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1、BRITISH STANDARD BS IEC 60748-5:1997 Semiconductor devices Integrated circuits Part 5: Semicustom integrated circuits ICS 31.200 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 This British Standard, having been prepared
2、under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15 August 1997 BSI 09-1999 ISBN 0 580 28093 4 National foreword This British Standard reproduces verbatim IEC 60748-5:1997 and implements it as the UK national
3、standard. The UK participation in its preparation was entrusted by Technical Committee EPL/47, Semiconductors, to Subcommittee EPL/47/5, performance of semiconductors, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee a
4、ny enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this subcommittee can be obtained on request to its secretary. From 1 January
5、 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The Briti
6、sh Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or using the “Find” facility of the BSI Standards Electronic Catalogue. A British St
7、andard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cove
8、r, an inside front cover, pages i and ii, the IEC title page, page ii, pages 1 to 19 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since public
9、ation Amd. No.DateComments Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 BSI 09-1999i Contents Page National forewordInside front cover Text of IEC 60748-51 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:3
10、1 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 ii BSI 09-19
11、99 Contents Page Introduction1 1General2 1.1Scope2 1.2Normative references3 2Terminology and graphical symbols3 2.1General remark3 2.2Terms related to semicustom integrated circuits3 2.3Graphical symbols for semicustom integrated circuits4 3Essential data of semicustom integrated circuits from suppl
12、ier5 3.1General remark5 3.2Circuit identification and types5 3.3Application related description5 3.4Specification of the functional description of library elements5 3.5Limiting values (absolute maximum rating system)6 3.6Recommended operating conditions (within the specified operating temperature ra
13、nge)6 3.7Electrical characteristics of library elements7 3.8Additional information8 4Measuring methods8 4.1General remark8 4.2Specific requirements8 4.3Static characteristics9 4.4Dynamic characteristics9 5Acceptance and reliability9 5.1Electrical endurance tests9 5.2Environment tests9 5.3Failure ana
14、lysis procedure9 6Design aspects9 6.1General remarks9 6.2Library (approved by supplier)9 6.3Computer aided engineering (CAE) design hardware9 6.4CAE design software9 7User/supplier interface11 7.1Concept of user/supplier design interface11 7.2User/supplier typical interface documents12 8Essential da
15、ta of semicustom integrated circuits released for production13 8.1General remark13 8.2Application related description13 8.3Design aspects13 Annex A (informative) Forms used for the activity in user/supplier interface15 Figure 1 Family tree of integrated circuits2 Figure 2 Example of timing diagram8
16、Table 1 Examples of limiting values6 Table 2 Examples of recommended operating conditions6 Table 3 Examples of static characteristics7 Table 4 Examples of capacitances8 Table 5 Typical interface levels between user and supplier11 Table 6 User/supplier typical interface documents for semicustom ICs12
17、 Table 7 Example of the type of terminals13 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 BSI 09-19991 Introduction As a rule, it will be necessary to use IEC 60747-1 and IEC 60748-1 in conjunction with this part of IEC
18、 60748. In this part of IEC 60748 the user will find all basic information on: terminology; graphical symbols; essential ratings and characteristics; functional specification; measuring method; acceptance and reliability; design aspects; user/supplier interface. The sequence of the clauses is in acc
19、ordance with IEC 60747-1, Chapter III, subclause 2.1. Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 2 BSI 09-1999 1 General 1.1 Scope This part of IEC 60748 specifies standards on the subcategories of semicustom integra
20、ted circuits that appear in the following classification family tree of ICs (see Figure 1). NOTEThis family tree is not exhaustive and may be completed when necessary. Figure 1 Family tree of integrated circuits Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontro
21、lled Copy, (c) BSI BS IEC 60748-5:1997 BSI 09-19993 1.2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC 60748. At the time of publication, the editions indicated were valid. All normative docum
22、ents are subject to revision, and parties to agreements based on this part of IEC 60748 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of currently valid International Standards.
23、 IEC 60617-12:1991, Graphical symbols for diagrams Part 12: Binary logic elements. Amendment 1:1992 Amendment 2:1994 IEC 60617-13:1993, Graphical symbols for diagrams Part 13: Analogue elements. IEC 60747-1:1983, Semiconductor devices Discrete devices and integrated circuits Part 1: General. Amendme
24、nt 1:1991 Amendment 2:1993 IEC 60748-1:1984, Semiconductor devices Integrated circuits Part 1: General. Amendment 1:1991 Amendment 2:1993 IEC 60748-2:1985, Semiconductor devices Integrated circuits Part 2: Digital integrated circuits. Amendment 1:1991 Amendment 2:1993 IEC 60748-3:1986, Semiconductor
25、 devices Integrated circuits Part 3: Analogue integrated circuits. Amendment 1:1991 Amendment 2:1994 IEC 60748-4:1987, Semiconductor devices Integrated circuits Part 4: Interface integrated circuits. Amendment 1:1991 Amendment 2:1994 IEC 60748-11:1990, Semiconductor devices Integrated circuits Part
26、11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Amendment 1:1995 2 Terminology and graphical symbols 2.1 General remark See IEC 60748-2, chapter III. 2.2 Terms related to semicustom integrated circuits 2.2.1 ASIC an integrated circuit designed for specifi
27、c applications 2.2.2 cell-based integrated circuits an integrated circuit having one or more pre-characterized cells or macros selectively placed on a chip that can subsequently be connected with other on-chip circuit elements in an automated chip-layout process to produce an electrical function NOT
28、EThis definition covers both traditional standard-cell design as well as evolving cell-based designs. 2.2.3 semicustom integrated circuit an integrated circuit consisting of pre-characterized circuits, cells and macros that can be electronically captured in an automated chip-layout process to produc
29、e a circuit for a specific application Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 4 BSI 09-1999 2.2.4 full custom integrated circuit a full custom IC may be designed for only one user or it may be designed for only o
30、ne application (e.g. some special telecommunication circuits) 2.2.5 gate array An integrated circuit containing a fixed topology of circuit elements used to form macro cells and macro functions that are or may be interconnected to implement a logic function. 2.2.5.1 channelled gate array a gate arra
31、y consisting of pre-characterized circuit elements (cells and/or macros) that are in chip regions separated from the regions intended to be used for interconnection 2.2.5.2 sea of gates a gate array consisting of pre-characterized circuit elements (cells and/or macros) that can be covered by interco
32、nnection circuitry. In a sea of gates layout, the interconnect region is created by sacrificing rows of gates 2.2.5.3 circuit element a basic constituent part of a circuit, exclusive of interconnections. Examples include resistors, capacitors and transistors 2.2.6 cell A pre-characterized circuit el
33、ement with specific layout and interconnection terminals to implement an electrical function. 2.2.6.1 standard cell a cell with fixed physical and electrical characteristics established by the supplier 2.2.6.2 basic cell a cell that consists of several transistors and passive elements to facilitate
34、integration 2.2.7 macro A collection of cells with specific electrical connectivity whose characteristics are derived from the characteristics of its composing cells. NOTEThis definition includes super integration, which comprises one or more pre-characterized huge type of cells or macros. 2.2.7.1 h
35、ard macro a characterized fixed layout and interconnection of primitives that implement an electrical function NOTECharacterization may be made either by measurement of fabricated devices or by computer simulation or by both. Characterization may include the following aspects: physical dimensions, l
36、ogic functionality, testability, layout rule compliance and reliability. 2.2.7.2 soft macro an interconnection of primitives and/or macro cells that implements an electrical function but has no predetermined physical layout 2.2.7.3 users macro a macro that is provided by the user 2.3 Graphical symbo
37、ls for semicustom integrated circuits Under consideration. Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 BSI 09-19995 3 Essential data of semicustom integrated circuits from supplier 3.1 General remark This clause gives
38、 the minimum data for semicustom integrated circuits established by the supplier, such as gate arrays or standard cells. 3.2 Circuit identification and types 3.2.1 Designation and types If the device belongs to a functional or electrical category, that shall be stated. Functional and electrical cate
39、gories can be digital, analogue, mixed digital and analogue or digital interface circuits. 3.2.2 General function description When the semicustom integrated circuit makes use of a series, it shall be stated. The main functional features including the maximum number of available gates, RAM, ROM, MPU
40、and/or functional blocks shall be stated. In addition, the die size and the number of available bonding pads shall be given. 3.2.3 Process technology The process technology of monolithic integrated circuits shall be stated such as CMOS, bipolar, BICMOS etc., also type and number of interconnection l
41、ayers, as well as for CMOS the (drawn) gate length, and optionally, the (effective) channel length. 3.3 Application related description 3.3.1 Main application If necessary, the main application shall be stated. Any restrictions for application shall be stated. 3.3.2 Package identification The IEC an
42、d/or national reference number of the outline drawing or drawing of a nonstandard package, including terminal numbering and the principal package material, for example, ceramic, plastic, etc., shall be stated. A minimum and maximum chip size range shall be stated for each package. If necessary, the
43、thermal resistance shall be specified. 3.4 Specification of the functional description of library elements 3.4.1 Detailed block diagram of basic cells (cell features) The function of the basic cells may be referenced to applicable data books or design manuals, including their revisions. A detailed b
44、lock diagram or equivalent circuit information of the basic cells shall be given. Depending on the function, the description shall be given in accordance with chapter III of each of the following publications: IEC 60748-2, IEC 60748-3, and IEC 60748-4. The graphical symbols for the function shall be
45、 given. This may be obtained from a catalogue of standardized graphical symbols or designed according to the rules of IEC 60617-12 or IEC 60617-13. 3.4.1.1 Hard macros The main function of the hard macros shall be described. All hard macros shall be listed, including the physical dimensions. All add
46、itional information, such as available number and possible locations of the hard macros, shall be given. 3.4.1.2 Soft macros The main function of the soft macros shall be described, and the number of the different basic cells shall be given. 3.4.2 Identification and function of terminals Each predef
47、ined terminal shall be identified, and the restriction of its use shall be indicated. Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 26 11:54:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS IEC 60748-5:1997 6 BSI 09-1999 3.5 Limiting values (absolute maximum rating system) These values apply o
48、ver the operating temperature range, unless otherwise specified. Limiting values are not for inspection purposes. Unless otherwise specified, limiting values shall be given as follows: Any cautionary statement unique to the integrated circuit shall be included. It shall be specified if any interdepe
49、ndence of limiting values exist. All conditions for which the limiting values apply shall be stated. If externally connected and/or attached elements, for example heat-sinks, have an influence on the values of the ratings, the ratings shall be prescribed for the integrated circuit with the elements connected and/or attached. If minimum and/or maximum values are quoted, it shall be indicated whether they are absolute or algebraic. If transient overloads are permitted, their magnitude and duration shall
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