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1、BRITISH STANDARD BS EN 190108:1994 Incorporating Amendment Nos. 1 and 2 Specification for Harmonized system of quality assessment for electronic components Family specification TTL advanced SCHOTTKY digital integrated circuits Series 54 AS, 74 AS The European Standard EN 190108 has the status of a B
2、ritish Standard Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190108:1994 BSI 04-2000 ISBN 0 580 35808 9 Amendments issued since publication Amd. No.Date of issueComments 8120February 1994 8374September 1994 Indicated by a sideline i
3、n the margin Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190108:1994 BSI 04-2000i Contents Page National forewordii Foreword2 Forewordiii Text of CECC 1901081 Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:0
4、0 2006, Uncontrolled Copy, (c) BSI BS EN 190108:1994 ii BSI 04-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 90108:1987 “Harmonized system of qua
5、lity assessment for electronic components. Family specification: TTL advanced SCHOTTKY digital integrated circuits”. In 1994 the CENELEC Electronic Components Committee (CECC) accepted CECC 90108:1987 with Amendment 1 as European Standard EN 190108:1994. This standard is a harmonized specification w
6、ithin the CECC System. This standard supersedes BS CECC 90108:1986 which is withdrawn. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical wit
7、h those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC 00100 is
8、 BS 9000: “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the provisions of IEC 747, IEC 748 and IEC 749, to which reference is m
9、ade in the text, and has decided that they are acceptable for use in conjunction with this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for
10、these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specification will be in accordance with BS 9000 Circular Letter No. 15. International StandardsaCorresponding British Standards IEC 68-2-30:1980BS 2011 Basic environ
11、mental testing procedures Part 2.1 Db:1981 Test Db and guidance: Damp heat, cyclic (12 + 12 hour cycle) (Identical) CECC 90000:1985BS CECC 90000:1985 Harmonized system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits (Identical) CECC 90100:1986BS
12、 CECC 90100:1986 Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical) a Undated in text. Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 190108:1
13、994 BSI 04-2000iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This
14、document comprises a front cover, an inside front cover, pages i to iv, the EN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 6 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment
15、 table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCH
16、E NORM EN 190108 May 1994 UDCSupersedes CECC 90108 Issue 2:1987 Descriptors: Quality, electronic components, TTL advanced Schottky digital integrated circuits English version Family Specification: TTL Advanced Schottky Digital Integrated Circuits Series 54AS, 74AS Spcification de famille: Circuits i
17、ntgrs logiques TTL Schottky avance Sries 54AS, 74AS Familienspezifikation: Digitale integrierte TTL Advanced Schottky-Schaltungen Serien 54AS, 74AS This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 8 May 1994. CENELEC members are bound to comply with CEN/CE
18、NELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CE
19、CC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as
20、the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identi
21、cal, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35
22、, B-1050 Brussels 1994 Copyright reserved to CENELEC members Ref. No. EN 190108:1994 E Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 BSI 04-2000 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of th
23、ose member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quali
24、ty assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 9
25、, “Integrated Circuits”. The text of the draft based on document CECC 90108 Issue 2:1987 (with A1) was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3544 it was approved by CECC as EN 190108 on 8 May 1994.
26、 The following dates were fixed: latest date of announcement of the EN at national level(doa) 1994-09-01 latest date of publication of an identical national standarda(dop) 1995-03-01 latest date of withdrawal of conflicting national standardsa(dow) 1996-03-01 a National Standard (excluding National
27、implementation of IECQ Specifications) Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 ii BSI 04-2000 Contents Page For
28、ewordiii 1Limiting conditions of use for the family1 2Recommended operating conditions and associated characteristics for the family1 3Test methods and procedures2 4Inspection requirements6 Figure 1 Diagram for switching parameters3 Figure 2 Signal waveform at the input of the component under test3
29、Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 BSI 04-2000iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (C
30、ENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internation
31、ally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish
32、to issue national harmonized specifications for TTL ADVANCED SCHOTTKY DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction with the current regulation for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland,
33、France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Preface This Family Detail Specification was prepared by CECC WG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical C
34、ommission and in particular on IEC 747: Semiconductor devices: Discrete devices and integrated circuits, IEC 748: Semiconductor devices: Integrated circuits, IEC 749: Semiconductor devices: Mechanical and climatic test methods. It contains general information on TTL Advanced Schottky digital integra
35、ted circuits and defines the common characteristics for this family of integrated circuits. Together with the device type detail specification (DS) of a component usually prepared nationally, this family detail specification forms a complete detail specification. The text of this second issue consis
36、ts of the text of CECC 90108 Issue 1 (1985) amended in accordance with the ratified new material introduced by the following document. In accordance with the decision of the CECC Management Committee this specification is published initially in French and English. The German text will follow as soon
37、 as it has been prepared. Effective date This second Issue of CECC 90108 shall become effective for all new qualification approvals on 1 April 1987. Issue 1 will continue to remain effective to cover all past approvals. DocumentDate of VotingReport on the Voting CECC(Secretariat)1970October 1986CECC
38、(Secretariat)2014 Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 iv BSI 04-2000 Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 BSI 04-20001 1 Limiting
39、 conditions of use for the family (Not for inspection purposes) 1.1 Maximum continuous supply voltage 1.2 Maximum input voltage 1.2.1 Max. input voltage 1.2.2 Max. input voltage between multiple emitter transistor inputs VII: + 5,5 V 1.3 Minimum and maximum operating ambient temperatures 1.4 Minimum
40、 and maximum storage temperatures 2 Recommended operating conditions and associated characteristics for the family (Not for inspection purposes) (See also relevant DS) These conditions apply to the total operating temperature range, unless otherwise prescribed. 2.1 Positive supply voltage VCC: 4,5 t
41、o 5,5 V 2.2 Most negative low level input voltage at an input current IIK = 18 mA VIKB: 1,2 V 2.3 Minimum low level input voltage VILB: 0 V 2.4 Maximum low level input voltage VILA: 0,8 V 2.5 Minimum high level input voltage VIHB: 2 V 2.6 Maximum high level input voltage 2.7 Load factors 2.7.1 Unit
42、load current 1) At low level voltage: 0,5 mA 2) At high level voltage: 20 A VCC: 0,5 V + 7,0 V VI: 0,5 V + 7,0 V Tamb (C) 54 AS74 AS min.550 max.+ 125+ 70 Tstg: 65 C min. (unless otherwise specified in the DS) + 150 C max. VIHA: 5,5 V 7,0 V (for inputs which are not I/O Ports) Licensed Copy: sheffie
43、ldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 2 BSI 04-2000 2.7.2 Input load factor (fan-in) 2.7.3 Output loading capability (fan-out) 2.8 Most positive low level output voltage at an output current of 0,5 mA the higher output loading capability
44、(unless otherwise prescribed in the DS) VOLA: 0,5 V 2.9 Most negative high level output voltage at an output current of 20 A the higher output loading capability 2.10 Most positive high level output voltage VOHA: 5,5 V 2.11 DC noise margin at low level (VILA VOLA) VNL: 0,3 V 2.12 DC noise margin at
45、high level (VOHB VIHB) 3 Test methods and procedures 3.1 Dynamic characteristics Unless otherwise prescribed in the relevant DS, the following dynamic measurement conditions are applicable. 3.1.1 General diagram Measurements of dynamic characteristics are performed in accordance with the general dia
46、gram of Figure 1. 1) At low level input voltage (see DS for the relevant input) 2) At high level input voltage 1) At low level output voltage (see DS for the relevant output) 2) At high level output voltage VOHB: 2,5 V (standard outputs) 2,4 V (buffer outputs) 2V (bus driver outputs) VNH: 0,5 V (sta
47、ndard outputs) 0,4 V (buffer outputs) 0V (bus driver outputs) Licensed Copy: sheffieldun sheffieldun, na, Sun Oct 29 10:24:56 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 190108:1994 BSI 04-20003 NOTE 1The inductances of the connections and of the components used, and the impedance of the continuou
48、s sources shall be so low as to make the error negligible. NOTE 2One or more pulse generators can be used according to the measurement to be performed. 3.1.2 Pulse generator and driving circuit The following conditions shall be met: output impedance of pulse generator: 50 7 10 % impedance of the dri
49、ving circuit cable from the generator, including the test equipment: 50 7 10 % Signal applied to the inputs of the component under test (see Figure 2). Low level input voltage: 0,3 V 0,1 V High level input voltage: 3,5 V 0,2 V Rise time of the input signal: tr = 2 ns 0,2 ns (measured from 10 % to 90 % of the step amplitude) Fall time of the input signal: tf = 2 ns 0,2 ns (measured from 90 % to 10 % of the step amplitude) Pulse width: tW = 0,5 s Pulse repetition frequency: u 1MHz Fig
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