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1、BRITISH STANDARD BS EN 190106:1994 Incorporating Amendment Nos. 1 and 2 Specification for Harmonized system of quality assessment for electronic components Family specification TTL advanced low power SCHOTTKY digital integrated circuits Series 54 ALS, 74 ALS The European Standard EN 190106:1994 has
2、the status of a British Standard Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190106:1994 BSI 11-1999 ISBN 0 580 08604 6 Amendments issued since publication Amd. No.Date of issueComments 8118February 1994 8372September 1994 Indicate
3、d by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190106:1994 BSI 11-1999i Contents Page National forewordii Foreword2 Forewordiii Text of CECC 901061 Publications referred toInside back cover Licensed Copy:
4、 sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190106:1994 ii BSI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Compon
5、ents Committee (CECC) 90106:1987 “Harmonized system of quality assessment for electronic components. Family specification: TTL advanced low power SCHOTTKY digital integrated circuits”. This standard is a harmonized specification within the CECC System. This standard supersedes BS CECC 90106:1984 whi
6、ch is withdrawn. In 1994 the CENELEC Electronic Components Committee (CECC) accepted CECC 90106:1987 with Amendment 1 as European Standard EN 190106:1994. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without devia
7、tion. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. C
8、ross-references. The British Standard which implements CECC 00100 is BS 9000: “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the
9、 provisions of IEC 747, IEC 748 and IEC 749, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requiremen
10、ts in accordance with BS CECC 90100 in any detail specification for these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS 9000 Circular letter No. 15. International Standardsa
11、 Corresponding British Standards IEC 68-2-30:1980BS 2011 Basic environmental testing procedures Part 2.1 Db:1981 Test Db and guidance. Damp heat cyclic (12 + 12 hour cycle) (Identical) CECC 90000:1985BS CECC 90000:1985 Harmonized system of quality assessment for electronic components. Generic specif
12、ication: monolithic integrated circuits. (Identical) CECC 90100:1986BS CECC 90100:1986 Harmonized system of quality assessment of electronic components. Sectional specification: digital monolithic integrated circuits. (Identical) a Undated in text. Licensed Copy: sheffieldun sheffieldun, na, Tue Nov
13、 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190106:1994 BSI 11-1999iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of
14、 itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, the EN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 8, an inside back cover and a back cover. This standard has been updated (see copyr
15、ight date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:
16、15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 190106 May 1994 UDCSupersedes CECC 90106 Issue 2:1987 Descriptors: Quality, electronic components, TTL advanced low power Schottky digital integrated circuits English version Family specification: T
17、TL advanced low power SCHOTTKY digital integrated circuits Series 54ALS, 74ALS Spcification de famille: Circuits intgrs logiques TTL Schottky avance faible consommation Sries 54ALS, 74ALS Familienspezifikation: Digitale integrierte TTL Advanced Low Power Schottky-Schaltungen Serien 54ALS, 74ALS This
18、 European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 8 May 1994. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up
19、-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by
20、 translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Icel
21、and, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Stan
22、dardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1994 Copyright reserved to CENELEC members Ref. No. EN 190106:1994 E Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 G
23、MT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 BSI 11-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electroni
24、c components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The component
25、s produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 9, “Integrated Circuits”. The text of the draft based on document CECC 90106 Issue 2:1987 (with A1) was submitted to the formal vote for conversion to a
26、European Standard; together with the voting report, circulated as document CECC(Secretariat)3543 it was approved by CECC as EN 190106 on 8 May 1994. The following dates were fixed: latest date of announcement of the EN at national level(doa)1994-09-01 latest date of publication of an identical natio
27、nal standarda(dop)1995-03-01 latest date of withdrawal of conflicting national standardsa(dow)1996-03-01 a National Standard (excluding National implementation of IECQ Specifications) Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed
28、Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 ii BSI 11-1999 Contents Page Forewordiii 1Limiting conditions of use for the family2 2Recommended operating conditions and associated characteristics for the family2 3Test methods and pro
29、cedures3 4Inspection requirements7 Figure 1 Diagram for switching parameters4 Figure 2 Signal waveform at the input of the component under test4 Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 BSI 11-1999iii Foreword The CENEL
30、EC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international
31、 trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further
32、testing. This specification his been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for TTL ADVANCED LOW POWER SCHOTTKY DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction with the curr
33、ent regulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Preface This Family Deta
34、il Specification was prepared by CECC WG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC 747: Semiconductor devices: Discrete devices and integrated circuits, IEC 748: Semiconductor devices: Integra
35、ted circuits, IEC 749: Semiconductor devices: Mechanical and climatic test methods. It contains general information on TTL Advanced Low Power Schottky digital integrated circuits and defines the common characteristics for this family of integrated circuits. Together with the device type detail speci
36、fication (DS) of a component usually prepared nationally, this family detail specification forms a complete detail specification. The text of this second Issue consists of the text of CECC 90106 Issue 1 (1984) amended in accordance with the ratified new material introduced by the following document.
37、 In accordance with the decision of the CECC Management Committee this specification is published initially in French and English. The German text will follow as soon as it has been prepared. Effective date This second Issue of CECC 90106 shall become effective for all new qualification approvals on
38、 1 April 1987. Issue 1 will continue to remain effective to cover all past approvals. DocumentDate of VotingReport on the Voting CECC (Secretariat) 1968September 1986CECC (Secretariat) 2010 Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv
39、blank Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 BSI 11-19991 CECC 90106 ISSUE 2 1987 Page 1Total number of pages: 8 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: CECC 90000: Generic specification for Mono
40、lithic integrated circuits (GS) CECC 90100: Sectional specification for Digital monolithic integrated circuit (SS) OUTLINE AND DIMENSIONS (See DS for the specific type) FAMILY DETAIL SPECIFICATION FOR TTL ADVANCED LOW POWER SCHOTTKY DIGITAL INTEGRATED CIRCUITS Series 54 ALS, 74 ALS TERMINAL CONNECTI
41、ONS (See DS for the specific type) NOTEThis family detail specification shall be completed by a DS in accordance with this specification covering one or more specific types of circuits. TYPICAL CONSTRUCTION: Silicon monolithic bipolar integrated circuits, cavity/non-cavity packages. ASSESSMENT LEVEL
42、S: P, Y, L CONTENTS 54 ALS, 74 ALS 1 LIMITING CONDITIONS OF USE FOR THE FAMILY 2 RECOMMENDED OPERATING CONDITIONS AND ASSOCIATED CHARACTERISTICS FOR THE FAMILY 3 TEST METHODS AND PROCEDURES 4 INSPECTION REQUIREMENTS Information about manufacturers who have components qualified to a detail specificat
43、ion written in accordance with this family detail specification is available in the current CECC 00200: Qualified Products List. Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 2 BSI 11-1999 1 Limiting conditions of use for th
44、e family (Not for inspection purposes) 1.1 Maximum continuous supply voltage 1.2 Maximum input voltages 1.2.1 Max. input voltage 1.2.2 Max. input voltage between multiple emitter transistor inputs VII : + 5,5 V 1.3 Minimum and maximum operating ambient temperatures 1.4 Minimum and maximum storage te
45、mperatures 2 Recommended operating conditions and associated characteristics for the family (Not for inspection purposes) (See also relevant DS) These conditions apply to the total operating temperature range, unless otherwise prescribed. 2.1 Positive supply voltage VCC : 4,5 to 5,5 V 2.2 Most negat
46、ive low level input voltage at an input current IIK = 18 mA VIKB : 1,5 V 2.3 Minimum low level input voltage VILB : 0 V 2.4 Maximum low level input voltage VILA : 0,8 V 2.5 Minimum high level input voltage VIHB : 2 V 2.6 Maximum high level input voltage VCC: 0,5 V + 7,0 V VI: 0,5 V + 7,0 V Tamb (C)
47、54 ALS74 ALS min.550 max.+ 125+ 70 Tstg: 65 C min. + 150 C max. (unless otherwise specified in the DS) VIHA: 5,5 V 7,0 V (for inputs which are not I/O Ports) Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 07 09:15:09 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190106:1994 BSI 11-19993 2.7 Loa
48、d factors 2.7.1 Unit load current 1) At low level voltage: 0,1 mA 2) At high level voltage: 20 A 2.7.2 Input load factor (fan-in) 2.7.3 Output loading capability (fan-out) 2.8 Most positive low level output voltage at an output current of 0.1 mA the higher output loading capability (unless otherwise
49、 prescribed in the DS) VOLA: 0,4 V 2.9 Most negative high level output voltage at an output current of 20 A the higher output loading capability 2.10 Most positive high level output voltage VOHA : 5,5 V 2.11 DC noise margin at low level (VILA VOLA) VNL : 0,4 V 2.12 DC noise margin at high level (VOHB VIHB) 3 Test methods and procedures 3.1 Dynamic characteristics Unless otherwise prescribed in the relevant DS, the following dynamic measurement conditions are applicable. 1) At low level input voltage (see
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