BS-CECC-90115-1994.pdf
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1、BRITISH STANDARD BS CECC 90115:1994 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Digital gate array integrated circuits Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:18 GMT+00:00 2006, Unc
2、ontrolled Copy, (c) BSI BS CECC 90115:1994 BSI 02-2000 ISBN 0 580 34520 3 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:18 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90115:1994 BSI 02-2000i
3、 Contents Page National forewordii Forewordiii Text of CECC 901151 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:18 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90115:1994 ii BSI 02-2000 National foreword This British Standard has been prepared und
4、er the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with CECC 90115:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: Digital gate array integrated circuits published by the European Committee for Electro
5、technical Standardization (CENELEC) Electronic Components Committee (CECC). CECC 90115 was prepared by CECC WG9 Semiconductor integrated circuits and the United Kingdom participation in the drafting was provided by Technical Committee ECL/24, Semiconductors. Scope. The standard is related to non-fin
6、ished products, where the customer is involved in their design, layout and specification. As a consequence, this standard describes requirements for “tools” (e.g. for design, verification test, and measurement), rather than requirements for components. The application of this specification requires
7、that the relevant process technology and the associated manufacturing line are already qualified. Textual errors. When adopting the text of the International Standard, the textual errors listed below were discovered. In the last line of the table in 2.2, “capacitives” should read “capacitive”. In th
8、e second paragraph of 4.3, “caracteristics” should read “characteristics”. The British Standard which implements the CECC Rules of Procedure is BS 9000-2:1991 General requirements for a system for electronic components of assessed quality Part 2: Specification for the national implementation of the
9、CECC system. Detail specification. Detail specification shall comply with the requirements of this Blank Detail Specification and BS CECC 00111-4:1991 Rules of Procedure 11. Specifications. Part 4: Regulations for CECC detail specification. A British Standard does not purport to include all the nece
10、ssary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International StandardCorresponding British Standard CECC 90000BS CECC 90000:1991 H
11、armonized system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits Identical CECC 90100BS EN 90100:1993 Harmonized system of quality assessment for electronic components. Sectional specification: Digital monolithic integrated circuits Identical IE
12、C 747-1BS 6493 Semiconductor devices Part 1 Discrete devices Section 1.1:1984 General Identical IEC 748Part 2 Integrated circuits All Parts are identical Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 to 6 a
13、nd a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:18 GMT+00:00 2006, Uncon
14、trolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:18 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90115:1994 ii BSI 02-2000 Contents Page Forewordiii 1General description3 1.1Definition3 1.2Technology3 2General description of the
15、arrays and test vehicle3 2.1Description of family, arrays, and/or demonstrators3 2.2Library description rules4 2.3Test vehicles (LTV)5 2.3.1General description5 2.3.2LTV types5 2.3.3Electrical characteristics of the LTV5 3Simulation tools5 4Quality assessment procedures6 4.1General Procedures6 4.1.1
16、Qualification of the technology6 4.1.2Lot by lot tests6 4.2Cell library qualification6 4.2.1Design of cells/macros6 4.2.2Qualification of cells or macros6 4.3Design tool qualification6 4.4Customized devices qualification6 Licensed Copy: London South Bank University, London South Bank University, Sat
17、 Dec 09 01:43:18 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90115:1994 BSI 02-2000iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmoniz
18、ed System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Co
19、nformity. The components produced under the System are thereby acceptable in all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specificatio
20、ns for DIGITAL GATE ARRAY INTEGRATED CIRCUITS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification, the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands,
21、Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom, and copies of it can be obtained from the addresses shown on the blue fly sheet. Preface This blank detail specification (BDS) was prepared by CECC WG 9: “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of
22、 the International Electrotechnical Commission and in particular on IEC 747: Semiconductor devices Discrete devices and integrated circuits, and IEC 748: Semiconductor devices Integrated circuits. The text of this specification was circulated to the CECC for voting in the documents listed below and
23、was approved for publication: It is recognized that the layout proposed cannot be applied to all detail specifications based on this document. For instance, it may be preferable to indicate the limiting values in the form of a table when several similar devices appear in the same detail specificatio
24、n. AVIS In accordance with the decision of the CECC Management Committee, this specification is published initially in English and French. The German text will follow as soon as it has been prepared. DocumentDate of VotingReport on the Voting CECC(Secretariat)2648January 1991CECC(Secretariat)2788 Li
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