BS-QC-720105-1997 IEC-60747-12-5-1997.pdf
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1、BRITISH STANDARD BS QC 720105:1997 IEC 60747-12-5: 1997 Harmonized system of quality assessment for electronic components Semiconductor devices Optoelectronic devices Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems ICS 31.260 Licensed Copy:
2、London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 720105:1997 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board
3、and comes into effect on 15 August 1997 BSI 09-1999 ISBN 0 580 28023 3 National foreword This British Standard reproduces verbatim IEC 60747-12-5:1997 and implements it as the UK national standard. This standard is a harmonized specification within the IEC system of quality assessment for electronic
4、 components (IECQ). The UK participation in its preparation was entrusted by Technical Committee EPL/47, Semiconductors, to Subcommittee EPL/47/3, Performance of opto-electronic semiconductor devices and liquid crystal displays, which has the responsibility to: aid enquirers to understand the text;
5、present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this subcommitte
6、e can be obtained on request to its secretary. The standard is to be used in conjunction with BS QC 700000 and BS QC 720100. The British Standard which implements the IECQ Rules of Procedure is BS 9000 General Requirements for a system for electronic components of assessed quality Part 3:1996 Specif
7、ication for the national implementation of the IECQ system. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publicat
8、ions may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or using t
9、he “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity fro
10、m legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CEI IEC title page, page ii, pages 1 to 10 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in
11、 the amendment table on the inside front cover. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 720105:1997 BSI 09-1999i Contents Page National for
12、ewordInside front cover Text of CEI IEC 60747-12-51 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00
13、:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 720105:1997 ii BSI 09-1999 Contents Page Introduction1 Required information1 1Mechanical description2 2Short descriptio
14、n2 3Categories of Assessed quality2 4Limiting values (absolute maximum rating system)2 5Electrical and optical characteristics3 6Marking4 7Ordering information4 8Test conditions and inspection requirements5 Group A Lot-by-lot tests6 Group B Lot-by-lot tests7 Group C Periodic tests8 9Group D Qualific
15、ation approval tests10 10Additional information (not for inspection purpose)10 11Reference documents10 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 720105:1997 BSI 09-19991 Introduction The IEC quality
16、 assessment system for electronic components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming
17、 with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and should be used with the following IE
18、C publications: IEC 60747-10/QC 700000:1991, Semiconductor devices Part 10: Generic specification for discrete devices and integrated circuits. IEC 60747-12/QC 720100:1991, Semiconductor devices Part 12: Sectional specification for optoelectronic devices. Required information Numbers shown in bracke
19、ts on this and the following page correspond to the following items of required information, which should be entered in the spaces provided. Identification of the detail specification 1 The name of the national authorized institute (NAI) under whose authority the detail specification is issued. 2 Th
20、e IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification, date of issue and any further information, if required by the national system. Identification of the component 5 Main function an
21、d type number. 6 Outline drawing, terminal identification, marking and/or reference to the relevant document for outlines. 7 Information on typical construction (materials, the main technology) and the package. If the device has several kinds of derivative products, those differences shall be indica
22、ted, e.g. feature of characteristics is the comparison table. If a device is sensitive to electrostatic charges, a caution statement shall be added in the detail specification. 8 Category of assessed quality according to 2.6 of the generic specification. The clauses given in square brackets on the n
23、ext page of this standard, which forms the front page of the detail specification, are intended four guidance to the specification writer and shall not be included in the detail specification. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:44:17 GMT+00:00 20
24、06, Uncontrolled Copy, (c) BSI BS QC 720105:1997 2 BSI 09-1999 4 Limiting values (absolute maximum rating system) These values apply per diode over the operating temperature range, unless otherwise stated. Repeat only clause numbers used, with text. Any additional values should be given at the appro
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