BS-QC-790109-1992.pdf
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1、BRITISH STANDARD BS QC 790109:1992 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Family specification HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU Licensed Copy:
2、London South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790109:1992 BSI 01-2000 ISBN 0 580 34070 8 Amendments issued since publication Amd. No.Date of issueComments 8377September 1994 Indicated by a sideline in the margin Licen
3、sed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790109:1992 BSI 01-2000i Contents Page National forewordii Introduction1 1Mechanical description2 2Short description2 3Categories of assessed quality2 4Limiting
4、values3 5Electrical characteristics3 6Marking13 7Ordering information13 8Test conditions and inspection requirements14 9Group D Qualification approval tests17 10Supplementary information17 Table I Group A Lot by lot14 Table II Group B Lot by lot15 Table III Group C Periodic tests16 Licensed Copy: Lo
5、ndon South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790109:1992 ii BSI 01-2000 National foreword This British Standard has been prepared under the direction of the Electronic Component Standards Policy Committee, ECL/-. It is
6、 identical with IEC Publication 748-2-2 QC 790109 “Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section 2. Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU” as amended by Amendment No. 1 published in June 1994 publi
7、shed by the International Electrotechnical Commission IEC and is a harmonized specification within the IECQ system of quality assessment for electronic components. This Family Specification is one of a series of blank detail specifications for semiconductor devices to be used with BS QC 700000 “Gene
8、ric specification for discrete devices and integrated circuits” and BS QC 790100 “Sectional specification for semiconductor integrated circuits excluding hybrid circuits”. Cross-references International StandardaCorresponding British Standard IEC 68-2-17BS 2011: Environmental testing Part 2.1Q:1981
9、Test Q. Sealing Identical IEC 191-2BS 3934:1992 Mechanical standardization of semiconductor devices. Part 2. Schedule of international drawings giving dimensions Identical IEC 747-10BS QC 700000:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic sp
10、ecification for discrete devices and integrated circuits Identical IEC 748-2BS 6493: Semiconductor devices Part 2. Integrated circuits Section 2.2:1986 Recommendations for digital integrated circuits Identical IEC 748-2-3BS QC 790130:1992 Harmonized system of quality assessment for semiconductor dev
11、ices. Blank detail specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU Identical IEC 748-11BS QC 790100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits e
12、xcluding hybrid circuits Identical IEC 749BS 6493:1991 Semiconductor devices. Part 3:1985 Mechanical and climatic test methods Identical QC 001002BS QC 001002:1991 Rules of Procedure of the IEC Quality Assessment System for Electronic Components IECQ Identical a Undated in the text. Licensed Copy: L
13、ondon South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790109:1992 BSI 01-2000iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their c
14、orrect application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, pages 1 to 19 and a back cover. This standard has been updated (see copyright date) and may
15、have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, L
16、ondon South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790109:1992 BSI 01-20001 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of
17、 this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testin
18、g. This family specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC Publication: 747-10/QC 700000, Semiconductor devices Part 10: Generic specification for discrete devices and integrated circuits. 748-11/QC 790100, Semico
19、nductor devices Integrated circuits Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in t
20、he spaces provided. Identification of the detail specification Identification of the component 1The name of the National Standards Organization under whose authority the detail specification is issued. 2The IECQ number of the detail specification. 3The numbers and issue numbers of the generic and se
21、ctional specifications. 4The national number of the detail specification, date of issue and any further information, if required by the national system. 5Main function and type number. 6Information on typical construction (materials, the main technology) and the package. If the device has several ki
22、nds of derivative products, those differences shall be indicated, e.g. feature of characteristics in the comparison table. If the device is sensitive to electrostatic charges, a caution statement shall be added in the detail specification. 7Outline drawing, terminal identification, marking and/or re
23、ference to the relevant document for outlines. 8Category of assessed quality according to subclause 2.6 of the generic specification. 9Reference data. The clauses given in square brackets on the next pages of this standard, which form the front page of the detail specification, are intended for guid
24、ance to the specification writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets. Licensed Copy: London South Bank University, London South Bank Unive
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