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1、BRITISH STANDARD CONFIRMED MARCH 1980 BS 9300 C780-831 ISSUE 1 JANUARY 1971 Electronic parts of assessed quality Silicon voltage regulator diode Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C780-831
2、ISSUE 1 JANUARY 1971 BSI 04-2000 ISBN 0 580 34389 8 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal ob
3、ligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 26 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front co
4、ver. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C780-831 ISSUE 1 JANUARY 1971 BSI 04-2000i Contents Page Figure 1 Maximum total dissipation
5、plotted against mounting-base temperature9 Figure 210 Table I Group A Inspection4 Table II Group B Inspection6 Table III Group C Inspection8 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C780-831 ISSU
6、E 1 JANUARY 1971 ii BSI 04-2000 1. Specifications CV7780-CV7831 Issue 1 dated December 1967 with their existing amendments which are reproduced below are hereby adopted as BS 9300 C780-831. 2. Devices inspected, released and supplied to this specification shall be marked CV7780-CV7831 as appropriate
7、 and, where applicable with the letters KB. 3. The references to “Military specification”, “Commercial equivalents”, “Reliability assurance provisions” or requirements and “Preparation for delivery” shall be disregarded. 4. In the Groups A, B and C inspection tables the references in the “K1007/NATO
8、 Ref” column shall be superseded by the appropriate reference given in BS 9300 Appendix C (Table 1 to Table 5 inclusive). 5. Additional requirements not covered by BS 9300 Appendix C are: None 6. Published amendments (consolidated) None Licensed Copy: London South Bank University, London South Bank
9、University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-20001 Military specification CV7780-7831 Semiconductor device Absolute Maximum Ratings: Description:This specification covers the detail requirements for Silicon Voltage Regulato
10、r Diodes and is in accordance with K1007, Issue 3, except as otherwise stated. Mechanical Dimensions and Outlines: K1007, Section B, 10.3.3.2. (10 32 UNF 2 B.A. thread). Connections:CV7780 to CV7805 Stud Anode CV7806 to CV7831 Stud Cathode RatingPtotTstudTstgShockVibrationTorque (Stud) UnitWCCggin l
11、b Min. 5512 Max.201751751 5002015 NoteAB Notes:A. See derating curve Figure 1, Page 9. B. Duration 0.5 ms. C. Commercial equivalents BZY93 Series. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-78
12、31 Issue 1 December 1967 2 BSI 04-2000 Primary Electrical Characteristics: 123456789101112 CV Numbers V(BR) Nominal V(BR) Min. V(BR) Max. V(BR) Max. IZ Test Z(BR) Max. Z(BR) Max. VF Max. VRSZ Stud Anode Stud Cathode VVVVA77VV%/C 7780 7781 7782 7783 7784 7785 7786 7787 7788 7789 7790 7791 7792 7793 7
13、794 7795 7796 7797 7798 7799 7800 7801 7802 7803 7804 7805 7806 7807 7808 7809 7810 7811 7812 7813 7814 7815 7816 7817 7818 7819 7820 7821 7822 7823 7824 7825 7826 7827 7828 7829 7830 7831 6.8 7.5 8.2 9.1 10.0 11.0 12.0 13.0 15.0 16.0 18.0 20.0 22.0 24.0 27.0 30.0 33.0 36.0 39.0 43.0 47.0 51.0 56.0
14、62.0 68.0 75.0 6.4 7.1 7.7 8.6 9.4 10.4 11.4 12.4 13.9 15.4 16.9 18.9 20.8 22.7 25.1 28.0 31.0 34.0 37.0 40.0 44.0 48.0 53.0 58.0 64.0 71.0 7.2 7.9 8.7 9.6 10.6 11.6 12.6 14.1 15.6 17.1 19.1 21.2 23.3 25.9 28.9 32.0 35.0 38.0 41.0 45.0 50.0 54.0 60.0 66.0 72.0 79.0 8.0 9.0 10.0 11.0 12.0 13 14 16 17
15、.5 19 21.5 23.5 26 29 32 35.5 39 42.5 45.5 50 55.5 60 67 73.5 80 88 2.0 2.0 2.0 1.0 1.0 1.0 1.0 1.0 1.0 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.2 0.2 0.2 0.2 0.2 0.2 0.2 0.2 0.2 0.2 0.3 0.3 0.5 0.5 1.0 1.0 1.0 1.2 1.2 1.5 1.5 1.8 2.0 2.0 2.5 3.0 4.0 5.0 6.5 7.0 7.5 8.0 9.0 10.0 10.5 88 89 89 90 90 91 91 9
16、2 92 93 93 94 95 96 97 98 100 101 103 106 110 114 120 133 150 170 1.5 All Types 2.0 2.0 5.6 6.2 6.8 7.5 8.2 9.1 10.0 11.0 12.0 13.0 15.0 16.0 18.0 20.0 22.0 24.0 27.0 30.0 33.0 36.0 39.0 43.0 47.0 51.0 0.01 Min. to 0.15 Max. All Types Conditions IZSee Col. 7 See Col. 7 See Col. 7 See Col. 7 See Col.
17、 7 5 mAIF = 5 A IR max. 50 4A See Col. 7 Tstud C 25252510025252525 Applicable documents:- T.V.C. Information Sheets Nos. 9 and 10. Requirements: Marking. K1007, Section B, 1.3.4. Quality assurance provisions: Destructive Tests. The tests listed in Table II, Group B inspection, Sub-groups 2 and 3 and
18、 in Table III, Group C Inspection, Sub-group 2 are considered destructive. Group C Inspection. Inspection shall be conducted on the initial lot and thereafter every ninety days or every fifth lot whichever occurs first. Preparation for delivery: Packaging. The devices shall be packed in accordance w
19、ith K1007, Section A, 1.2(c). Nut and shakeproof washer to be packed with each diode. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-20003 Nato stock numbers: Thi
20、s specification has been prepared by and the Qualification Approval Authority is: CV77805961-99-037-5498CV78065961-99-037-5524 CV77815961-99-037-5499CV78075961-99-037-5525 CV77825961-99-037-5500CV78085961-99-037-5526 CV77835961-99-037-5501CV78095961-99-037-5527 CV77845961-99-037-5502CV78105961-99-03
21、7-5528 CV77855961-99-037-5503CV78115961-99-037-5529 CV77865961-99-037-5504CV78125961-99-037-5530 CV77875961-99-037-5505CV78135961-99-037-5531 CV77885961-99-037-5506CV78145961-99-037-5532 CV77895961-99-037-5507CV78155961-99-037-5533 CV77905961-99-037-5508CV78165961-99-037-5534 CV77915961-99-037-5509C
22、V78175961-99-037-5535 CV77925961-99-037-5510CV78185961-99-037-5536 CV77935961-99-037-5511CV78195961-99-037-5537 CV77945961-99-037-5512CV78205961-99-037-5538 CV77955961-99-037-5513CV78215961-99-037-5539 CV77965961-99-037-5514CV78225961-99-037-5540 CV77975961-99-037-5515CV78235961-99-037-5541 CV779859
23、61-99-037-5516CV78245961-99-037-5542 CV77995961-99-037-5517CV78255961-99-037-5543 CV78005961-99-037-5518CV78265961-99-037-5544 CV78015961-99-037-5519CV78275961-99-037-5545 CV78025961-99-037-5520CV78285961-99-037-5546 CV78035961-99-037-5521CV78295961-99-037-5547 CV78045961-99-037-5522CV78305961-99-03
24、7-5548 CV78055961-99-037-5523CV78315961-99-037-5549 Admiralty Surface Weapons Establishment, Portsdown, Cosham, Portsmouth, Hants, England. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issu
25、e 1 December 1967 4 BSI 04-2000 Table I Group A Inspection Examination or Test Test Conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific ConditionsMin.Max. SUB-GROUP 1 Visual and Mechanical Inspection SUB-GROUP 2 Breakdown Voltage (1) Reverse Leakage Current Small Signal Breakdo
26、wn Impedance (1) SUB-GROUP 3 Small Signal Breakdown Impedance (2) 5.1.1 8A.2.4 8A.2.2.1 8A.4.1 8A.4.1 IZ = Col. 7, Page 2 Pulse method Duration u 200 4s Duty cycle u 1 % VR see Col. 11, Page 2 IZ = Col. 7, Page 2 Pulse method Duration u 200 4s Duty cycle u 1 % IZ = 5 mA 0.65 0.65 2.5 I II I V(BR) IR
27、 Z(BR) Z(BR) Col. 4 Page 2 Col. 5 Page 2 50 Col. 8 Page 2 Col. 9 Page 2 V 4A 7 7 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-20005 Table I Group A Inspection E
28、xamination or Test Test Conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific ConditionsMin.Max. SUB-GROUP 4 Temperature Coefficient of Operating Voltage Breakdown Voltage (2) Forward Voltage Drop 8A.7.3 8A.2.4 8A.3.2 IZ = Col. 7, Page 2 T1 = 25 C 5 C T2 = 100 C 5 C Pulse method
29、Duration u 200 4s Duty cycle u 1 % NOTEMeasured values of T1 or T2 to be used in calculating SZ Tstud = 100 C IZ = Col. 7, Page 2 Pulse method Duration u 200 4s Duty cycle u 1 % IF = 5 A 4.0S4 SZ V(BR) VF 0.010.15 Col. 6 Page 2 1.5 %/C V V Licensed Copy: London South Bank University, London South Ba
30、nk University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 6 BSI 04-2000 Table II Group B Inspection (See Page 2. Quality Assurance Provisions) Examination or Test Test Conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specifi
31、c ConditionsMin.Max. SUB-GROUP 1 Physical Dimensions SUB-GROUP 2 Solderability Temperature Cycling Moisture Resistance SUB-GROUP 3 Vibration Fatigue SUB-GROUP 4 Torque (Stud) SUB-GROUP 5 Omitted SUB-GROUP 6 Omitted 5.1.2 5.13 5.5 5.3 5.15 5.12.1 According to Drawing 10.3.3.2. 55 to + 150 C Non-opera
32、ting Torque = 15 in lbs 6.5 6.5 6.5 6.5 S2 S2 S2 S4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-20007 Table II Group B Inspection Examination or Test Test Cond
33、itions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific ConditionsMin.Max. SUB-GROUP 7 High Temperature Life (Non-operating) SUB-GROUP 8 Operating Life Post Test End Points for SUB-GROUPS 2, 3, 7 and 8 Breakdown Voltage (1) Small Signal Breakdown Impedance (2) 6.2.1 6.6 6.6.1.2.1 6.3 6
34、.6 6.6.1.2.1 8A.2.4 8A.4.1 Tamb = 150 C t = 1 000 hours Tstud not greater than 140 C IZ to give dissipation not less than the value corresponding to the chosen Tstud, according to the derating curve Figure 1, Page 10 As in Group A Inspection, Sub-group 2 As in Group A Inspection, Sub-group 3 6.5 4.0
35、 S2 S4 V(BR) Z(BR) Col. 4 Page 2 2 % Col. 5 Page 2 + 2 % Col. 9 Page 2 + 2 % V Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 8 BSI 04-2000 Table III Group C Inspection
36、Examination or Test Test Conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific ConditionsMin.Max. SUB-GROUP 1 Omitted SUB-GROUP 2 Shock Post test End Points for SUB-GROUP 2 Breakdown Voltage (1) Small Signal Breakdown Impedance (2) 5.17 8A.2.4 8A.4.1 Non-operating. Five blows As
37、in Group A Inspection, Sub-group 2 As in Group A Inspection, Sub-group 3 6.5S2 V(BR) Z(BR) Col. 4 Page 2 2 % Col. 5 Page 2 + 2 % Col. 9 Page 2 + 2 % V Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV778
38、0-7831 Issue 1 December 1967 BSI 04-20009 OPERATING NOTES 1. Dissipation and heatsink considerations a) Steady-state conditions The maximum permissible steady-state dissipation Ps is given by the relationship b) Pulse conditions (see Figure 1) The maximum pulse power Pp is given by the formula Figur
39、e 1 Maximum total dissipation plotted against mounting-base temperature where Tj max. is the maximum permissible operation junction temperature, Tamb is the ambient temperature, Gjamb is the total thermal resistance between junction and ambient (Gjmb + Gi + Gh), Gjmb is the thermal resistance betwee
40、n junction and mounting-base, Gi is the thermal contact resistance between mounting-base and heatsink, that is 0.6 deg C/W, Gh is the thermal resistance of the heatsink. wherePs is the steady-state dissipation, excluding that in the pulses, Gt is the effective transient thermal resistance of the dev
41、ice between junction and mounting-base and is a function of the pulse duration t and duty cycle d, d is the duty cycle and is equal to the pulse duration t divided by the periodic time T. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, U
42、ncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 10 BSI 04-2000 The steady-state power Ps when biased in the zener direction at a given zener current can be found from page 26. With the additional pulsed power dissipation Pp calculated from the above expression, the total peak zener
43、 power dissipation Ptot is Ps+ Pp. From page 26 the maximum permissible peak zener current at Ptot can now be read. This peak zener current is subject to the absolute maximum rating of 20 A. For pulse durations larger than the temperature stabilisation time of the diode tstab, the maximum permissibl
44、e pulse power is equal to the steady-state power Ps max. The temperature stabilisation time for the Series is 5.0 s (see page 24). 2. Care must be taken to ensure that the connecting lug is not bent or twisted. Gmbamb-? is the total thermal resistance between the mounting-base and ambient (i.e. Gi+
45、Gh). Figure 2 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-200011 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59
46、 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 12 BSI 04-2000 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-200013 Licensed
47、Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 14 BSI 04-2000 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncon
48、trolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-200015 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 16 BSI 04-2000 Licensed Copy: London South Ban
49、k University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 BSI 04-200017 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7780-7831 Issue 1 December 1967 18 BSI 04-2000 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:59 GMT+00:00 2006, Uncontrolled Copy, (c) B
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