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1、BRITISH STANDARD BS CECC 30401 033: 1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (long-life grade) Rectangular insulated non-metallic case, rigid radial terminations Full assessment level UDC 621.319.4:621.315.616.96:678.742.2 L
2、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-1999 Committee reference ECL/4 ISBN 0 580 12010 4 A British Standard does not purport to include all the necessary provisions of a co
3、ntract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 11 and a back cove
4、r. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University
5、, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-1999i Contents Page 1Specified method of mounting for vibration and bump2 2Ratings and characteristics2 3Additional information3 4Related documents3 5Marking4 6Ordering information4 7Qualification approval
6、 and quality conformance inspection4 8Certified test records4 Table 1 Dimensions2 Table 2 Values of capacitance and voltage related to case size3 Table 3 Insulation resistance3 Table 4 Test schedule5 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+0
7、0:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-19991 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WI
8、TH MANUFACTURERS TYPE NUMBER See Table 1 overleaf See PD 9002 and CECC 00200 BS E9070:1975, BS CECC 30400:1978 For ordering information see clause 6 Outline and dimensions. First angle projection FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS TYPICAL CONSTRUCTION: RECTAN
9、GULAR NON-METALLIC CASE, INSULATED RIGID RADIAL TERMINATIONS INTENDED FOR PRINTED CIRCUITS FULL ASSESSMENT LONG LIFE GRADE (See Table 1 overleaf) All dimensions in millimetres Marking information, see clause 5 Refer to Qualified Product List PD 9002 and/or CECC 00200 for details of manufacturers app
10、roved to this specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 2 BSI 10-1999 Table 1 Dimensions 1 Specified method of mounting for vibration and bump For case sizes up to an
11、 including 6 g the capacitors shall be pressed down firmly on to a rigid mounting surface and fixed by soldering the leads. For larger case sizes the capacitor shall be mounted in the same way and the body shall be clamped. 2 Ratings and characteristics Case size X (max.) Y (max.) Z (max.) S + 0.35
12、0.7 d Typical mass min.nom.max. mmmmmmmmmmmmmmg 113.510.55.010.160.750.800.880.8 213.511.56.510.160.750.800.881.0 319.012.57.015.240.750.800.882.0 419.015.09.015.240.750.800.883.0 527.020.010.022.860.750.800.884.0 627.020.510.522.860.750.800.886.0 732.023.013.027.940.750.800.8813.0 832.022.513.527.9
13、40.750.800.8813.0 NOTEThe capacitor shall be capable of seating firmly on the printed wiring board, and the body moulding shall not seal off the holes through which the capacitor leads pass. Capacitance range Capacitance tolerances: standard 10 % (K) special order 20 % (M), 5 % (J) Rated voltageSee
14、Table 2 Category voltageAs rated voltage Rated temperature85 C Insulation resistanceSee Table 3 Tangent of loss angle at 1 kHzCR 1 4 F: tan u 0.01 CR u 1 4 F: tan u 0.008 Climatic category40/085/21 Vibration severityBS 2011-2.1Fc, Procedure B4, 0.75 mm or 98 m/s2 (10 Hz to 500 Hz) Duration6 h Bump 3
15、90 m/s2 (40gn) 1 000 bumps Solderability Solder bath method230 C with heat screen Resistance to soldering heat260 C Low air pressure2 kPa (20 mbara) a 1 mbar = 102 N/m2 = 100 Pa. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontroll
16、ed Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-19993 3 Additional information (not for inspection purposes) These capacitors have been designed for wide general application in electrical and electronic circuits and are suitable for domestic, commercial and high grade professional use. These capacito
17、rs are not suitable for connection across supply mains. Table 2 Values of capacitance and voltage related to case size Table 3 Insulation resistance 4 Related documents BS 2011, Basic environmental testing procedures (IEC 68). BS 2488, Schedule of preferred numbers for the resistance of resistors an
18、d the capacitance of capacitors for telecommunication equipment (IEC 63). BS 6001, Sampling procedures and tables for inspection by attributes. BS E9000, Specification for general requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee s
19、ystem. BS CECC 30000, Harmonized system of quality assessment for electronic components. Generic specification for fixed capacitors. BS CECC 30400, Specification for harmonized system of quality assessment for electronic components. Sectional specification: Fixed metalized polyethylene terephthalate
20、 film dielectric d.c. capacitors. Typical capacitance change as a function of temperature 40 C to + 20 C: 5.0 % + 20 C to + 85 C: 3.0 % Capacitance 4F Rated voltage UR 63 V d.c.100 V d.c.250 V d.c.400 V d.c.630 V d.c. 0.01 0.015 0.022 0.033 0.047 0.068 0.1 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.
21、7 6.8 10.0 1 1 1 2 2 3 3 4 4 5 5 6 7 1 1 1 2 2 3 3 4 4 5 5 6 7 8 1 1 1 2 2 3 3 4 5 5 5 7 7 8 1 1 1 2 3 3 4 4 5 5 5 7 8 8 1 2 2 3 4 4 5 5 5 7 8 8 Minimum RC product Minimum insulation resistance between the terminations Minimum insulation resistance between the terminations and case R =Insulation res
22、istance between the terminations C =Rated capacitance sM7M7 Rated capacitance 0.33 4Fu 0.33 4F Rated voltage 100 Vu 100 V 100 Vu 100 V 10 0005 00030 00015 00030 000 NOTEThe capacitance values are within the E6 series (BS 2488). Licensed Copy: London South Bank University, London South Bank Universit
23、y, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 4 BSI 10-1999 PD 9002, BS 9000 component selection guide. CECC 00200, Qualified products list. 5 Marking The following information shall be given on the capacitor in accordance with 1.4 of BS CECC 30400: a) rate
24、d capacitance; b) rated voltage; c) tolerance on rated capacitance; d) manufacturers code. 6 Ordering information Orders for components complying with the requirements of this specification shall include the following minimum information: a) quantity; b) BS CECC specification number, issue number, i
25、.e. BS CECC 30401 Issue 1; c) capacitance value and tolerance; d) rated voltage. 7 Qualification approval and quality conformance inspection 7.1 For qualification approval test and quality conformance inspection the test schedule, severities and requirements given in the sectional specification BS C
26、ECC 30400 apply. 7.2 A complete schedule is given in Table 3. The details in 7.2.1 to 7.2.5 apply. 7.2.1 For qualification testing, see 3.3 of BS CECC 30400, subgroups A1 and A2 are combined together to form group 0. All subgroups of group C are required with numbers of samples and permissible defec
27、tives as shown in Table 1 of BS CECC 30400. 7.2.2 The samples required for qualification testing will be in accordance with 3.3.1 of BS CECC 30400. 7.2.3 Samples submitted to tests marked D shall not be accepted for release under BS E9000. 7.2.4 The requirement for visual examination for intermediat
28、e or final measurement is as follows. There shall be no damage that will affect the usability of the capacitor for its intended purpose. 7.2.5 Drying in accordance with 4.2 of BS CECC 30000 is not required. 8 Certified test records Certified test records shall be prepared in accordance with 3.2 of B
29、S CECC 30400. Attributes information shall be given for subgroups C1, C2, C3 and C4 without reference to the parameter with which a defect occurred. Variables information for the change in capacitance, in the tangent of loss angle, and in the insulation resistance after the endurance test (subgroup
30、C3) and after the charge and discharge tests (subgroup C4). Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-19995 Table 4 Test schedule Groups A and B inspection (lot-by-lot): Full
31、 assessment level Examination or testD/ND BS CECC 30400 Ref. Test method and severityILaAQLb Performance requirements Group A inspection To be applied on a sampling basis, lot-by-lot (7.2.1) Subgroup A1NDS42.5See 7.2.4 of this standard Visual examination4.2 MarkingSee clause 5 DimensionsAs Table 1 S
32、ubgroup A2 (7.2.1) Voltage proof (test point A1.1) ND 4.3 1.6URII1.0No breakdown or flashover. Self-healing is permitted Capacitance4.4Within the specified selection tolerance Tangent of loss angle4.5CR u 1 4F u 0.008 CR 1 4F u 0.01 Insulation resistance (test point A1.1 only) 4.6CR 0.33 4FUR 100 V
33、UR u 100 V RC W 10 000 s RC W 5 000 s CR u 0.33 4F UR 100 V UR u 100 V Rins W 30 000 M7 Rinsins W 15 000 M7 Group B inspection To be applied on a sampling basis, lot-by-lot Subgroup B1S-32.5 SolderabilityND4.9.2Test Ta, solder bath method with heat screen depth of immersion as in 4.9.2 of BS CECC 30
34、400 3.2.3 of test Ta a IL = Inspection level. b AQL = Acceptance quality level. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 6 BSI 10-1999 Group C inspection, periodic tests (7.2.1): F
35、ull assessment level Examination or testD/ND BS CECC 30400 Ref. Test method and severitypanbcc Performance requirements Group C inspection To be conducted on a sampling basis plus periodically at the monthly interval shown in column p Subgroup C1 Initial measurements4.8.1 CapacitanceD4.46272Within t
36、he specified selection tolerance Tangent of loss angle4.5CR u 1 4F; u 0.008 at 1 kHz record reading for information at 10 kHz Solderability4.9.2Test Ta, solder bath method with heat screen. Depth of immersion as in 4.9.2 of BS CECC 30400 3.2.3 of test Ta Subgroup C1a Part of sample Robustness of ter
37、minations D4.8.2Test Ua, Tensile 10 N/10 s 691 Visual examination4.2See 7.2.4 of this standard Resistance to soldering heat 4.8.3Test Tb, method 1A 260 C with heat screen a p = periodicity (months). b n = sample size. c c = permissible defectives. Licensed Copy: London South Bank University, London
38、South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 BSI 10-19997 Examination or testD/ND BS CECC 30400 Ref. Test method and severitypanbcc Performance requirements Subgroup C1a (contd) Final measurements4.8.4 Visual examination4.2See 7.2.4 of
39、this standard Capacitance4.4%C u 2 % Tangent of loss angle4.5Increase of tan CR 1 4F; u 0.002 at 1 kHz CR u 1 4F; u 0.003 at 10 kHz Subgroup C1b Other part of sample6181 Rapid change of temperature D4.9.3Test Na, 5 cycles of 30 min at 40 C and 30 min at 85 C. Period of recovery not less than 1 h Vis
40、ual examination4.2See 7.2.4 of this standard Vibration4.9.4Test Fc, procedure B4 10 Hz to 500 Hz. Duration 6 h. For method of mounting, see clause 1 Visual examination4.2See 7.2.4 of this standard Bump4.9.5 Test Eb, 390 m/s2 (40gn) 1 000 bumps. For method of mounting, see clause 1 a p = periodicity
41、(months). b n = sample size. c c = permissible defectives. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 8 BSI 10-1999 Examination or testD/ND BS CECC 30400 Ref. Test method and severit
42、ypanbcc Performance requirements Subgroup C1b (contd) Final measurements4.9.6 Visual examination4.2See 7.2.4 of this standard Capacitance4.4%C u 5 % Tangent of loss angle4.5Increase of tan CR 1 4F; u 0.002 at 1 kHz CR u 1 4F; u 0.003 at 10 kHz Insulation resistance4.6Within initial limit Subgroups C
43、1a and C1b combined Climatic sequence4.106272 Dry heat4.10.2Test Ba, issue 4, 16 h. While still at the upper category temperature (85 C) and at the end of the period of high temperature conduct the following tests: Capacitance4.4%C u 5 % Insulation resistance4.6Test point A1.1 CR 0.33 4FUR 100 V UR
44、u 100 V RC W 100 s RC W 50 s CR u 0.33 4FUR 100 V UR u 100 V Rins W 300 M7 Rins W 150 M7 Test point B1.2Rins W 300 M7 Damp heat, cyclic, first cycle 4.10.3Test Db Capacitance4.4Reference value Cold4.10.4Test Aa, 2 h. While still at the lower category temperature ( 40 C) and at the end of the period
45、of low temperature the capacitance shall be measured Capacitance4.4%C u 7 % a p = periodicity (months). b n = sample size. c c = permissible defectives. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 3
46、0401 033:1981 BSI 10-19999 Examination or testD/ND BS CECC 30400 Ref. Test method and severitypanbcc Performance requirements Subgroups C1a and C1b combined (contd) Low air pressure4.10.5Test M, 20 mbar. The test shall be carried out at a temperature of 15 C to 35 C, duration 1 h. UR to be applied,
47、test point A1.1 part of sample and test point B1.2 of other part of sample, during the last 5 min No breakdown or flashover. Selfhealing is permitted Visual examination4.2See 7.2.4 of this standard Damp heat, cyclic, remaining cycles 4.10.6Test Db, 1 cycle. UR to be applied, test point A1.1 for 1 mi
48、n within 15 min after removal Final measurements4.10.7 Visual examination4.2See 7.2.4 of this standard Capacitance4.4%C 1 4F, 50 % of the initial limit Subgroup C2D6151 Initial measurements4.11.1 Capacitance4.4Within the specified selection tolerance Tangent of loss angle4.5CR u 1 4F u 0.008 at 1 kH
49、z CR 1 4F u 0.01 at 1 kHz a p = periodicity (months). b n = sample size. c c = permissible defectives. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:34 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 033:1981 10 BSI 10-1999 Examination or testD/ND BS CECC 30400 Ref. Test method and severitypanbcc Performance requirements Subgroup C2 (contd) Damp heat, steady state 4.11Test ca, issue 3, 21 days. No applied voltage Voltage proof4.11.2 4.3 UR with 15 min afte
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