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1、BRITISH STANDARD BS CECC 30401:1985 Specification for Harmonized system of quality assessment for electronic components Blank detail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitors Licensed Copy: London South Bank University, London South Bank University, F
2、ri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 BSI 10-1999 ISBN 0 580 35640 X Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (
3、c) BSI BS CECC 30401:1985 BSI 10-1999i Contents Page National forewordii Forewordiii Text of CECC 304011 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 ii BSI 10-1999 National foreword This
4、British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 30401:1985 “Harmonized system of quality assessment for electronic components. Blank detail specification: Fixed metallized pol
5、yethylene terephthalate film dielectric d.c. capacitors”. This standard is a harmonized specification within the CECC System. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and ce
6、rtain conventions are not identical with those used in British Standards; attention is especially drawn to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British
7、Standard which implements CECC 00100 is BS 9000: General requirements for a system for electronic components of assessed quality Part 2:1983 “Specification for national implementation of the CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspect
8、ion requirements which shall be included as mandatory requirements in accordance with BS CECC 30400. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take precedence except that the front page layout w
9、ill be in accordance with BS 9000 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from le
10、gal obligations. International StandardCorresponding British Standard CECC 30000:1983BS CECC 30000:1984. Harmonized system of quality assessment for electronic components: Generic specification for fixed capacitors (Identical) CECC 30400:1984BS CECC 30400:1985. Harmonized system of quality assessmen
11、t for electronic components. Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric capacitors for direct current (Identical) IEC 384-2-1:Part 2:1982BS 9930-04.01:1984. Fixed capacitors for use in electronic equipment. Blank detail specification: Fixed metallized polyet
12、hylene-terephthalate film dielectric d.c. capacitors. Assessment level E (Identical) IEC 410:1973BS 6001:1972. Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC
13、title page, pages ii to iv, pages 1 to 7 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University,
14、 Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 ii BSI 07-1999 Contents Forewordiii 1General data1 2Inspection requirements2 Ta
15、ble 11 Table 2 Values of capacitance related to voltages and case sizes1 Table 3 Other characteristics2 Table 4A Lot-by-lot inspection (Group A and B)3 Table 4B Periodic Tests4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled
16、 Copy, (c) BSI BS CECC 30401:1985 BSI 10-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assess
17、ed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the S
18、ystem are thereby accepted by all member countries without further testing. This blank detail specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for FIXED METALLIZED POLYETHYLE
19、NE-TEREPHTHALATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification was prepared by CECC Working Group 3: “Capacitors”, and it is an editorially revised version of CECC 30401 Issue
20、1. It is one of a series of blank detail specifications all relating to the sectional specification CECC 30400, Issue 2. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC 384-2-1-2: Blank detail specification: Fixed metalliz
21、ed polyethylene- terephthalate film dielectric d.c. capacitors. Assessment level E. The text of this blank detail specification was circulated to the CECC for voting in the documents indicated below and was ratified by the President of the CECC for printing as a CECC Specification. Key for page iv T
22、he numbers between square brackets on page iv correspond to to the following indications which should be given: Identification of the harmonized detail specification Identification of the capacitor DocumentVoting dateReport on the voting CECC (Secretariat) 1369May 1983CECC (Secretariat) 1511 This se
23、cond issue of CECC 30401 shall become effective for all new qualification approvals on 1 April 1985. Issue 1 will continue to remain effective to cover all past approvals. 1 The name of National Standards Organization under whose authority the detail specification is drafted 2 The CECC Symbol and th
24、e number allotted by the CECC General Secretariat to the completed detail specification 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specification, date of issue and any further information required by the national system. 5 A
25、 short description of the type of capacitor 6 Information on typical construction (see examples given on page iv) 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. 8 Level of quality assessm
26、ent 9 Quick reference data Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 iv BSI 07-1999 Specification available from: (National Standards Organization) 1 CECC number and mark2 (National num
27、ber of detail specification, date of issue, National type number, if any) 4 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH: (Number of national generic and sectional specification) 3 Outline and dimensions: (first angle projection)7 DETAIL SPECIFICATION FOR FIXED M
28、ETALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS 5 TYPICAL CONSTRUCTION: (Examples) cylindrical/rectangular non metallic/metallic case insulated/non insulated axial/radial terminations 6 Assessment level E8 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, d.c
29、. rated voltage range, climatic category, performance grade 9 Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified products List. Licensed Copy: London South Bank University, London South Bank University, Fri Dec
30、 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 BSI 10-19991 1 General data 1.1 Recommended method of mounting See 1.4.2 of CECC 30400, Issue 2. 1.2 Dimensions Table 1 NOTE 1When there is no case size reference, Table 1 may be omitted and the dimensions shall be given in T
31、able 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. 1.3 Ratings and characteristics Table 2 Values of capacitance related to voltages and case sizes 1.4 Related documents 1.5 Marking The marking of the capacitor and
32、 the packing shall be in accordance with the requirements of 1.5 of CECC 30400, Issue 2. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clea
33、r or in coded form, the following minimum information: 1) Rated capacitance 2) Tolerance on rated capacitance 3) Rated d.c. voltage 4) Number and issue reference of the detail specification and style reference. Case size reference Dimensions (in mm) LHd. Capacitance range Tolerance on rated capacita
34、nce Rated voltage Category voltage (if applicable) Climatic category Rated temperature Max. a.c. voltage (if applicable) Max. pulse load (if applicable) Tangent of loss angle Insulation resistance (See Table 2) (See Table 2) (See Table 2) Rated voltage Category voltage (1) Rated capacitance (in nF a
35、nd/or 4F) Case sizeCase sizeCase sizeCase size (1) If different from the rated voltage. Generic specification:CECC 30000 (Issue 3) Sectional specification:CECC 30400 (Issue 2) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled
36、Copy, (c) BSI BS CECC 30401:1985 2 BSI 10-1999 1.7 Certified test records Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased
37、 requirements should be specified only when essential. Table 3 Other characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with 3.4 of CECC 30400, Issue 2. 2.1.2 For Quality Conformance Inspection the test schedule (Table 4) i
38、ncludes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of CECC 30400, Issue 2. This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification. Notes to Table 4A and Tab
39、le 4B NOTE 1Clause numbers of tests and performance requirements refer to CECC 30400, Issue 2. NOTE 2Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. NOTE 3In Table 4A and Table 4B : P = periodicity (in months) n = sample size c = acceptance criterion (permitted
40、number of defectives) D = destructive ND = non-destructive Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 BSI 10-19993 Table 4A Lot-by-lot inspection (Group A and B) Clause number and test (
41、1) D or ND (3) Conditions of test (1) IL (2) AQL % (2) Performance requirements (1) Sub-Group A1NDS42,5 4.1 4.1 Visual examination Dimensions (gauging) As in 4.1 Legible marking as specified in 1.5 of this specification As specified in Table 1 of this specification Sub-Group A2NDII1,0 4.2.2 4.2.3 4.
42、2.1 4.2.4 Capacitance Tangent of loss angle Voltage proof (measuring point 1a) Insulation resistance (Measuring point 1a) Within specified tolerance as in 4.2.3(2) No breakdown or flashover (selfhealing breakdown allowed) as in 4.2.4(2) Sub-Group B1ND (4)S32,5 4.5SolderabilityWithout ageing Method:
43、Good tinning as evidenced by free flowing of the solder with wetting of the terminations or soldering time s, as applicable (1), (2) and (3): See page 2 (4) Provided that requirements of Sub-Group A1 are met after testing. Licensed Copy: London South Bank University, London South Bank University, Fr
44、i Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 4 BSI 10-1999 Table 4B Periodic Tests Clause number and test D or NDCondition of testPncPerformance requirements (1)(3)(1)(3)(3)(3)(1) Sub-Group C1AD691 4.1 4.3.1 4.3 4.4 4.4.2 Dimensions (Detail) Initial measurements Ro
45、bustness of terminations Resistance to soldering heat Final measurements Capacitance Tangent of loss angle: for CR 1 4F: at 1 kHz For CRk 1 4F: at 10 kHz Visual examination Method: Visual examination Capacitance Tangent of loss angle See detail specification No visible damage No visible damage k 2 %
46、 of the value measured initially Increase of tan : k 0,003 C k 1 4F Grade 1 k 0,002 C 1 4F Grade 1 k 0,005 C k 1 4F Grade 2 k 0,003 C 1 4F Grade 2 compared to values measured in 4.3.1. Sub-Group C1BD6181 4.6.1 4.6 4.7 Initial measurements Rapid change of temperature Vibration Capacitance Tangent of
47、loss angle: For CR 1 4F: at 1 kHz For CR k 1 4F: at 10 kHz TA= Lower category temperature TB= Upper category temperature Five cycles Duration t = 30 min Visual examination Method of mounting: See 1.1 of this spec. Procedure B4 Frequency range: . Hz to . Hz Amplitude 0,75 mm or acceleration 98 m/s2 (
48、whichever is the less severe) Total duration: 6 h Visual examination No visible damage No visible damage (1) and (3): See page 2 %C C - - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:53 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401:1985 BSI 1
49、0-19995 Table 4B Periodic Tests Clause number and test D or NDCondition of testPncPerformance requirements (1)(3)(1)(3)(3)(3)(1) 4.8 4.9 Bump (or shock see 4.9) Shock (or bump see 4.8) Method of mounting: see 1.1 of this spec. Number of bumps: . Acceleration: . m/s2 Duration of pulse: ms Method of mounting: see 1.1 of this spec. Acceleration: . m/s2 Duration of pulse: ms 4.8.3 or 4.9.3 Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance No visible damage k 5 % of
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