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1、BRITISH STANDARD BS EN 167000:1993 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components Generic specification: Piezoelectric filters The European Standard EN 167000:1993 with the incorporation of its amendment A1:1997 has the status of a British Standard Li
2、censed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 167000:1993 This British Standard, having been prepared under the direction of the Electronic Components Standards Policy Committee, was published under the authority of the Standards Board
3、 and comes into effect on 15 August 1993 BSI 04-1999 The following BSI references relate to the work on this standard: Committee reference ECL/11 Draft for comment 91/26962 DC ISBN 0 580 22218 7 Cooperating organizations The European Committee for Electrotechnical Standardization (CENELEC), under wh
4、ose supervision this European Standard was prepared, comprises the national committees of the following countries: AustriaItaly BelgiumLuxembourg DenmarkNetherlands FinlandNorway FrancePortugal GermanySpain GreeceSweden IcelandSwitzerland IrelandUnited Kingdom Amendments issued since publication Amd
5、. No.DateComments 9908March 1998Indicated by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 167000:1993 BSI 04-1999i Contents Page Cooperating organizationsInside front cover National forewordii Foreword2 Text
6、 of EN 1670005 National annex NA (informative) Committees responsible24 National annex NB (informative) Cross-referencesInside back cover Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 167000:1993 ii BSI 04-1999 National foreword This
7、 British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee. It is identical with EN 167000:1993 Generic specification: Piezoelectric filters and its amendment A.1, published by the Electronic Components Committee (CECC) of the European Committee f
8、or Electrotechnical Standardization (CENELEC). A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligat
9、ions. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 24, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the am
10、endment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 167000 May 1993 + A1 September 1997 Descriptors: Quality, electronic components, piezoelectric filt
11、ers English version Generic specification: Piezoelectric filters (includes amendment A1:1997) Spcification gnrique: Filtres pizolectriques (inclut lamendement A1:1997) Fachgrundspezifikation: Piezoelektrische Filter (enthlt nderung A1:1997) This European Standard was approved by the CENELEC Electron
12、ic Components Committee(CECC) on 1992-05-16. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concer
13、ning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC m
14、ember into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway
15、, Portugal, Spain, Sweden, Switzerland and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC CENELEC Electronic Components Committee Comit des Composants Electroniques du CENELEC CENELEC-Kom
16、itee fr Bauelemente der Elektronik Central Secretariat: rue de Stassart 35, B-1050 Brussels 1993 Copyright reserved to CENELEC members Ref. No. EN 167000:1993 + A1:1997 E Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 167000:1993 BSI 04-
17、1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized system for electronic components of assessed quality. The object of the System is to
18、 facilitate international trade by the harmonization of the specifications and quality assessement procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all membe
19、r countries without further testing. This European Standard was prepared by CECC WG 17, Piezoelectric devices for frequency control and selection. It is based, wherever possible, on the publications of the International Electrotechnical Commission (IEC). The text of the draft based on document CECC
20、(Secretariat) 2896 was submitted to the formal vote; together with the voting report, circulated as document CECC (Secretariat) 3106 it was approved by CECC as EN 167000 on 16 May 1992. The following dates were fixed: Foreword to amendment A.1 This amendment was prepared by CLC/TC CECC/SC 49. The te
21、xt of the draft was submitted to the formal vote and was approved by CENELEC as amendment A1 to EN 167000:1993 on 1997-03-11. The following dates were fixed: latest date of announcement of the EN at national level(dop) 1993-06-17 latest date of publication of an identical national standard(dop) 1993
22、-12-17 latest date of declaration of national standards obsolescence1993-12-17 latest date of withdrawal of conflicting national standards(dow) 2003-06-17 latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement(dop
23、) 1998-03-01 latest date by which the national standards conflicting with the amendment have to be withdrawn(dow)1998-03-01 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 167000:1993 BSI 04-19993 Contents Page Foreword2 Section 1. Scope5
24、 Section 2. General5 2.1Order of precedence5 2.2Related documents5 2.3Units, symbols and terminology6 2.4Preferred ratings and characteristics9 2.5Marking10 Section 3. Quality assessment procedures 3.1Primary stage of manufacture11 3.2Structurally similar components11 3.3Subcontracting11 3.4Incorpor
25、ated components11 3.5Manufacturers approval11 3.6Approval procedures11 3.7Procedures for capability approval12 3.8Procedures for qualification approval12 3.9Test procedures13 3.10Screening requirements13 3.11Rework and repair work13 3.12Certified test records13 3.13Validity of release13 3.14Release
26、for delivery13 3.15Unchecked parameters13 Section 4. Test and measurement procedures 4.1General13 4.2Test and measurement conditions13 4.2.1Standard conditions for testing13 4.2.2Uncertainty of measurement14 4.2.3Precautions14 4.2.4Alternative test methods14 4.3Visual inspection14 4.4Dimensioning an
27、d gauging procedures14 4.5Electrical test procedures15 4.5.1General15 4.5.2Insertion attenuation15 4.5.3Insertion attenuation as a function of temperature16 4.5.4Insertion phase shift16 4.5.5Insertion phase shift as a function of temperature16 4.5.6Envelope delay time17 4.5.7Envelope delay time as a
28、 function of temperature17 Page 4.5.8 Return attenuation17 4.5.9Return attenuation as a function of temperature18 4.5.10 Intermodulation distortion18 4.6Mechanical and environmental test procedures19 4.6.1Robustness of terminations19 4.6.2Sealing tests20 4.6.3Soldering (Solderability and resistance
29、to solder heat)20 4.6.4Rapid change of temperature : severe shock by liquid immersion21 4.6.5Rapid change of temperature : with prescribed time of transition21 4.6.6Bump21 4.6.7Vibration21 4.6.8Shock22 4.6.9Free fall22 4.6.10 Acceleration, steady state22 4.6.11 Low air pressure22 4.6.12 Dry heat22 4
30、.6.13 Damp heat, cyclic22 4.6.14 Cold22 4.6.15 Climatic sequence22 4.6.16 Damp heat, steady state22 4.6.17 Salt mist, cyclic23 4.6.18 Immersion in cleaning solvents23 4.6.19 Radiation hardness23 4.6.20 Flammability test23 4.7Endurance test procedure23 4.7.1Ageing23 Figure 1 Test circuit for insertio
31、n attenuation, phase and group delay measurement16 Figure 2 Test circuit for return attenuation measurement18 Figure 3 Test circuit for intermodulation distortion measurement19 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 4 blank Licensed
32、 Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 167000:1993 BSI 04-19995 Section 1. Scope This document specifies the methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or quali
33、fication approval procedures. Section 2. General 2.1 Order of precedence Where any discrepancies occur for any reason, documents shall rank in the following order of precedence: the detail specification the sectional specification the generic specification the FEN internal regulations any other inte
34、rnational documents (for example, of the IEC) to which reference is made. The same order of precedence shall apply to equivalent national documents. 2.2 Related documents ISO 1000:1973, SI units and recommendations for use of their multiples and of certain other units. IEC 27-1:1971, Letter symbols
35、to be used in electrical technology Part 1: General. IEC 27-2:1972, Letter symbols to be used in electrical technology Part 2: Telecommunications and electronics. IEC 50, International Electrotechnical Vocabulary. IEC 50(561), International Electrotechnical Vocabulary Chapter 561: Piezoelectric devi
36、ces for frequency control and selection. IEC 68, Basic environmental testing procedures. IEC 68-1:1988, Part 1: General and guidance. IEC 68-2, Part 2: Tests. IEC 68-2-1:1990, Test A: Cold. IEC 68-2-2:1974, Test B: Dry heat. IEC 68-2-2:1976, Supplement A. IEC 68-2-3:1969, Test Ca: Damp heat, steady
37、state. IEC 68-2-3:1984, Amendment No. 1. IEC 68-2-6:1982, Test Fc and guidance: Vibration (sinusoidal). IEC 68-2-6:1983, Amendment No. 1. IEC 68-2-6:1985, Amendment No. 2. IEC 68-2-7:1983, Test Ga: Acceleration, steady state. IEC 68-2-7:1986, Amendment No. 1. IEC 68-2-10:1988, Test J: Mould growth.
38、IEC 68-2-13:1983, Test M: Low air pressure. IEC 68-2-14:1984, Test N: Change of temperature. IEC 68-2-14:1986, Amendment No. 1. IEC 68-2-17:1978, Test Q: Sealing. IEC 68-2-17:1989, Amendment No. 3. IEC 68-2-20:1979, Test T: Soldering. IEC 68-2-20:1986, Amendment No. 1. IEC 68-2-20:1987, Amendment No
39、. 2. IEC 68-2-21:1983, Test U: Robustness of terminations. IEC 68-2-21:1985, Amendment No. 1. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 167000:1993 6 BSI 04-1999 IEC 68-2-27:1987, Test Ea: Shock. IEC 68-2-29:1987, Test Eb: Bump. IEC
40、 68-2-30:1980, Test Db: Damp heat, cyclic. IEC 68-2-30:1985, Amendment No. 1. IEC 68-2-32:1975, Test Ed: Free fall. IEC 68-2-32:1990, Amendment No. 2. IEC 68-2-36:1973, Test Fdb: Random vibration wide band reproducibility medium. IEC 68-2-36:1983, Amendment No. 1. IEC 68-2-45:1980, Test XA: Immersio
41、n in cleaning solvents. IEC 68-2-52:1984, Test Kb: Salt mist, cyclic. IEC 410:1973, Sampling plans and procedures for inspection by attributes. IEC 617, Graphical symbols for diagrams. IEC 368-1, Piezoelectric filters Part 1: General information, standard values and test conditions. (IEC 49 (C.O.) 2
42、07) IEC 642:1979, Piezoelectric ceramic resonators and resonator units for frequency control and selection. IEC 801-2:1984, Electromagnetic compatibility for industrial-process measurement and control equipment Part 2: Electrostatic discharge requirements. IEC 801-2:1991, FEN internal regulations Is
43、sue 2. CECC 00 114/I Issue I:1990, Quality assessment procedures Part I: Approval of manufacturers and other organizations. CECC 00 114/II Issue I:1991, Quality assessment procedures Part II: Qualification approval of electronic components. CECC 00 114/III Issue I:1989, Quality assessment procedures
44、 Part III: Capability approval of an electronic component manufacturing activity. CECC 00 109:1974, Certified test records. CECC 00 111:1991, Specifications. CECC 00 802:1990, CECC Standard method for specification of surface mounting components (SMDs) of assessed quality. EN 168 000:1993 (CECC 68 0
45、00, 1989), Generic specification: Quartz crystal units. 2.3 Units, symbols and terminology 2.3.1 General Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the following documents: ISO 1 000, SI units and recommendations for the use of multiples and of c
46、ertain other units. IEC 27, Letter symbols to be used in electrical technology. IEC 50, International Electrotechnical Vocabulary. IEC 50:561, International Electrotechnical Vocabulary Chapter 561: Piezoelectric devices for frequency control and selection. IEC 368-1, Piezoelectric filters Part 1: Ge
47、neral information, standard values and test conditions. IEC 642, Piezoelectric ceramic resonators and resonator units for frequency control and selection. EN 168 000:1993 (CECC 68 000, 1989), Generic specification: Quartz crystal units. The following paragraphs contain additional terminology applica
48、ble to piezoelectric filters and the latest IEV 561 definitions. 2.3.2 Piezoelectric filter (561-03-01) An electrical filter in which one or more piezoelectric vibrators are incorporated. 2.3.3 Band-pass filter (561-03-33) A filter having a single pass band between two specified stop bands. Licensed
49、 Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:10 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 167000:1993 BSI 04-19997 2.3.4 Band-stop filter (561-03-34) A filter having a single stop band between two specified pass bands. 2.3.5 High-pass filter (561-03-32) A filter having a single pass band above a cut-off frequency and a stop band for lower frequencies. 2.3.6 Low-pass filter (561-03-31) A filter having a single pass band below a cut-off frequency and a stop band for higher frequencies. 2.3.7 Comb filt
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