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1、BRITISH STANDARD BS EN 132100:1997 Harmonized system of quality assessment for electronic components Sectional Specification: Fixed multilayer ceramic surface mounting capacitors Assessment levels EZ and DZ The European Standard EN 132100:1996 has the status of a British Standard ICS 31.060.20 Licen
2、sed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 132100:1997 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect
3、 on 15 March 1997 BSI 12-1998 The following BSI references relate to the work on this standard: Committee reference EPL/40/1 Draft for comment 95/213007 DC ISBN 0 580 27167 6 Committees responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committe
4、e EPL/40, Capacitors and resistors for electronic equipment, to Subcommittee EPL/40/1, Capacitors and EMI suppression components for electronic equipment, upon which the following bodies were represented: FEI (Federation of the Electronics Industry) Ministry of Defence National Supervising Inspector
5、ate (BSI PC) Society of British Aerospace Companies Ltd. Amendments issued since publication Amd. No.DateComments Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 132100:1997 BSI 12-1998i Contents Page Committees responsibleInside front
6、 cover National forewordii Foreword2 Text of EN 1321003 List of referencesInside back cover Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 132100:1997 ii BSI 12-1998 National foreword This British Standard has been prepared by Subcomm
7、ittee EPL/40/1, and is the English language version of EN 132100:1996 Sectional Specification: Fixed multilayer ceramic surface mounting capacitors Assessment levels EZ and DZ, published by the Electronic Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). EN 1
8、32100 has been prepared by the Technical Committee CENELEC/TC CECC/SC 40XA (formerly WG3), Capacitors, and the United Kingdom participation in the drafting was provided by Subcommittee EPL/40/1, Capacitors and EMI suppression components for electronic equipment. A British Standard does not purport t
9、o include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references Publication referred toCorresponding British Standard EN 6006
10、2:1993 (IEC 62:1992)a BS EN 60062:1994 Marking codes for resistors and capacitors IEC 68 EN 60068-1:1994 (IEC 68-1:1988)a BS EN 60068 Environmental testing Part 1:1995 General and guidance IEC 384-10:1989aBS QC 301900:1992 Harmonized system of quality assessment for electronic components. Fixed capa
11、citors for use in electronic equipment. Sectional specification for fixed multilayer ceramic chip capacitors EN 130000:1993aBS EN 130000:1994 Harmonized system of quality assessment for electronic components. Generic specification: fixed capacitors EN 100014:1992 (CECC 00014:1988)a BS EN 100014:1992
12、 Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure (60 % confidence limit) a The text does not stipulate year of publication. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, t
13、he EN title page, pages 2 to 34, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:
14、24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 132100 August 1996 ICS 31.060.20Supersedes CECC 32 100:1988 Descriptors: Fixed capacitors, ceramic, surface mounting, multilayer, quality assessment, test and measurement, assessment levels EZ and DZ E
15、nglish version Sectional Specification: Fixed multilayer ceramic surface mounting capacitors Assessment levels EZ and DZ Rahmenspezifikation: Oberflchenmontierbare Vielschichtkeramik-Festkondensatoren Qualittsbewertungsstufen EZ und DZ This European Standard was approved by CENELEC on 1996-03-05. CE
16、NELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on
17、 application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Sec
18、retariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENEL
19、EC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 1996 Copyright reserved to CENELEC members Ref. No. EN 132100:1996 E Licensed Copy: s
20、heffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 132100:1996 BSI 12-1998 2 Foreword This European Standard was prepared by CENELEC/TC CECC/SC 40XA, Capacitors. The text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENE
21、LEC as EN 132100 on 1996-03-05. This European Standard supersedes CECC 32 100:1988. The following dates were fixed: Contents Page Foreword2 1General3 1.1Scope3 1.2Related documents 3 1.3Information to be given in a detail specification3 1.4Terminology3 1.5Marking4 2Preferred ratings and characterist
22、ics4 2.1Preferred climatic categories4 2.2Preferred values of ratings4 3Quality assessment procedures7 3.1Primary stage of manufacture7 3.2Structurally similar components7 3.3Certified test records of released lots7 3.4Qualification approval7 3.5Quality conformance inspection8 4Test and measurement
23、procedures9 4.1Special preconditioning9 4.2Preliminary drying9 4.3Measuring conditions9 4.4Mounting9 4.5Visual examination and check of dimensions9 4.6Electrical tests11 4.7Variation of capacitance with temperature 12 Page 4.8Shear test13 4.9Substrate bending test13 4.10 Resistance to soldering heat
24、13 4.11 Solderability13 4.12 Rapid change of temperature14 4.13 Climatic sequence14 4.14 Damp heat, steady state15 4.15 Endurance16 4.16 Robustness of terminations17 4.17 Component solvent resistance17 4.18 Solvent resistance of the marking17 4.19 Accelerated damp heat, steady state17 Annex A1 List
25、of tests and sampling plan for qualification approval, assessment level EZ19 Annex A2 List of tests for conformance-(lot-by-lot)-inspection, assessment level EZ20 Annex A3 List of tests for conformance-(periodic)-inspection, assessment level EZ21 Annex A4 Test schedule for qualification approval, as
26、sessment level EZ22 Annex B Capacitance ageing of fixed capacitors of ceramic dielectric class 225 Annex C1 List of tests and sampling plan for qualification approval, assessment level DZ27 Annex C2 List of tests for conformance-(lot-by-lot)-inspection, assessment level DZ28 Annex C3 List of tests f
27、or conformance-(periodic)-inspection, assessment level DZ29 Annex C4 Test schedule for qualification approval, assessment level DZ30 Annex D Destructive physical analysis (DPA)32 Figure 1 Fault: Crack or fissure10 Figure 2 Fault: Crack or fissure of more than 50 % on one side or extending from one f
28、ace to another over a corner10 Figure 310 Figure 410 Figure 511 Table 15 Table 25 Table 35 Table 46 Table 57 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1997-03-01 latest date by which the national stand
29、ards conflicting with the EN have to be withdrawn(dow) 1997-03-01 Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 132100:1996 BSI 12-19983 1 General 1.1 Scope This specification applies to fixed unencapsulated multilayer surface mounting
30、capacitors of ceramic dielectric Class 1 and Class 2 with rated voltage normally not exceeding 200 V. These capacitors generally have terminations consisting of metallized connecting pads or solderable strips and are intended to be mounted directly onto substrates for hybrid circuits or onto printed
31、 boards. The object of this specification is to prescribe preferred ratings and characteristics and to select from the general specification EN 130000 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. 1
32、.2 Related documents ISO 3, Preferred numbers Series of preferred numbers. IEC 62, Marking codes for resistors and capacitors. IEC 63 Amendment 1 (1967), Amendment 2 (1977), Preferred number series for resistors and capacitors. IEC 68, Basic environmental testing procedures. IEC 384-10, Sectional sp
33、ecification: Fixed multilayer ceramic chip capacitors. IEC 410, Sampling plans and procedures for inspection by attributes. EN 130000, Generic specification: Fixed capacitors. NOTEThe above references apply to the current editions, except for IEC 68 for which the edition referenced in the generic sp
34、ecification. 1.3 Information to be given in a detail specification Detail specifications shall be derived from the relevant blank detail specification. Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification. When more severe req
35、uirements are included, they shall be listed in 1.9 of the detail specification and indicated in the test schedules, for example by an asterisk. The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriat
36、e clause of this sectional specification. 1.3.1 Dimensions and outline drawing The detail specification shall give an illustration of the capacitor as an aid to easy recognition and for comparison of the capacitor with others. Dimensions and their associated tolerances, which affect interchangeabili
37、ty and mounting, shall be given. All dimensions shall be stated in mm. NOTEThe information given in 1.3.1 may for convenience, be presented in tabular form. Normally the numerical values shall be given for the length, the width and height of the body. When necessary, for example when a number of cas
38、e sizes are covered by a detail specification, the dimensions and their associated tolerances shall be placed in a table below the drawing. When the configuration is other than as described above, the detail specification shall state such dimensional information as will adequately describe the capac
39、itor. 1.3.2 Mounting The detail specification shall specify the method of mounting to be applied for normal use. Mounting for test and measurement purposes (when required) shall be in accordance with 4.4. 1.3.3 Ratings and characteristics The ratings and characteristics shall be in accordance with t
40、he relevant clauses of this specification, together with the following: 1.3.3.1 Rated capacitance range See 2.2.4. NOTEWhen products approved to the detail specification have different ranges, the following statement should be added: “The range of capacitance values available in each voltage range i
41、s given in CECC 00 200 (Register of Firms, Products and Services Approved under the CECC System)”. 1.3.3.2 Particular characteristics Additional characteristics may be listed, when they are considered necessary to specifiy adequately the component for design and application purposes. 1.3.4 Marking T
42、he detail specification shall specify the content of the marking on the capacitor and on the package. Deviations from 1.5 of this specification shall be specifically stated. 1.4 Terminology In addition to the applicable terms and definitions of EN 130000 the following definitions apply: 1.4.1 Surfac
43、e mounting capacitor A capacitor whose small dimensions and nature or shape of terminations make it suitable for surface mounting on hybrid circuits or printed boards. Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:15:24 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 132100:1997 4 BSI 12-1
44、998 1.4.2 Fixed capacitor of ceramic dielectric Class 1 1.4.2.1 A capacitor specially designed and suited for resonant circuit application where low losses and high stability of capacitance are essential or where a precisely defined temperature coefficient is required, for example for compensating t
45、emperature effects in the circuit. The ceramic dielectric is defined by its rated temperature coefficient (a). 1.4.2.2 For a given rated temperature coefficient the sub-class is defined by the rated tolerance on the temperature coefficient. The sub-class may be expressed in coded form (see Table 3 i
46、n 2.2.5). NOTEThe rated temperature coefficient value and its tolerance refer to the temperature interval of 20 C to 85 C but because in practice temperature coefficient curves are not strictly linear, it is necessary to define limiting capacitance deviations (for other temperatures (see Table 4 in
47、2.2.5). 1.4.3 Fixed capacitor of ceramic dielectric Class 2 1.4.3.1 A capacitor which has a dielectric with a high permittivity and is suitable for by-pass and coupling applications or for frequency discriminating circuits where low losses and high stability of capacitance are not of major importanc
48、e. The ceramic dielectric is characterized by a non-linear change of capacitance over the category temperature range (see Table 5 in 2.2.6). 1.4.3.2 The sub-class is defined by the maximum percentage change of capacitance within the category temperature range with respect to the capacitance at 20 C.
49、 The sub-class may be expressed in coded form (see Table 5 in 2.2.6). 1.4.4 Rated voltage (UR) The maximum d.c. voltage which may be applied continuously to the terminations of a capacitor at the rated temperature. NOTEThe sum of the d.c. voltage and the peak alternating voltage applied to the capacitor shall not exceed the rated voltage. The value of the a.c. voltage shall not exceed the value determined by the permissible reactive power. 1.5 Marking See 2.4 of EN 130000 with the following details: 1.5.1 The information given in the marking is normally
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