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1、BRITISH STANDARD BS ISO 15368:2001 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements ICS 17.180.01; 37.020 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW Licensed Copy: sheffieldun sheffieldun, na, Sun Nov
2、 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS ISO 15368:2001 This British Standard, having been prepared under the direction of the Consumer Products and Services Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee and c
3、omes into effect on 26 September 2001 BSI 26 September-2001 ISBN 0 580 38490 X National foreword This British Standard reproduces verbatim ISO 15368:2001 and implements it as the UK national standard. The UK participation in its preparation was entrusted to Technical Committee CPW/172, Optics and op
4、tical instruments, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI St
5、andards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsibl
6、e for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the
7、UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the ISO title page, pages ii to v, a blank page, pages 1 to 13 and a back cover. The BSI copyright date display
8、ed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI INTERNATIONAL STANDARD ISO 15368 First edition 2001-08-01 Reference nu
9、mber ISO 15368:2001(E) OSI 2001 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements Optique et instruments doptique Mthode de mesurage de la rflectance des surfaces planes et de la transmittance des lments plan parallle Licensed Co
10、py: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) ii Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) ISO 1002 All rithgs rreseved iii ContentsPage 1Scope .1 2N
11、ormative references .1 3Terms and definitions 2 4Symbols and units 2 5Test specimen .2 6Measuring apparatus 3 7Test conditions 4 8Test procedure 5 9Main error factors .7 10Test report 9 Annexes ASpectrophotometers10 A.1General .10 A.2Dispersion type spectrophotometer 10 A.3Fourier-transform type spe
12、ctrometer .11 BRefractive index of synthetic fused silica 12 Bibliography.13 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) iv ISO 1002 All rithgs rreseved Foreword ISO (the International Organization for Standardization)
13、is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be repres
14、ented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are
15、drafted in accordance with the rules given in the ISO/IEC Directives, Part 3. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a v
16、ote. Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. International Standard ISO 15368 was prepared by Technical Committee ISO/TC 172,Op
17、tics and optical instruments, Subcommittee SC 1,Fundamental standards. Annexes A and B of this International Standard are for information only. Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) ISO 1002 All rithgs rreseved v
18、Introduction Measurements of reflectance and transmittance using spectrophotometers are the most fundamental methods for the characterization of optical components. Since the spectrophotometric methods are basic and normal, they are extensively used and further give measurement data for a wide range
19、 of wavelengths. This International Standard describes the measurement of reflectance and transmittance using spectrophotometers which provides data with high reproducibility and repeatability. Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI
20、 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI INTERNATIONAL STANDARDISO 15368:2001(E) ISO 1002 All rithgs rreseved 1 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
21、1Scope This International Standard gives rules for the measurement of the spectral reflectance of plane surfaces and spectral transmittance of plane parallel elements using spectrophotometers over the spectral rangeto . The transmittanceand the reflectanceof optical components are generally divided
22、into two parts as follows: (1) (2) where is the regular transmittance; is the diffuse transmittance; is the regular reflectance; is the diffuse reflectance. This International Standard applies only to measurements of the regular transmittance and the regular reflectance; it does not apply to those o
23、f the diffuse transmittance and the diffuse reflectance. This International Standard is applicable to test specimens which are coated or uncoated optical components without optical power. 2Normative references The following normative documents contain provisions which, through reference in this text
24、, constitute provisions of this International Standard. For dated references, subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most rece
25、nt editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of ISO and IEC maintain registers of currently valid International Standards. IEC 60050-845:1987,International Electrotechnical Vocabulary Chapter
26、 845: Lighting ISO 31-6:1992,Quantities and units Part 6: Light and related electromagnetic radiations ISO 9211-1:1994,Optics and optical instruments Optical coatings Part 1: Definitions ISO 9211-2:1994,Optics and optical instruments Optical coatings Part 2: Optical properties ISO 10110-8:1997,Optic
27、s and optical instruments Preparation of drawings for optical elements and systems Part 8: Surface texture 190 nm 25m = r+ d = r+ d r d r d Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) 2 ISO 1002 All rithgs rreseved 3Ter
28、ms and definitions For the purposes of this International Standard, the terms and definitions given in ISO 31-6, ISO 9211-1 and the following (which are given in IEC 60050-845) apply. 3.1 transmittance ?for incident radiation of given spectral composition, polarization and geometrical distribution?
29、ratio of the transmitted radiant or luminous flux to the incident flux in the given conditions 3.2 regular transmittance ratio of the regularly transmitted part of the whole transmitted flux to the incident flux 3.3 internal transmittance ratio of the radiation flux reaching the internal exit surfac
30、e of the layer to the flux that enters into the layer after crossing the entry surface 3.4 reflectance ?for incident radiation of given spectral composition, polarization and geometrical distribution? ratio of the reflected radiant or luminous flux to the incident flux in the given conditions 3.5 re
31、gular reflectance specular reflectance ratio of the regularly reflected part of the whole reflected flux to the incident flux 4Symbols and units For the purposes of this International Standard, the following symbols and units apply. wavelength, expressed in nanometres angle of incidence, expressed i
32、n degrees p, sstate of polarization transmittance regular transmittance internal transmittance reflectance regular reflectance 5Test specimen Storage, cleaning and preparation of a test specimen shall be carried out in accordance with the instructions of the manufacturer on the test specimen for nor
33、mal use. Wavelength, angle of incidence and state of polarization shall correspond to those specified by the manufacturer for the use of the test specimen. i r i r Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) ISO 1002 Al
34、l rithgs rreseved 3 6Measuring apparatus For the measurement specified in this International Standard, a spectrophotometer is required. Figure 1 shows an example of a double beam, dispersion type spectrophotometer. It consists of a light source, a monochromator, a specimen compartment, a detector un
35、it and a control unit. Details of the apparatus are described in annex A. Key LLight source FFilter box SSlit DDispersive element MMonochromator SCSpecimen compartment COCollecting optics BBaffle PFPolarization filter CMChopper mirror TTest beam RReference beam DUDetector unit CUControl unit Figure
36、1 Standard arrangement of a spectrophotometer Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15368:2001(E) 4 ISO 1002 All rithgs rreseved 7Test conditions 7.1General The light source, divergence of beam, beam diameter on the specimen, w
37、avelength, spectral resolution, stepping interval, incident angle, detector and numerical correction shall be selected and documented. 7.2Light source The temporal variation of the intensity of the light source shall be measured and documented. The state of polarization (p or s) of the beam shall be
38、 selected and documented. NOTEThe state of polarization of the radiation reaching the detector may be affected by reflection on components in the reference/sample paths. It is suggested to rotate the sample in its incidence plane to check for polarization effects. The beam diameter on the specimen s
39、hall be larger than. On the surface of the specimen the beam profile shall be smooth so that the local peak power density does not exceed the average power density by a factor of greater than two. The beam diameter and the beam divergence (see also 9.9) shall be documented. 7.3Monochromator The type
40、 of dispersive element and its characteristics shall be documented. Optics for blocking out higher order diffraction light shall be documented. The spectral range and spectral resolution shall be selected in order to satisfy the specification of the measurement, and be documented. The type of spectr
41、ophotometer (single or double beam, dispersion or Fourier-transform) shall be documented. 7.4Detection system An appropriate detector for the measuring spectral region shall be selected and documented. In the case of a dispersion type spectrophotometer, a lock-in detection technique is frequently us
42、ed and a light chopper or a chopper mirror is installed in the beam to modulate the output signal. The detection system shall have a dynamic range greater thanand a deviation from linearity less than. Photometric linearity shall be calibrated by a double aperture method that uses double apertures an
43、d neutral density filters 1. When an integrating sphere or a diffuser is used, this shall be documented. 7.5Numerical correction Numerical correction can include spectral correction, averaging, smoothing, calibration of photometric linearity and others. Spectral correction can be made referring to a
44、n appropriate wavelength standard (see 9.2). Random noise can be reduced by averaging or smoothing. Averaging can be made by repeating measurement or increasing sampling time. Smoothing can be made by averaging data in the finite spectral bandwidth after measurement, although it reduces spectral res
45、olution. Sampling time and smoothing factors shall be documented. For details on the calibration of photometric linearity, see 7.4. Calibration of the spectrophotometer can be done by measuring the transmittance of a reference sample (standard) using the method given in 8.2.1. A reference sample for
46、 the transmittance from ultraviolet to near infrared region shall be an accurately parallel plate of fused silica with P2 grade surface specified in ISO 10110-8. Accuracy and 1 mm 104102 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 04:22:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO 15
47、368:2001(E) ISO 1002 All rithgs rreseved 5 repeatability of the transmittance of this reference sample is fromtoincluding photometric noise. Other standard reference materials which are checked at an accredited laboratory may be used. 8Test procedure 8.1Measurement of reflectance 8.1.1General Either
48、 of the two types of measurements of reflectance, a direct method or a relative method, shall be chosen. The incident angle shall be selected according to the manufacturers instruction. Reflectance of normal incidence cannot usually be measured and the incident angle fromtoinstead of, which shall be
49、 documented, is used. In the case of an incident angle other than, the reflectance depends on the state of polarization of the incident light, so that in the case of an angle larger than, the state (p or s) shall also be selected and documented. 8.1.2Direct measurement of regular reflectance Figure 2 shows two methods of the direct measurement of reflectance. In Figure 2 a), the reflected fluxwithout a specimen is measured, and then the reflected fluxwith the specimen is measured after changing t
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