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1、BRITISH STANDARD BS CECC 75101:1984 Specification for Harmonized system of quality assessment for electronic components Example detail specification/Blank detail specification Two-part and edge socket connectors for printed board application Licensed Copy: London South Bank University, London South
2、Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 75101:1984 BSI 11-1999 ISBN 0 580 35950 8 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Un
3、controlled Copy, (c) BSI BS CECC 75101:1984 BSI 11-1999i Contents Page National forewordii Forewordiii Text of CECC 751011 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 75101:1984 ii BSI 11-1999 Natio
4、nal foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 75101 “Example detail specification/Blank detail specification: Two-part and edge socket connectors for print
5、ed board application”. This Standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical
6、 with those used in British Standards. Attention is especially drawn to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross references. The British Standard which implements CECC 0010
7、0 is BS 9000 “General requirements for a system for electronic components of assessed quality”. Scope. This Standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 75100. International StandardCorresponding
8、British Standard CECC 75100:1984BS CECC 75100:1984 Sectional specification: Two-part and edge socket connectors for printed board application (Identical) IEC 512BS 5772 Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods IEC 512-2:1
9、976Part 2:1979 General examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests (Identical) IEC 512-2A:1980Part 2:Supplement 1:1981 Test 4c (Identical) IEC 512-4:1976Part 4:1979 Dynamic stress tests (Identical) IEC 512-6:1977Part 6:1979 Climatic test
10、s and soldering tests (Identical) IEC 512-6A:1980Part 6:Supplement 1:1981 Test 11b (identical) IEC 512-7:1978Part 7:1981 Mechanical operating tests and sealing tests (Identical) IEC 512-8:1977Part 8:1979 Connector tests (mechanical) and mechanical tests on contacts and terminations (Identical) IEC 5
11、12-8A:1980Part 8:Supplement 1:1981 Tests 15f, 16c, 16d, and 16i (Identical) IEC 512-8B:1980Part 8:Supplement 2:1982 Tests 16g and 16h (Identical) Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 75101:19
12、84 BSI 11-1999iii Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take precedence except that the front page layout will be in accordance with BS 9000 Circular Letter No. 15. A British Standard does n
13、ot purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside
14、front cover, pages i to iv, the CECC title page, pages ii to iv, pages 1 to 9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank Univ
15、ersity, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London
16、South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 ii BSI 11-1999 Contents Page Forewordiii 2Type designation2 3Common features and isometric view3 4Dimensions3 5Gauges3 6Characteristics3 7Test schedule3 8Quality assessment procedures6 9Ordering inf
17、ormation9 Table 256 Table 267 Table 278 Table 289 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those
18、member countries of the European Committee for Electrotechnical Standardisation (CENELEC) who wish to take part in a harmonised System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonisation of the specifications and quality a
19、ssessment procedures for electronic components, and by the grant of an internationally recognised Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC,
20、and has been prepared for those countries taking part in the System who wish to issue national harmonised specifications for TWO PART AND EDGE SOCKET CONNECTORS FOR PRINTED BOARD APPLICATION. It should be read in conjunction with document CECC 00100: Basic Rules (1974). Preface This example detail s
21、pecification/blank detail specification (EDS/BDS) was prepared by CECC WG 25 “Low frequency connectors”. This EDS/BDS provides an example of how to prepare a detail specification in accordance with CECC 75100. The example covers a group of related two-part connectors for printed boards. The group ex
22、tends from connectors having a full complement of contacts for low-voltage applications to connectors for relatively high voltages and currents having fewer contacts. All connectors have the same common mounting features irrespective of their different application characteristics. The board-mounted
23、connectors are provided with terminations suitable for printed boards in accordance with IEC 326 and using a grid of 2,54 mm (0,1 in) as laid down in IEC 97. The fixed connectors are provided either with solder contacts or with wrap or crimp contacts. The terminations of the fixed connectors are loc
24、ated in such a way as to be suitable for use with mother boards using a grid as laid down in IEC Publication 97 as well as for automatic wiring techniques. The text of this EDS/BDS was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for
25、 printing as a CECC Specification. NOTEThis specification does not conform completely with the requirements of CECC 00400. DocumentDate of VotingReport on the Voting CECC (Secretariat) 1381October 1983CECC (Secretariat) 1448 Licensed Copy: London South Bank University, London South Bank University,
26、Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-19991 CECC WG 25: LF CONNECTORSCECC 75101-XXX ISSUE 1 JANUARY 19XX
27、Specification available from: (National Authorized Institution or manufacturer) Page x of xx pages National Specification No: Date of issue: ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH CECC 75100 (Issue 1) Sectional Specification. Two-part and Edge Socket Connec
28、tors for printed board application. See 4 for dimensionsDETAIL SPECIFICATION for two-part connectors for printed boards, for basic grid of 2.54 mm (0.1 in) with common mounting, according to IEC 603-2 (1980). The group of connectors extends from high-density connectors for low-voltage applications t
29、o connectors for relatively high voltages and currents having fewer contacts. Performance Levels: 4 and 7a Assessment Levels: C, H and Fa The combinations of performance level and assessment level covered by this detail specification are 7C, 4H and 4F. a See 7 and 8 Climatic category: 55/125/56 See
30、6.2 for electrical characteristics See 6.3 for mechanical characteristics Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified Products List. Licensed Copy: London South Bank University, London South Bank Univers
31、ity, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 2 BSI 11-1999 2 Type designation Connectors, connector bodies, removable crimp-contacts, performance level and assessment level according to this specification shall be designated by the following system: Example: Co
32、nnector style C, having 96 male gold contacts with solder terminations. Complete board-mounted connector for board up to 1,6 mm (0,063 in), with performance level 7 and assessment level C: CECC 75101-XXX-C096MS-C1A-7C. Licensed Copy: London South Bank University, London South Bank University, Sat De
33、c 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-19993 3 Common features and isometric view 3.1 Mounting dimensions, isometric view 3.2 Mating information 3.3 Survey of styles 4 Dimensions 4.1 General 4.2 Fixed connectors 4.3 Board-mounted connectors 4.4 Mating informa
34、tion 4.5 Accessories 4.6 Mounting information for fixed connectors 4.7 Mounting information for board-mounted connectors 5 Gauges 6 Characteristics 6.1 Climatic category 6.2 Electrical 6.3 Mechanical 7 Test schedule 7.1 General This test schedule shows all tests and the order in which they shall be
35、carried out as well as the requirements to be met. An “X” in the column “Requirements” of the following table indicates that the test or conditioning shall be applied. Unless otherwise specified, mated sets of connectors shall be tested. Care shall be taken to keep a particular combination of connec
36、tors together during the complete test sequence, for example when unmating is necessary for a certain test, the same connectors as before shall be mated for the subsequent tests. In the following, a mated set of connectors is called a “specimen”. For a complete test sequence, 20 specimens are necess
37、ary. For the measurements of contact resistance, the points of connection shall be as follows: Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 4 BSI 11-1999 7.2 All specimens shall be subjected
38、to the following tests: NOTE“PL” denotes Performance Level. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-19995 7.3 The specimens shall be divided into five groups. All connectors in ea
39、ch group shall undergo the tests specified for the relevant group. Group AP Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 6 BSI 11-1999 8 Quality assessment procedures 8.1 Qualification approv
40、al testing 8.1.1 Method 1 Qualification approval will be granted after satisfactory completion of the qualification approval testing according to Table 25, evidence of which is the qualification approval test report. Table 25 8.1.2 Method 2 Qualification approval will be granted after satisfactory c
41、ompletion of the quality conformance inspection, evidence of which is the certified test report (RCE), including the following inspections: 1) lot-by-lot tests (see Table 26) on three consecutive inspection lots, and 2) periodic tests on all lots (see Table 28). Applicable to the combinations of per
42、formance level and assessment level 7C, 4H and 4F. Performance Level 4 and 7Assessment Level C, H and F Test group in 7Test phase in 7 Destructive (D) Non-destructive (ND) Number of connectors to be tested Number of defectives permitted PP1-P5(ND)200 APAP1-AP18(D)41 BPBP1-BP11(D)41 CPCP1-CP5(D)41 DP
43、DP1-DP7(D)41 EPEP1-EP5(D)41 Total number of defectives permitted, all test groups together: 2 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-19997 8.2 Quality conformance inspection 8.2.
44、1 Lot-by-lot tests Structurally similar connectors which may be aggregated into one inspection lot are: types B and C or types D, F and G. Table 26 Applicable to the combinations of performance level and assessment level 7C, 4H and 4F. Licensed Copy: London South Bank University, London South Bank U
45、niversity, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 8 BSI 11-1999 8.2.2 Periodic tests The periodic tests with complete test groups (inspection Groups C4 and D) shall be carried out on specimens that have successfully passed tests P1 to P5 and that have been tak
46、en from lots which have already satisfied the lot-by-lot tests (See 8.2.1). The periodic tests with single test phases (inspection Groups C1, C2 and C4) shall be carried out on specimens that have successfully passed the lot-by-lot tests (See 8.2.1). Table 27 Applicable to the combinations of perfor
47、mance level and assessment level 7C, 4H and 4F. Inspection group Performance Level 4 and 7 Assessment Level C, H and F Test phase in 7 Test IEC 512 Test Periodicity, month No. of specimens No. of defectives C1AP3.1Solderability12a1 a 1b C2P3Contact resistance2a341 C4AP3.2 AP4 Resistance to soldering
48、 heat Voltage proof 12d 4a 1241 C4BP1-BP11Test Group BP1241 C4CP1-CP5Test Group CP1241 DAP1-AP18Test Group AP3641 DDP1-DP7Test Group DP3641 DEP1-EP5Test Group EP3641 RCE information to be given: Results from inspection Groups C1, C2, C4 and D a 20 terminations or 1 connector b 1 defective terminatio
49、n Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:23 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CECC 75101:1984 BSI 11-19999 8.3 Delayed delivery, re-inspection Connectors stored for a period of more than 36 months after the release of the lot shall be tested prior to delivery according to Table 28. Once a lot has been satisfactorily re-inspected the quality is assessed for a further 36 months. Table 28 Applicable to the combinations of performance level and assessment level 7C, 4H and 4F. 9 Ordering information For
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