). For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC 00200 (QPL) and CECC 00300 (Library List). 7An outline drawing with main dimensions which are of importance for interchangeability, and/or
26、reference to the appropriate national or international document for outlines. Alternatively, this drawing may be given in an annex to the DS, but 7 should always contain an illustration of the general outer appearance of the component. 8The level(s) of quality assessment covered by the DS. 9Referenc
27、e data giving information on the most important properties of the component which allow comparison between the various component types intended for the same, or for similar, applications. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, U
28、ncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-1999iii Specification available from: (National Standards Organization) 1 CECC number and mark2 (National number of detail specification, date of issue, National type number, if any) ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN
29、 ACCORDANCE WITH: (Number of national generic and sectional specification) 34 Outline and dimensions: (Example) 7 DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC CHIP CAPACITORS FOR DIRECT CURRENT 5 The cross hatched areas are metallized TYPICAL CONSTRUCTION: (Ex
30、ample) 6 (metallized areas, strip, etc.) Assessment level E8 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, rated voltage range, climatic category performance grade 9 Information about manufacturers who have components qualified to this detail specification is available in the
31、 current CECC 00200: Qualified Products List. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 20
32、06, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-19991 1 General data 1.1 Recommended method of mounting The capacitors are mounted by their terminations. See 1.3.2 of the sectional specification CECC 32200. 1.2 Dimensions Table 1 NOTE 1When there is no case size reference, Table 1 may be om
33、itted and the dimensions shall be given in Table 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. 1.3 Ratings and characteristics Table 2 1.4 Related documents 1.5 Marking The marking of the capacitor and the packing
34、shall be in accordance with the requirements of 1.5 of CECC 32200. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, th
35、e following minimum information: 1) Rated capacitance 2) Tolerance on rated capacitance 3) Rated voltage 4) Number and issue reference of detail specification and style reference. 5) Packaging (bulk or taped; if taped, according to IEC 286-3) Case size Dimensions (in mm) referenceL1 max. W1 max.H1 m
36、ax.L2L3L4 min.W2H2 max. Capacitance range(See Table 2) Tolerance on rated capacitance Rated voltage(See Table 2) Category voltage (if applicable)(See Table 2) Climatic category Rated temperature Max. a.c. voltage (if applicable) Max. pulse load (if applicable) Tangent of loss angle Insulation resist
37、ance Rated voltage Category voltage (1) Case sizeCase sizeCase sizeCase size Rated capacitance (1) If different from the rated voltage. Generic specification: CECC 30000 (Issue 3) Sectional specification : CECC 32200 (Issue 1) Licensed Copy: London South Bank University, London South Bank University
38、, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 2 BSI 10-1999 1.7 Certified test records Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or
39、 sectional specification NOTEAdditional or increased requirements should be specified only when essential. Table 3 Other characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with 3.4 of CECC 32200. 2.1.2 For Quality Conforman
40、ce Inspection the test schedule (Table 4A and Table 4B) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of CECC 32200. Notes to Table 4A and Table 4B NOTE 1Clause numbers of tests and performance requirements refer to CECC 32200. NOTE
41、 2Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. NOTE 3In Table 4A and Table 4B: P = periodicity (in months) NOTE 4The capacitors found defective after mounting shall not be taken into account when calculating the defectives for the following tests. They shall
42、be replaced by spare capacitors. This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification. n = sample size c = acceptance criterion (permitted number of defectives) D = destructive ND = non-destructive Licensed Copy: Lon
43、don South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 BSI 10-19993 Table 4A Lot-by-lot inspection (Group A and B) Clause number and testD or ND Conditions of testILAQL % Performance requirements (1)(3)(1)(2)(1) Sub-
44、Group A1NDS42,5 4.2Visual examination Dimensions No visible damage Legible marking, (if applicable), see 1.5 See Table 1 of this detail specification Sub-Group A2NDII1,0 4.3.2 4.3.3 4.3.1 4.3.4 Capacitance Tangent of loss angle Voltage proof Insulation resistance Frequency: 1 kHz Frequency: 1 kHz fo
45、r all capacitance values Test point 1a Grade 1: 1,6 UR Grade 2: 1,4 UR Test point 1a Within specified tolerance See Table in 4.3.3 No breakdown, self-healing breakdowns allowed See Table in 4.3.4 Sub-Group BDS32,5 4.7 4.7.2 Solderability Final measurements No ageing. Immersion in non-activated flux
46、for 2 s. Immersion in solder bath 235 5 C Duration: 2 0,5 s Method: Visual examination 10 magnification No visible damage Smooth and bright solder coating, few scattered imperfections permitted (1), (2), (3): see Notes on page 2 Licensed Copy: London South Bank University, London South Bank Universi
47、ty, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 4 BSI 10-1999 Table 4B Periodic tests (1), (2), (3), (4): see Notes on page 2 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BS
48、I BS CECC 32201:1988 BSI 10-19995 Table 4B Periodic tests (1), (3): see Notes on page 2 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:36 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 32201:1988 6 BSI 10-1999 Table 4B Periodic tests Clause number and
49、 test D or ND Conditions of testPncPerformance requirements (1)(3)(1)(3)(1) 4.9.6Final measurements Visual examination Capacitance Tangent of loss angle No visible damage Legible marking k 5 % compared to values measured in Sub-Group C3 Increase of tan at 1 kHz for CR 1 4F at 10 kHz for CRk 1 4F Grade 1: k 0,005 k 0,003 Grade 2: k 0,008 k 0,005 C k 1 4F C 1 4F C k 1 4F C 1 4F Insulation resistance compared to values measured in Sub-Group C3 U 50 % of limits in 4.3.4 Sub-Group C3.2D6151 4.10 4.10.
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