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1、BRITISH STANDARD BS EN 168000:1996 BS CECC 68000:1990 renumbered Incorporating Amendment No. 1 and implementing Amendment No. 2, not published separately Harmonized system of quality assessment for electronic components Generic specification: Quartz crystal units The European Standard EN 168000:1993
2、, together with its amendments A1:1993 and A2:1998, has the status of a British Standard ICS 31.140 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 168000:1996 This British Standard, having been prepared under the direction of the Elec
3、tronic Components Standards Policy Committee, was published under the authority of the Board of BSI and comes into effect on 31 December 1990 BSI 05-1999 The following BSI references relate to the work on this standard: Committee reference ECL/11 Draft for comment 89/28709 DC ISBN 0 580 19163 X Comm
4、ittees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Policy Committee (ECL/-) to Technical Committee ECL/11, upon which the following bodies were represented: British Telecommunications plc EEA (the Electronics and
5、 Business Equipment Association) Electronic Components Industry Federation Institution of Electrical Engineers Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association Amendments issued since publ
6、ication Amd. No.Date of issueComments 9184November 1996 10023July 1998Indicated by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 168000:1996 BSI 05-1999i Contents Page Committees responsibleInside front cover
7、 National forewordii Foreword2 Text of EN 1680005 Publications referred toInside back cover Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 168000:1996 ii BSI 05-1999 National foreword This British Standard has been prepared by Technic
8、al Committee EPL/49 (formerly ECL/11), and is the English language version of EN 168000:1993 Generic specification: Quartz crystal units, together with its amendment A1:1993 and amendment A2:1998, published by the CENELEC Electronic Components Committee (CECC). EN 168000 has been prepared by CECC Wo
9、rking Group 17, Piezoelectric devices for frequency control and selection, and the United Kingdom participation in the drafting was provided by Technical Committee EPL/49, Piezoelectric devices for frequency control and selection. EN 168000:1993 is based on CECC:1989 together with its amendment 1:19
10、90. Cross-references Publication referred toCorresponding British Standard BS EN 60068: Environmental testing BS EN 60068-2: Test methods EN 60068-1:1994 (IEC 68-1:1988) BS EN 60068-1:1995 BS 2011: Environmental testing N 60068-2-1:1993 (IEC 68-2-1:1990) BS EN 60068-2-1:1993 Tests A. Cold EN 60068-2
11、-2 1993 (IEC 68-2-2:1974) BS EN 60068-2-2:1993 Tests B. Dry heat EN 60068-2-6:1995 (IEC 68-2-6:1995) BS EN 60068-2-6:1996 Test Fc. Vibration (sinusoidal) EN 60068-2-7:1993 (IEC 68-2-7:1983) BS EN 60068-2-7:1993 Test Ga and guidance. Acceleration, steady state EN 60068-2-17:1992) (IEC 68-2-17:1991) B
12、S EN 60068-2-17:1995 EN 60068-2-7:1993 (IEC 68-2-27:1987) BS EN 60068-2-27:1993 Environmental testing procedures. Tests. Test Ea and guidance. Shock EN 60068-2-29:1993 (IEC 68-2-29:1987) BS EN 60068-2-29:1993 Environmental testing procedures. Tests. Test Eb and guidance. Bump EN 60068-2-32:1993 (IEC
13、 68-2-32:1975) BS EN 60068-2-32:1993 Test Ed. Free fall. EN 60068-2-45:1992 (IEC 68-2-45:1980) BS EN 60068-2-45:1993 Environmental testing. Tests. Test Xa and guidance. Immersion in cleaning solvents IEC 68-2Part 2.1 Tests IEC 68-2-3:1969Part 2.1Ca:1977 Test Ca. Damp heat, steady state IEC 68-2-11:1
14、981Part 2.1Ka:1982 Test Ka. Salt mist IEC 68-2-14:1984Part 2.1N:1985 Test N. Change of temperature IEC 68-2-20:1979Part 2.1T:1981 Test T. Soldering IEC 68-2-21:1983Part 2.1U:1984 Test U. Robustness of terminations and integral mounting devices IEC 68-2-30:1980Part 2.1Db:1981 Test Db and guidance. Da
15、mp heat, cyclic (12 + 12 hour cycle) BS 5069 Dimensions of piezoelectric devices Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 168000:1996 BSI 05-1999iii A British Standard does not purport to include all the necessary provisions of
16、a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. IEC 122-3:1977 and IEC 122-3A Part 1:1980 Specification for standard outlines and pin connections for quartz crystal uni
17、ts IEC 617BS 3939 Graphical symbols for electrical power, telecommunications and electronics diagrams. ISO 1000:1992BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units Summary of pages This document comprises a front cover, an inside
18、front cover, pages i to iv, the EN title page, pages 2 to 28, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheff
19、ieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 168000 March 1993 + A1 March 1993 + A2 February 1998 Sup
20、ersedes CECC 68 000 Issue 1:1989 Descriptors: Quality, electronic components, quartz crystal units English version Generic specification: Quartz crystal units (Includes amendment A1:1993 and amendment A2:1998) Spcification gnrique: Rsonateurs quartz (Inclut les amendements A1:1993 et A2:1998) Fachgr
21、undspezifikation: Schwingquarze (Enthlt nderungen A1:1993 und A2:1998) This European Standard was approved by the CENELEC Electronic components Committee (CECC) on 14th January 1992. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for givi
22、ng this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in thre
23、e official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotec
24、hnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees
25、 of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1993 Copyright reserved to CENELEC members Ref. N
26、o. EN 168000:1993 + A1:1993 + A2:1998 E Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 168000:1993 BSI 05-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee
27、for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic compone
28、nts, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 17, Piezoelectric devices for frequency control
29、and selection. The text of the draft based on document CECC 68 000 Issue 1:1989 (with A1) and CECC (Secretariat) 2851 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC (Secretariat) 2961 it was approved by CECC as EN
30、168 000 on 14 January 1992. The following dates were fixed: Foreword to amendment A2 This amendment to the European Standard EN 168000:1993 was prepared by CLC/TC CECC/SC 49 (former WG 17). The text of the draft based on document CECC (Secretariat) 3332 was submitted to the formal vote; together wit
31、h the voting report, circulated as document CECC (Secretariat) 3453, it was approved as amendment A2 to EN 168000:1993 on 1993-11-02. NOTEAmendment A1:1993 is included in EN 168000. The following dates were fixed: latest date of announcement of the EN at national level(doa) 1992-12-08 latest date of
32、 publication of an identical national standard(dop) 1993-06-08 latest date of declaration of national standards obsolencence1993-06-08 latest date of withdrawal of conflicting national standards(dow) 2002-12-08 latest date by which the amendment has to be implemented at national level by publication
33、 of an identical national standard or by endorsement(dop) 1998-08-01 latest date by which the national standards conflicting with the amendment have to be withdrawn(dow) 1999-08-01 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 168000:19
34、93 BSI 05-19993 Contents Page Foreword2 Section 1. Scope Section 2. General 2.1Order of precedence5 2.2Related documents5 2.3Units, symbols and terminology7 2.4Preferred ratings and characteristics12 2.5Marking14 Section 3. Quality assessment procedures 3.1Primary stage of manufacture15 3.2Structura
35、lly similar components15 3.3Subcontracting15 3.4Manufacturers approval15 3.5Approval procedures15 3.6Procedures for capability approval16 3.7Procedures for qualification approval16 3.8Test procedures16 3.9Screening requirements16 3.10Rework and repair work17 3.11Certified test records17 3.12Validity
36、 of release17 3.13Release for delivery17 3.14Unchecked parameters17 Section 4. Test and measurement procedures 4.1General17 4.2Alternative methods17 4.3Precision of measurement17 4.4Standard conditions for testing18 4.5Visual inspection18 4.6Dimensioning and gauging procedures18 4.7Electrical test p
37、rocedures18 4.7.1 Frequency and resonance resistance18 4.7.2 Drive level dependency19 4.7.3 Frequency and resonance resistance as a function of temperature19 4.7.4 Unwanted responses19 4.7.5 Shunt capacitance19 4.7.6 Load resonance frequency and resistance20 4.7.7 Frequency pulling range20 4.7.8 Mot
38、ional parameters20 4.7.9 Insulation resistance20 4.8Mechanical and environmental test procedures20 Page 4.8.1Robustness of terminations20 4.8.2Sealing tests21 4.8.3Soldering (Solderability and resistance to solder heat)22 4.8.4Rapid change of temperature, two-fluid-bath method22 4.8.5Rapid change of
39、 temperature with prescribed time of transition22 4.8.6Bump23 4.8.7Vibration23 4.8.8Shock23 4.8.9Free fall23 4.8.10 Acceleration, steady state23 4.8.11 Dry heat23 4.8.12 Damp heat, cyclic23 4.8.13 Cold23 4.8.14 Climatic sequence24 4.8.15 Damp heat steady state24 4.8.16 Immersion in cleaning solvents
40、24 4.8.17 Flammability test24 4.9Endurance test procedure24 4.9.1Ageing24 4.9.2Extended ageing24 4.9.3Shelf life25 Annex A Drive level dependency26 Figure 1 Symbol and equivalent electrical circuit of a piezoelectric vibrator near a resonance8 Figure 2 Resonance, anti-resonance and load resonance fr
41、equencies10 Figure 3 Terminal bend test tool21 Figure 4 Examples of typical drive level response27 Figure 5 Recommended DLD ratios27 Figure 6 Block diagram for method 2 test procedure28 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 4 blank
42、 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 168000:1993 BSI 05-19995 Section 1. Scope This document specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval
43、or qualification approval procedures. Section 2. General 2.1 Order of precedence Where any discrepancies occur for any reason, documents shall rank in the following order of precedence: the detail specification the sectional specification the generic specification the FEN internal regulations any ot
44、her international documents (for example of the IEC) to which reference is made The same order of precedence shall apply to equivalent national documents. 2.2 Related documents ISO 1000(1973)SI units and recommendations for the use of their multiples and of certain other units IEC 27-1(1971)Letter s
45、ymbols to be used in electrical technology: Part 1: General IEC 27-2(1972)Letter symbols to be used in electrical technology: Part 2: Telecommunications and electronics IEC 50 (561)International Electrotechnical Vocabulary Chapter 561: Piezoelectric devices for frequency control and selection IEC 68
46、Basic environmental testing procedures IEC 68-1(1988)Part 1: General and guidance IEC 68-2Part 2: Tests IEC 68-2-1(1990)Test A: Cold IEC 68-2-2(1974) (1976) Tests B: Dry heat Supplement A IEC 68-2-3(1969) (1984) Test Ca: Damp heat, steady state Amendment No. 1 IEC 68-2-6(1982) (1983) (1985) Test Fc
47、and guidance: vibration (sinusoidal) Amendment No. 1 Amendment No. 2 IEC 68-2-7(1983) (1986) Test Ga: Acceleration, steady state Amendment No. 2 IEC 68-2-11(1981)Test Ka: Salt mist IEC 68-2-14(1984) (1986) Test N: Change of temperature Amendment No. 1 IEC 68-2-17(1978) (1989) Test Q: Sealing Amendme
48、nt No. 3 IEC 68-2-20(1979) (1986) (1987) Test T: Soldering Amendment No. 1 Amendment No. 2 IEC 68-2-21(1983) (1985) Test U: Robustness of terminations Amendment No. 1 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:44 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 168000:1993 6 BSI 05-19
49、99 IEC 68-2-27(1987)Test Ea: Shock IEC 68-2-29(1987)Test Eb: Bump IEC 68-2-30(1980) (1985) Test Db :Damp heat cyclic Amendment No. 1 IEC 68-2-32(1975) (1990) Test Ed: Free fall Amendment No. 2 IEC 68-2-45(1980)Test XA: Immersion in cleaning solvents IEC 122-1(1976) (1983) Standard values and test conditions Amendment No. 1 IEC 122-3(1977) (1984) (1979) (1980) (1981) (1989) Standard outlines and pin connections Amendment No. 1 Supplement A Supplement B Supplement C Supplement D IEC 302(1969)Standard definitions and methods of
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