BS-EN-60747-16-1-2002.pdf
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1、BRITISH STANDARD BS EN 60747-16-1: 2002 Semiconductor devices Part 16-1: Microwave integrated circuits Amplifiers The European Standard EN 60747-16-1:2002 has the status of a British Standard ICS 31.080.99; 31.200 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW Licensed Copy:
2、sheffieldun sheffieldun, na, Fri Nov 10 16:57:46 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 60747-16-1:2002 This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy an
3、d Strategy Committee on 18 March 2002 BSI 18 March 2002 ISBN 0 580 39237 6 National foreword This British Standard is the official English language version of EN 60747-16-1:2002. It is identical with IEC 60747-16-1:2001. The UK participation in its preparation was entrusted to Technical Committee EP
4、L/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1
5、. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international pub
6、lications with their corresponding European publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the B
7、SI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid en
8、quirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This d
9、ocument comprises a front cover, an inside front cover, the EN title page, pages 2 to 45 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun,
10、na, Fri Nov 10 16:57:46 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARDEN 60747-16-1 NORME EUROPENNE EUROPISCHE NORMFebruary 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Norm
11、ung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60747-16-1:2002 E ICS 31.080.99 English version Semiconductor devices Part 16-1: Microwave integrated circuits - Am
12、plifiers (IEC 60747-16-1:2001) Dispositifs semiconducteurs Partie 16-1: Circuits intgrs hyperfrquences - Amplificateurs (CEI 60747-16-1:2001) Halbleiterbauelemente Teil 16-1: Integrierte Mikrowellen- Verstrker (IEC 60747-16-1:2001) This European Standard was approved by CENELEC on 2002-02-01. CENELE
13、C members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on app
14、lication to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secreta
15、riat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and Un
16、ited Kingdom. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 16:57:46 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Foreword The text of document 47E/200/FDIS, future edition 1 of IEC 60747-16-1, prepared by SC 47E, Discrete semiconductor devices, of IEC TC 47, Semiconductor devices, was submit
17、ted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60747-16-1 on 2002-02-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement(dop)2002-11-01 latest date by which
18、the national standards conflicting with the EN have to be withdrawn(dow)2005-02-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. _ Endorsement notice The text of the International Standard IEC 60747-16-1:2001 was approved by CENELEC as
19、a European Standard without any modification. _ Page 2 EN 60747161:2002 BSI 18 March 2002 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 16:57:46 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CONTENTS 1Scope 5 2Normative references. 5 3Terminology. 5 4Essential ratings and characteristics 7 4.1
20、General 7 4.2Application related description 8 4.3Specification of the function 9 4.4Limiting values (absolute maximum rating system) 10 4.5Operating conditions (within the specified operating temperature range)12 4.6Electrical characteristics12 4.7Mechanical and environmental ratings, characteristi
21、cs and data 14 4.8Additional information14 5Measuring methods 14 5.1General .14 5.2Linear (power) gain (Glin).15 5.3Linear (power) gain flatness (?Glin)17 5.4Power gain (Gp).18 5.5(Power) gain flatness (?Gp) .18 5.6(Maximum available) gain reduction (?Gred).19 5.7Limiting output power (Po(ltg) 20 5.
22、8Output power (Po)21 5.9Output power at 1 dB gain compression (Po(1dB).22 5.10 Noise figure (F)23 5.11 Intermodulation distortion (Pn/P1) (two-tone)25 5.12 Power at the intercept point (for intermodulation products) (Pn(IP).27 5.13 Magnitude of the input reflection coefficient (input return loss) (?
23、s11?).28 5.14 Magnitude of the output reflection coefficient (output return loss) (?s22?) 29 5.15 Magnitude of the reverse transmission coefficient (isolation) (?s12?) .33 5.16 Conversion coefficient of amplitude modulation to phase modulation (?(AM-PM) 34 5.17 Group delay time (td(grp) .36 5.18 Pow
24、er added efficiency37 5.19 nth order harmonic distortion ratio (Pnth/P1) .39 5.20 Output noise power (PN ) .40 5.21 Spurious intensity under specified load VSWR (Psp/Po)42 Annex ZA (normative) Normative references to international publications with their corresponding European publications45 Page 3
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