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1、BRITISH STANDARD BS CECC 63100:1985 Incorporating Amendment Nos. 1, 2 and 3 Harmonized system of quality assessment for electronic components: Sectional specification: Film and hybrid integrated circuits UDC 621.3.049.77 Licensed Copy: London South Bank University, London South Bank University, Sat
2、Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 This British Standard, having been prepared under the direction of the Electronic Standards Components Committee, was published under the authority of the Board of BSI and comes into effect on 31 January 1985 BSI 10-1999 T
3、he following BSI references relate to the work on this standard: Committee reference ECL/17 Draft for comment 82/23906 DC ISBN 0 580 14341 4 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee (ECL/-
4、) to Technical Committee ECL/17, upon which the following bodies were represented: British Broadcasting Corporation British Telecommunications Business Equipment Trade Association Electronic Components Industry Federation Electronic Engineering Association GAMBICA (BEAMA Ltd.) National Supervising I
5、nspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No.Date of issueComments 6135April 1991 6620April 1991 6621April 1991Indicated by a sideline in the margin Licensed Copy: London Sout
6、h Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 BSI 10-1999i Contents Page Committees responsibleInside front cover National forewordii Forewordiii Text of CECC 631001 Publications referred toInside back cover License
7、d Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is i
8、dentical with CENELEC Electronic Components Committee (CECC) 63100:1984 “Harmonized system of quality assessment for electronic components: Sectional specification: Film and hybrid integrated circuits”. This standard is a harmonized specification within the CECC system. Terminology and conventions.
9、The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a deci
10、mal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. The Technical Committee has reviewed the provisions of IEC 147, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standar
11、d. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standar
12、dCorresponding British Standard IEC 63:1963BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunications equipment (Technically equivalent) IEC 68BS 2011 Basic environmental testing procedures (The relevant Parts are all identical
13、) CECC 63000:1984BS CECC 63000:1985 Harmonized system of quality assessment for electronic components. Generic specification: Film and hybrid integrated circuits (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii t
14、o iv, pages 1 to 10, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University
15、, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 ii BSI 10-1999 Contents Page Forewordiii Section 1. Scope1 Section 2. General,
16、 preferred characteristics, ratings and severities for environmental tests1 Section 3. Qualification approval procedures3 Section 4. Test and measurement procedures10 Table 1 Test schedule for initial qualification approval5 Table 2 Assessment levels and acceptance criteria for initial qualification
17、 approval7 Table 3 Assessment levels and acceptance criteria for the maintenance of the qualification approval and quality conformance inspection8 Table 3a Lot-by-lot tests8 Table 3b Periodic tests to be conducted on a sampling basis9 Licensed Copy: London South Bank University, London South Bank Un
18、iversity, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 BSI 10-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part
19、in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certi
20、ficate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized s
21、pecifications for FILM and HYBRID INTEGRATED CIRCUITS (F or thin-film D/A convertors using the same film material and same added components from the same supplier). For visual examination, marking, dimensions, sealing, solderability, robustness of terminations, identical envelope is the only require
22、ment; empty packages and/or electrical rejects may be used. 3.2 Qualification approval The schedules to be used for qualification approval testing on the basis of lot-by-lot and periodic testing are given in Table 2 and Table 3 of the blank detail specification. The procedure for initial qualificati
23、on approval on the basis of the fixed sample size schedule is given in Table 1. The tables for initial qualification approval (fixed sample size schedule), release of products (lot-by-lot tests) and maintenance of qualification approval (periodic tests) collectively prescribe the minimum test progra
24、mme on completed circuits. The manufacturer may select which assessment level K, L or M he wishes to adopt, but may release products only as follows: A manufacturer may change the assessment level of his approval by completing the relevant tests. Subject to ONS agreement, he may downgrade without fu
25、rther periodic testing until current test interval dates expire. Any additional tests required for specific applications shall be prescribed in the detail specification. The post-test electrical limits for the relevant environmental tests shall be prescribed in the detail specification. 3.2.1 Initia
26、l qualification approval (fixed sample size procedures) 1) Sampling The sample shall be representative of the range of circuits for which approval is sought. The size of the sample and the criterion of acceptability depend on the assessment level which is claimed and are detailed in Table 2. When ad
27、ditional groups are introduced into the test schedule, the number of specimens required for Group “0” shall be increased by the same number as that required for the additional groups. 2) Tests The complete series of tests specified in Table 1 is required for the approval of circuits covered by one d
28、etail specification. The tests in each group shall be carried out in the given order. The whole sample shall be subjected to the tests of Group “0” and then divided for the other groups. Specimens found defective during the tests of Group “0” shall not be used for the other groups. “One defective” i
29、s counted when a circuit has not satisfied the whole or a part of the tests of a group. The approval is granted when the number of defectives does not exceed the specified number of permissible defectives for each group or sub-group and the total number of permissible defectives. Assessment levelRel
30、ease assessment levels KK, L or M LL or N MM Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 BSI 10-19995 Table 1 Test schedule for initial qualification approval Sample sizes and acceptance
31、criteria are detailed per assessment level in Table 2. In this table: clause numbers refer to Section 4 of CECC 63000. (See notes on page 7) Clause numbers, tests and test sequencesD or ND Test conditionsPerformance Requirements Group 0 Sub-group 01 Precap visual examination Sub-Group 02ND 4.3.2Exte
32、rnal visual examination and marking 4.3.3Dimensions Sub-Group 03(7)D 4.5.16Induced flammability (for information only) Sub-Group 04(1)ND 4.5.9Sealing Sub-Group 05ND 4.4.11Major static/dynamic electrical characteristics at room temperature Sub-Group 06ND 4.4.11Major static/dynamic electrical characte
33、ristics at extreme operating temperatures Group 1Sequence (1) (2)D/ND 4.4.11: Sub-Group 05 Initial measurements 4.5.6Vibration, swept frequency and 4.5.7Acceleration, steady state or (3) 4.5.5Shock and 4.5.7Acceleration, steady state Final measurements4.5.9: Sealing 4.4.11: Sub-Group 05 Licensed Cop
34、y: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 6 BSI 10-1999 Table 1 Test schedule for initial qualification approval (See notes on page 7) Clause numbers, tests and test sequencesD or NDTest conditions
35、Performance Requirements Group 2 SequenceD 4.4.11: Sub-Group 05 4.5.9: Sealing (1) 4.4.11: Sub-Group 05 4.3.2: External visual examination and marking Initial measurements 4.5.11Resistance to soldering heat 4.5.15Resistance to solvents 4.5.8Change of temperature 4.5.3Damp heat, steady state(4) Final
36、 measurements Group 3Sequence (5)D 4.5.10Solderability 4.5.12(1) Tensile (3) Bending (wire/strip) Final measurements4.5.9: Sealing (1) or (3) 4.5.10Solderability 4.5.12(1) Tensile (3) Bending (row) (2) Thrust Final measurements4.5.9: Sealing (1) Group 4SequenceND 4.4.11: Sub-Group 05 Temperature: C
37、Temperature: C 4.4.11: Sub-Group 05 Initial measurements 4.5.2Cold 4.5.1Storage at high temperature Final measurements Group 5D Initial measurements4.4.11: Sub-Group 05 4.5.14Endurance: 1 000 h Endurance: 2 000 h (6) Extended endurance: 8 000 h (for information only) Final measurements4.4.11: Sub-Gr
38、oup 05 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 BSI 10-19997 Notes on Table 1 (1)Cavity circuits only (2)Mounting conditions as prescribed by the detail specification (3)The detail spe
39、cification shall prescribe which option is to be used (4)The detail specification may waive the damp heat test for unencapsulated circuits (5)Use of completely processed electrical rejects is permitted (6)In assessment level K: Provisional approval after 1 000 h Definitive approval after 2 000 h (7)
40、Applicable to encapsulation having organic material used for sealing purposes. 3.2.2 Quality conformance inspection 1) Formation of inspection lots An inspection lot shall consist of structurally similar circuits (see 3.1). 100 % screening (if required) applies to all circuits intended for release t
41、o customers. For A and B tests the sample shall be collected from 1 weeks production, or such other period as declared by the manufacturer up to a maximum of 1 month. 2) Tests The test schedules for the lot-by-lot and the periodic tests are prescribed in the relevant blank detail specification. The
42、complete series of tests specified are required for the maintenance of the qualification approval of circuits covered by one detail specification. The tests in each group shall be carried out in the order given. “One defective” is counted when a circuit has not satisfied the whole or a part of the t
43、ests of a group. The approval is maintained when the number of defectives does not exceed the specified number of permissible defectives for each group and the total number of permissible defectives. 3.3 Assessment levels The assessment level(s) for initial qualification approval (see Table 1) and f
44、or maintenance of qualification approval (see relevant BDS) shall be selected from the Table 2 and Table 3 hereafter. Table 2 Assessment levels and acceptance criteria for initial qualification approval In this table: n=sample size c = acceptance criterion (permitted number of defectives) Inspection
45、 group or sub-group of Table 1 Assessment level KLM ncncnc 01 0275 (1)264 (1)2432 818181 03 (for information only)222 04 05 06 39 71 (1) 26 1 1 1 2 26 60 (1) 13 1 1 1 2 13 39 8 1 1 1 2 1 2 3 4 10 13 13 13 1 1 1 1 2 8 10 10 10 1 1 1 1 2 8 8 8 1 1 1 2 5(1 000 h)201131 (2 000 h)201 (8 000 h)88 (for inf
46、ormation only) NOTE (1)This number may be reduced by the relevant number of specimens which are not needed when the test in Group 1 is not required. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100
47、:1985 8 BSI 10-1999 Table 3 Assessment levels and acceptance criteria for the maintenance of the qualification approval and quality conformance inspection Table 3A Lot-by-lot Tests In this table: IL = inspection level AQL = acceptable quality level Clause numbers refer to Section 4 of CECC 63000 Tes
48、t Assessment level KLM 4.6 Screeningrequirednot requirednot required 4.6.1 Schedulea Sampling basisILAQLILAQLILAQL Sub-Group A1II1II2,5I2,5 4.3.2External visual examination and marking Sub-Group A2II0,25II0,4II1 4.4.11Major static/dynamic electrical characteristics at room temperature Sub-Group A3S4
49、1 4.4.11Major static/dynamic electrical characteristics at extreme operating temperatures Sub-Group B1S32,5S32,5S32,5 4.5.10Solderability Sub-Group B2S41S41S41 4.3.3Dimensions a Screening schedule to be selected from CECC 63000 unless otherwise stated in the detail specification. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 63100:1985 BSI 10-19999 Table 3B Periodic tests to be conducted on a sampling basis In this table: p =
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