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1、BRITISH STANDARD BS CECC 50008:1982 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Ambient-rated rectifier diodes Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolle
2、d Copy, (c) BSI BS CECC 50008:1982 BSI 12-1999 ISBN 0 580 34064 3 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50008:1982 BSI 12-1999i Content
3、s Page National forewordii Foreword1 Text of CECC 500083 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50008:1982 ii BSI 12-1999 National foreword This British Standard has been prepared under the dir
4、ection of the Electronic components Standard committee. It is identical with CENELEC Electronic components Committee (CECC) CECC 50008 Issue 2, “Harmonized system of quality assessment for electronic components. Blank detail specification: Ambient rated rectifier diodes”. It supersedes BS CECC 50008
5、:1977 and results from additions and changes which are explained in the preface to the CECC document. This standard is a harmonized specification within the CECC system. The equivalent non-harmonized British Standard in the BS 9300 series will eventually be superseded by this standard but, for a per
6、iod, both standards will continue to exist. It is recognized that the layout proposed herein cannot be applied to all detail specifications based on this document. For instance, it may be preferable to indicate the limiting values in the form of a table when several similar devices appear in the sam
7、e detail specification. NOTETextual error. In box 7, on page 3, the document quoted as a reference for outlines should be IEC 191-2 and not IEC 192-2. The error has been reported to CECC in a proposal to amend the text of the International Standard. Scope This standard lists the ratings, characteris
8、tics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 50000 in any detail specification for these devices. Detail specification layout The front page of detail specifications released to BS CECC family or blank detail specifications will be in
9、accordance with BS 9000 Circular Letter No. 15. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation Some terminology and certain conventions are not idental with those used in British Standards; attenti
10、on is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard harmonized with CECC 00100 is BS E9000 “General requirements
11、for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System” Part 1 “Basic rules”. The following International Standards are referred to in the text and for each there is a corresponding British Standard; these are as listed below: The Technical C
12、ommittee has reviewed the provisions of IEC 147-2A and IEC 147-2H, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. A related British Standard for these International Standards is BS 9300 “Semiconductor devices of assessed qu
13、ality: Generic data and methods of test”. International StandardCorresponding British Standard IEC 191-2:1966BS 3934:1965 Dimensions of semiconductor devices (Technically equivalent) CECC 50000:1980BS CECC 50000:1981 Harmonized system of quality assessment for electronic components: Generic specific
14、ation: Discrete semiconductor devices (Identical) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50008:1982 BSI 12-1999iii A British Standard does not purport to include all the necessary provisions of
15、 a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, the CECC title page, page
16、s ii to iv, pages 1 to 9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:0
17、3:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00
18、2006, Uncontrolled Copy, (c) BSI CECC 50008:1982 ii BSI 12-1999 Contents Page Foreword1 1Mechanical description3 2Electrical application3 3Levels of quality assessment3 4Limiting values3 5Electrical characteristics4 6Marking4 7Ordering information4 8Test conditions and quality assessment5 9Additiona
19、l information9 Figure 1 Current derating curve for a rectifier diode4 Table A6 Table B7 Table C8 Table D9 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 50008:1982 BSI 12-1999iii RECORD OF AMENDMENTS ENRE
20、GISTREMENT DES MODIFICATIONS VERZEICHNIS DER NDERUNGEN AMENDMENT No MODIFICATION No NDERUNG Nr. DATE OF ISSUE DATE D EDITION AUSSTELLUNGSDATUM PAGES AFFECTED PAGES CONCERNEES BETROFFENE SEITEN EFFECTIVE DATE MISE EN APPLICATION ANWENDBER AB ENTRY EFFECTUEE EINTRAGUNG DATE-LE-DATUMBY WHOM-PAR-DURCH L
21、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 50008:1982
22、BSI 12-19991 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System
23、 is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of conformity. The components produced under the System are thereby accepted by all me
24、mber countries without further testing. This document has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for AMBIENT RATED RECTIFIER DIODES. It should be read in conjunction with docu
25、ment CECC 00100: Basic Rule (1974). At the date of printing of this document the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland, and the United Kingdom. Copies of it can be obtained from the addresses
26、 shown on the inside cover. Preface This blank detail specification was prepared by CECC Working Group 7; “RECTIFIER DIODES AND THYRISTORS”. It is one of a series of blank detail specifications for discrete semiconductor devices, relating to the generic specification CECC 50000. This Issue 2 superse
27、des Issue 1 of 1977, the most important changes being: 1) the addition of a Sub-Group A2a to check non-operative devices, which will become obligatory in all existing detail specifications by 1st January 1981. 2) the addition of requirements for controlled-avalanche diodes. 3) the addition of clause
28、s 6, 7 and 9. Implementation All qualifications according to Issue 1 remain technically valid, as well as all detail specifications prepared in accordance with Issue 1 even if they are not completely in line with items 2) and 3) above. Before 1st January 1981, however, all detail specifications shal
29、l be amended and their issue number raised by one by any suitable means, to conform with item 1). Issue 1 will be withdrawn on 1st January 1982 Lay-out It is recognized that the lay-out proposed cannot be applied to all detail specifications based on this document. For instance, it may be preferrabl
30、e to indicate the limiting values in the form of a table when several similar devices appear in the same detail specification. Voting The text of this revised blank detail specification was circulated to the CECC for voting in the documents listed below, and was ratified by the CECC Management Commi
31、ttee for printing as a CECC specification. DocumentVoting dateReport on the VotingCirculation Date CECC (Secretariat) 922February 1980CECC (Secretariat) 1021December 1980 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy,
32、 (c) BSI CECC 50008:1982 2 BSI 12-1999 Key for page 3 The numbers between square brackets on page 3 correspond to the following indications which should be given: Identification of the detail specification 1The name of National Standards Organization under whose authority the detail specification is
33、 published, and if applicable the organization from whom the DS is available. 2The CECC Symbol and the number allotted by the CECC General Secretariat to the completed detail specification. 3The number and issue number of the CECC generic or sectional specification as relevant; also national referen
34、ce if different. 4If different from the CECC number, the national number of the detail specification, date of issue and any further information required by the national system together with any amendment numbers. Identification of the component 5A short description of the type of component. 6Informa
35、tion on typical construction (where applicable). 7Outline drawing and/or reference to the relevant document for outlines. 8Application or group of applications covered and quality assessment levels. 9Reference data on the most important properties, to allow comparison between the various component t
36、ypes. For 5 and 6 the text given should be suitable for an entry in CECC 00200 or CECC 00300. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 50008:1982 BSI 12-19993 Specification available from:1Page: of
37、: CECC 50008 Issue 2 2 Electronic component of assessed quality in accordance with 34 Detail specification for ambient rated rectifier diodes Type number(s): Structurally similar devices: (if appropriate) 5 Construction Semiconductor material: Silicon, germanium Encapsulation material: Metal/glass;
38、metal/ceramic, plastic, other 6 1Mechanical description 7 2 Electrical application 8 Outline references :Rectifying up to a current of 5 A. Code A from IEC 192-2: 3 Levels of Quality assessment National :F L OR: Base and case references : Codes B and C from IEC 192-2 : National : AND/OR: Outline dra
39、wing Marking:see CECC 50000-2.5 Terminal identification: see CECC 50000-2.5.1 4Limiting values (Absolute maximum system) 9 These apply over the operating temperature range, unless otherwise stated. The following ratings shall be given. 4.1Voltage: Any Qualification such as time, frequency, temperatu
40、re, mounting method etc. shall be stated. 4.1.1Crest working reverse voltageVRWM 4.1.2Repetitive peak reverse voltageVRRM 4.1.3Non-repetitive peak reverse voltageVRSM 4.1.4Continuous (DC) reverse voltage (if applicable)VR 4.2Current: Any qualification such as time, frequency, temperature, mounting m
41、ethod etc. shall be stated. 4.2.1Mean forward current at the breakpoint temperature (see Figure 1) In single phase circuits, sinusoidal 130 conduction angle with resistive load. IF(AV)max. 4.2.2Repetitive peak forward current (if applicable)IFRM 4.2.3Continuous (direct) forward current (if applicabl
42、e)IF 4.2.4Surge (non-repetitive) forward currentIFSM The surge (non-repetitive) forward current corresponds normally to the maximum current permissible for a half sine wave (10 ms at 50 Hz) without reapplication of reverse voltage. The surge (non-repetitive) current rating corresponds to a current a
43、pplied after continuous operation at the maximum value of the mean forward current. See the current Qualified Products List for availability of components qualified under this detail specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:
44、00 2006, Uncontrolled Copy, (c) BSI CECC 50008:1982 4 BSI 12-1999 Limiting values Figure 1 Current derating curve for a rectifier diode 4.3Temperature: 4.3.1Ambient temperature Maximum value for which the voltage ratings are specified in 4.1 Tamb. max. 4.3.2Storage temperature Tstg 4.4Power: Any qua
45、lification such as time, frequency, temperature, mounting method etc. shall be stated. 4.4.1Maximum peak non-repetitive surge reverse powerPRSM max. 5Electrical characteristics See 8 for inspection The following characteristics shall be given at Tamb= 25 C, unless otherwise stated 5.1Forward voltage
46、: Maximum value at the peak current corresponding to ; the rated maximum mean forward current VFM 5.2Reverse current: Maximum value of the peak reverse current IRM at the rated repetitive reverse voltage VRRM: 5.2.1At Tamb= 25 C without forward dissipationIRM1 5.2.2At Tamb. max. without forward diss
47、ipationIRM2 5.3Recovery: 5.3.1Recovered charge (where appropriate) Maximum value or maximum and minimum values under specified conditions Qr 5.3.2Reverse recovery current (where appropriate) Maximum value under specified conditions Irr 5.4Avalanche breakdown voltage: Minimum (and for controlled aval
48、anche rectifier diodes maximum) value at a specified reverse current IRM1 V(BR) 6Marking Any particular information other than given in box k on front page and/or 2.5 of CECC 50000 shall be specified here. 7Ordering information The following minimum information is necessary to order a specific devic
49、e, unless otherwise specified: precise type number CECC reference of detail specification with issue number and/or date when relevant Level of quality assessment as defined in Appendix II A of CECC 50000 and if required, screening sequence as defined in Appendix VI of CECC 50000 any other particulars. example: 1N000 to CECC 50001-000 Issue 2, level F max. min. min. max. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:51 GMT+00:00 2006, Uncontrolled Cop
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