BS-EN-61967-6-2002.pdf
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1、BRITISH STANDARD BS EN 61967-6:2002 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 6: Measurement of conducted emissions Magnetic probe method The European Standard EN 61967-6:2002 has the status of a British Standard ICS 31.200 ? Licensed Copy: sheffieldun sheff
2、ieldun, na, Sat Nov 11 07:17:45 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 61967-6:2002 This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee
3、 on 24 October 2002 BSI 24 October 2002 ISBN 0 580 40603 2 National foreword This British Standard is the official English language version of EN 61967-6:2002. It is identical with IEC 61967-6:2002. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors,
4、which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the s
5、ection entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application
6、. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor
7、related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 26, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the
8、document was last issued. Amendments issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 11 07:17:45 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARDEN 61967-6 NORME EUROPENNE EUROPISCHE NORMOctober 2002 CENELEC European Committee for Electr
9、otechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No
10、. EN 61967-6:2002 E ICS 31.200 English version Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002) Circuits intgrs - Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 6: Mesure
11、 des missions conduites - Mthode de la sonde magntique (CEI 61967-6:2002) Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz Teil 6: Messung der leitungsgefhrten Aussendungen - Magnetsondenverfahren (IEC 61967-6:2002) This European Standar
12、d was approved by CENELEC on 2002-09-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning
13、 such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its o
14、wn language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherla
15、nds, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 11 07:17:45 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Foreword The text of document 47A/645/FDIS, future edition 1 of IEC 61967-6, prepared by SC 47A, Integrated circu
16、its, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61967-6 on 2002-09-01. This European Standard should be read in conjunction with EN 61967-1:2002. The following dates were fixed: latest date by which the EN has to be implement
17、ed at national level by publication of an identical national standard or by endorsement(dop)2003-06-01 latest date by which the national standards conflicting with the EN have to be withdrawn(dow)2005-09-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “info
18、rmative“ are given for information only. In this standard, annexes A and ZA are normative and annexes B, C and D are informative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61967-6:2002 was approved by CENELEC as a European Standard without an
19、y modification. _ Page 2 EN 619676:2002 Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 11 07:17:45 GMT+00:00 2006, Uncontrolled Copy, (c) BSI CONTENTS 1Scope 5 2Normative references 5 3Definitions .5 4General 5 4.1 Measurement philosophy.5 4.2 Measurement principle.6 5Test conditions.6 5.1 Gene
20、ral 6 5.2 Frequency range .6 6Test equipment .6 6.1 General 6 6.2 Magnetic probe.6 6.3 Probe spacing fixture and placement 6 7Test set-up 9 7.1 General 9 7.2 Probe calibration .9 7.3 Modifications to standardized IC test board.9 7.3.1Layer arrangement9 7.3.2Layer thickness .9 7.3.3Decoupling capacit
21、ors 9 7.3.4I/O pin loading .10 8Test procedure 14 8.1 General 14 8.2 Test technique .14 9Test report .14 9.1 General 14 9.2 Documentation 14 Annex A (normative)Probe calibration procedure Microstrip line method 16 Annex B (informative) Measurement principle and calibration factor .19 Annex C (inform
22、ative) Spatial resolution of magnetic probe.23 Annex D (informative) Angle pattern of probe placement .24 Annex ZA (normative) Normative references to international publications with their corresponding European publications.25 Bibliography 26 Page 3 EN 619676:2002 Licensed Copy: sheffieldun sheffie
23、ldun, na, Sat Nov 11 07:17:45 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Figure 1 Magnetic probe 7 Figure 2 Magnetic probe 1st and 3rd layers .7 Figure 3 Magnetic probe 2nd layer 8 Figure 4 Magnetic probe layer construction 8 Figure 5 Standardized IC test board (sectional view 1) .10 Figure 6 Standa
24、rdized IC test board (sectional view 2 measurement line) 10 Figure 7 Power line pattern on the standardized IC test board Bottom layer .11 Figure 8 I/O signal line pattern on the standardized IC test board Bottom layer 12 Figure 9 Multi-power lines on the standardized IC test board Bottom layer .12
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