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1、BRITISH STANDARD BS CECC 90203:1985 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Integrated analogue switching circuits Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Unc
2、ontrolled Copy, (c) BSI BS CECC 90203:1985 BSI 10-1999 ISBN 0 580 35567 5 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 BSI 10-1999i
3、 Contents Page National forewordii Forewordii 1Front page1 2Ratings (Limiting values)3 3Recommended conditions of use and associated characteristics3 4Test conditions and inspection requirements4 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00
4、 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standard Committee. It is identical with CENELEC Electronic Components Committee (CECC) 90203:1985 “Harmonized system of qual
5、ity assessment for electronic components. Blank detail specification: Integrated analogue switching circuits.” Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventio
6、ns are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which
7、implements CECC 00100 is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements w
8、hich shall be included as mandatory requirements in accordance with BS CECC 90000 in any detail specification for these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS 9000 Ci
9、rcular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Stand
10、ardCorresponding British Standard CECC 90000:1982BS CECC 90000:1982 Harmonized system of quality assessment for electronic components: Generic specification: Monolithic integrated circuits (Identical) CECC 90200:1983BS CECC 90200:1983 Harmonized system of quality assessment for electronic components
11、: Sectional specification: Analogue monolithic integrated circuits (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, page ii, pages 1 to 11 and a back cover. This standard has been updated (see copyright date) and may have
12、 had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South B
13、ank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 ii BSI 10-1999 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take
14、 part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or
15、 Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmon
16、ized specifications for INTEGRATED ANALOGUE SWITCHING CIRCUITS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, t
17、he Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Preface This blank detail specification (BDS) was prepared by CECC WG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular o
18、n IEC 147: Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. The text of this BDS was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing is a CECC Specification. It is
19、recognized that the layout proposed cannot apply to all detail specifications based on this document. For example when several similar devices are covered by the same detail specification, it may be convenient to give the limiting values in a table. Notice In accordance with the decision of the CECC
20、 Management Committee this specification is published initially in English and French. The German text will follow as soon as it has been prepared. DocumentsDate of votingReport on the voting CECC (Secretariat) 1405August 1983CECC (Secretariat) 1513 Licensed Copy: London South Bank University, Londo
21、n South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 BSI 10-19991 1 Front Page The front page of the DS shall be laid out as shown on the following page. The numbers between square brackets correspond to the following indications which shall be g
22、iven: Identification of the component and supplementary information: Description of the materials for the package (for example, glass, ceramic, silicone) and information relating to the mounting (welding, soldering), lead material and finish. Inside the sketch of the package, the terminal connection
23、s to the inputs, outputs or other important points of the circuit shall be identified. This can be shown by a functional block diagram. Description of the numbering of the terminals with the identification of pin number 1. Marking on the device in accordance with the GS (see 2.5 of CECC 90000). Iden
24、tification of the DS and of the component: 1The name of the National Standards Organization under whose authority the DS is published and, if applicable, the organization from whom the DS is available. 2The CECC Symbol and the CECC number allotted to the DS by the CECC General Secretariat. 3The numb
25、er and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4If different from the CECC number, the national number of the DS, date of issue and any further information required by the national system, together with any amendment numbers. 5Ty
26、pe number, a short description of the type by: function (for example single pole, double throw switch) number of independent circuits per package number and kind of inputs and outputs material and type of construction (silicon, monolithic, multichip, bipolar, MOS) performance, for example low resist
27、ance, high speed, low power consumption electrostatic sensitivity (where appropriate). 6Information on typical construction (if applicable) For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC 00200 or CECC 00300. 7An outline drawing with main dimensions which are of im
28、portance for interchangeability, and/or reference to the appropriate national or international document for outlines. Alternatively, this drawing may be given in an appendix to the DS. 8Quality assessment level(s) 9Reference data giving information on the most important properties of the component,
29、which allow comparison between the various component types intended for the same, or for similar, applications. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 2 BSI 10-1999 Layout for front
30、page of detail specification Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 BSI 10-19993 2 Ratings (limiting values) (Not for inspection purposes) These apply over the operating temperature
31、range, unless otherwise stated (see SS 90200). 3 Recommended conditions of use and associated characteristics (Not for inspection purpose) The following characteristics shall apply over the full ambient operating temperature range unless otherwise specified. Where the stated performance of the circu
32、it varies over the ambient operating temperature range the values of the input and output voltages and their associated currents shall be stated at 25 C and at the extremes of the operating temperature range. Where it is necessary to use external elements to ensure stable operation of the switch, th
33、e values of the characteristics specified refer to the switch with such elements connected. 2.1Maximum (and where appropriate minimum) value of voltage between the reference terminal and each other terminal. 2.2Any other limiting value(s) of voltage between any specified terminals as appropriate. 2.
34、3Maximum continuous output currentIO 2.4Maximum continuous internal power dissipation with reference to a derating curve or factor related to the reference point temperature or ambient temperature, if appropriate maximum power dissipation per switch PD 2.5Maximum pulsed analogue currentIpeak 2.6Maxi
35、mum and minimum ambient or reference point operating temperatureTamb 2.7Maximum and minimum storage temperatureTstg 2.8Any specific mechanical or environmental ratings pecullar to the device 2.9Any interdependence of limiting conditions 2.10 Minimum value of short circuit time, where appropriatetOS
36、CharacteristicsSymbolMethod (See SS 902004.1.3) 3.1Input voltage(s)VI, VI (VS) 3.2Output voltageVO, Vo (VD) 3.3Output currentIO, Io (ID) 3.4Low level control input currentIIL 3.5High level control input currentIIH 3.6Power supply currents (static conditions)IS (ICC, IDD IEE, IGND IREF) 3.7Leakage cu
37、rrentIl(OFF), (IS(OFF) IO(OFF), (ID(OFF) IlO(ON), (IDS(ON) 3.8Switch-ON resistanceR(ON), (RDS(ON)S-02 3.9OFF-STATE switch Insulation (if applicable)a(OFF)S-03 3.10Harmonic distorsion (if applicable)DS-04 3.11Crosstalk attenuation between any two channelsactS-05 (where appropriate) 3.12Feedthrough be
38、tween control input and analogue output %VOS-06 3.13Turn-ON timet(ON)S-07 3.14Turn-OFF timet(OFF)S-07 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 4 BSI 10-1999 4 Test conditions and inspe
39、ction requirements These are given in the following tables, where the values and exact test conditions to be used shall be specified as required in the detail specification relevant to a given type, in line with the indications given in CECC 90200 for the relevant test. NOTE 1All tests are performed
40、 at Tamb. = 25 5 C, unless otherwise prescribed. NOTE 2In the tables the paragraph numbers refer to the generic or sectional specifications with the following code: External elements necessary to ensure stable operation shall be specified and shall be connected for all electrical tests. 4.1 Explanat
41、ion of quality assessment levels R, T and V See S2/5.7.1. 4.2 Key of abbreviations See S2/5.7.2. CharacteristicsSymbolMethod (See SS 90200 4.1.3) 3.15Transition time (if applicable)tTS-07 3.16Propagation time (If applicable)tPS-07 3.17MAKE-BEFORE-BREAK time (where appropriate) tMBBS-08 3.18BREAK-BEF
42、ORE-MAKE time (where appropriate) TBBMS-08 (See SS 90200, 4.1.1) 3.19Cut-off frequency (if applicable)fa, fbA-10 The following additional information shall be given as design data. 3.20A graph, or graphs showing switching times against Vo and temperature. 3.21A graph, or graphs showing a normalised
43、supply current IS against the switching frequency. 3.22A graph showing R(ON) versus analogue input voltage Vi (if applicable) 3.23A schematic diagram of the device shall be given, in the case of complex devices, a schematic for one typical channel may be given. G:Generic specification: Monolithic in
44、tegrated circuits (CECC 90000, issue 2,) S1:Sectional specification: Digital monolithic integrated circuits (CECC 90100, issue 2) S2:Sectional specification: Analogue integrated monolithic circuits (CECC 90200, issue 1) Example: S2/4.2.2 = 4.2.2 of CECC 90200. or S2/S-07 = electrical test method n 7
45、 for an analogue switch Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 BSI 10-19995 Examination or test D ND Conditions of test Limits to be specified Inspection requirements Group A inspect
46、ion: The following electrical inspection requirements shall be given. Additional characteristics to be inspected may be given for specific circuit(s) in accordance with 3 of this specification Assessment levels RTV ILAQLILAQLILAQL Sub-group A1NDI1,5I1,5I1,5 Visual examination G/4.2.2 See G/4.2.2None
47、 Sub-group A2NDII0,15II0,25II0,25 Verification of the function Method S2/S-01 Supply voltages and/or currents = specified values All input signals and resultant output levels as well as combinations necessary to verify the functional operation of the device shall be specified Loading conditions shal
48、l be specified Each switch shall be tested in turn S2/4.1.3 Sub-group A3NDII0,65II0,65II0,65 Static characteristics at 25 C Low level control input current IIL Method S1/4.1.2 (3) Supply voltages as specified Control input voltage = VILA Each control input shall be tested in turn IILA High level con
49、trol input current IIH Method S1/4.1.2 (4) Supply voltages as specified Control input voltage = VIHB Each control input shall be tested in turn IIHA Positive supply current IS(1) (or ICC) (if applicable) Method S1/4.1.6(1) Supply voltages as specified Control input voltages as specified IS (1)A (or ICCA) Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90203:1985 6 BSI 10-1999 Examination or test D ND Conditions of test Limits t
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