BS-QC-760201-1997 IEC-60748-22-1-1997.pdf
《BS-QC-760201-1997 IEC-60748-22-1-1997.pdf》由会员分享,可在线阅读,更多相关《BS-QC-760201-1997 IEC-60748-22-1-1997.pdf(20页珍藏版)》请在三一文库上搜索。
1、BRITISH STANDARD BS QC 760201:1997 IEC 60748-22-1: 1997 Harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval proc
2、edures ICS 31.200 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 760201:1997 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the
3、authority of the Standards Board and comes into effect on 15 August 1997 BSI 09-1999 ISBN 0 580 28006 3 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI B
4、S QC 760201:1997 BSI 09-1999i Contents Page National forewordii Text of CEI IEC 60748-22-11 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 760201:1997 ii BSI 09-1999 National foreword This British Standa
5、rd reproduces verbatim IEC 60748-22-1:1997 and implements it as the UK national standard. It supersedes BS QC 760201:1992 which is withdrawn. This standard is a harmonized specification within the IEC system of quality assessment for electronic components (IECQ). The UK participation in its preparat
6、ion was entrusted to Technical Committee EPL/47, Semiconductors, to Subcommittee EPL/47/1, Film and hybrid integrated circuits, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or p
7、roposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this subcommittee can be obtained on request to its secretary. The standard is to be used in conjunction with BS QC 7
8、60000 and BS QC 760200. The British Standard which implements the IECQ Rules of Procedure is BS 9000 General Requirements for a system for electronic components of assessed quality Part 3:1996 Specification for the national implementation of the IECQ system. From 1 January 1997, all IEC publications
9、 have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implemen
10、t international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport
11、to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover
12、, pages i and ii, the CEI IEC title page, page ii, pages 1 to 12 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, Londo
13、n South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 760201:1997 ii BSI 09-1999 Contents Page Introduction1 1Characterist
14、ics and conditions of use4 2Recommended methods of mounting4 3Marking4 4Ordering information4 5Certified records of released lots4 6Additional information4 7Additional or increased severities or requirements to those specified in the generic and/or sectional specification5 8Inspection requirements (
15、see Table 2 and Table 3 or Table 4 and Table 5)5 9Supplement Tables of method B9 Table 1 Where a range of circuits3 Table 2 Method A Groups A and B Lot-by-lot6 Table 3a Method A Group C Periodic tests7 Table 3b Method A Group D Periodic tests8 Table 4a Method B Group A Lot-by-lot9 Table 4b Method B
16、Group B Lot-by-lot10 Table 5a Method B Group C Periodic tests11 Table 5b Method B Group D Periodic tests12 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 760201:1997 BSI 09-19991 Introduction The IEC Qua
17、lity Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as confor
18、ming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. In the preparation of detail specifications, the content of 3.6 of the generic specification and 2.3 and 3.3 of the sectional specification is t
19、aken into account. The blank detail specification is one of a series of blank detail specifications for semiconductor devices and is used with the following publications: IEC 60748-20/QC 760000:1988, Semiconductor devices Integrated circuits Part 20: Generic specification for film integrated circuit
20、s and hybrid film integrated circuits. IEC 60748-20-1/QC 763000:1994, Semiconductor devices Integrated circuits Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits Section 1: Requirements for internal visual examination. IEC 60748-22/QC 760200:1997, Semico
21、nductor devices Integrated circuits Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures. a) For catalogue circuits, the detail specifications are published, and their format and minimum content shall con
22、form with Table 2 Table 4. b) For custom circuits, the detail specifications are not published, and their format and content are optional. However, the customers requirements in relation to form, fit and function are to be verified, either by the routine tests in maintenance of capability approval,
23、or as specified in the detail specification, or by both in combination. c) For CQCs, the detail specifications are not published; their format and content are to be conform with Table 2 Table 4. When a circuit is sold uncompleted for completion by another party, the completed product does not qualif
24、y for release under the IEC system unless all processes are carried out by one or more approved manufacturers. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 760201:1997 2 BSI 09-1999 Required informatio
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- BS-QC-760201-1997 IEC-60748-22-1-1997 BS QC 760201 1997 IEC 60748 22
链接地址:https://www.31doc.com/p-3744675.html