BS-QC-750110-1990 IEC-60747-6-1-1989.pdf
《BS-QC-750110-1990 IEC-60747-6-1-1989.pdf》由会员分享,可在线阅读,更多相关《BS-QC-750110-1990 IEC-60747-6-1-1989.pdf(16页珍藏版)》请在三一文库上搜索。
1、BRITISH STANDARD BS QC 750110:1990 IEC 747-6-1: 1989 Specification for Harmonized system of quality assessment for electronic components Semiconductor discrete devices Blank detail specification Reverse blocking triode thyristors, ambient and case-rated, up to 100A Licensed Copy: London South Bank U
2、niversity, London South Bank University, Fri Dec 08 17:04:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750110:1989 BSI 10-1999 ISBN 0 580 35663 9 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:0
3、4:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750110:1989 BSI 10-1999i Contents Page National forewordInside front cover Introduction1 1Mechanical description2 2Short description2 3Categories of assessed quality2 4Limiting values3 5Electrical characteristics4 6Marking5 7Ordering information5
4、 8Test conditions and inspection requirements5 9Group D Qualification approval tests10 10Additional information10 Figure 1 Current derating curve for a thyristor4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI
5、 BS QC 750110:1989 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee ECL/-. It is identical with IEC Publication 747-6-1:1989 QC 750110 “Semiconductor devices Discrete devices Part 6: Thyristors Sectio
6、n 1. Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, up to 100A” published by the International Electrotechnical Commission (IEC). Cross-references The British Standard harmonized with QC 001001 and QC 001002 is BS 9000 “General requirements for a system fo
7、r electronic components of assessed quality”. There is no corresponding British Standard for IEC 191, but BS 3934 “Specification for dimensions of semiconductor devices and integrated electronic circuits” is a related standard. A British Standard does not purport to include all the necessary provisi
8、ons of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standarda Corresponding British Standard IEC 63-2-17:1978BS 2011 Basic environmental testing proced
9、ures Part 2.1Q:1981 Test Q. Sealing (Identical) IEC 747-6:1983BS 6493 Semiconductor devices Part 1 Discrete devices Section 1.6:1984 Recommendations for thyristors. (Identical) IEC 747-10/QC 700000:1984 BS 9970 Harmonized system of quality assessment for electronic components. Semiconductor devices
10、Part 0:1985 Generic specification (Identical) IEC 747-11/QC 750000:1985 BS QC 750000:1986 Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification. (Identical) IEC 749:1984BS 6493 Semiconductor devices Part 3:1985 Mechanical and clima
11、tic test methods (Identical) a Some standards are undated in the text. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 10 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This wil
12、l be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750110:1989 BSI 10-19991 Introduction The IEC Quality Assessment System for Electronic Comp
13、onents is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicabl
14、e specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC publications: Required information Nu
15、mbers shown in brackets on this and the following pages correspond to the following items of required information, which shall be entered in the spaces provided. Identification of the detail specification 1 The name of the National Standards Organization under whose authority the detail specificatio
16、n is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification, date of issue and any further information required by the national system. Identification of the component 5 Typ
17、e of component. 6 Information on typical construction and applications. If a device is designed to satisfy several applications, this shall be stated here. Characteristics, limits and inspection requirements for these applications shall be met. If a device is electrostatic sensitive, or contains haz
18、ardous material, e.g. beryllium oxide, a caution statement shall be added in the detail specification. 7 Outline drawing and/or reference to the relevant standard for outlines. 8 Category of assessed quality. 9 Reference data on the most important properties to permit comparison between component ty
19、pes. 747-10/QC 700000 (1984): Semiconductor devices, Part 10: Generic specification for discrete devices and integrated circuits. 747-11/QC 750100 (1985): Semiconductor devices, Part 11: Sectional specification for discrete devices. Throughout this standard, the texts given in square brackets are in
20、tended for guidance to the specification writer and shall not be included in the detail specification. Throughout this standard, when a characteristic or rating applies, “x” denotes that a value shall be inserted in the detail specification. Licensed Copy: London South Bank University, London South
21、Bank University, Fri Dec 08 17:04:59 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750110:1989 2 BSI 10-1999 Name (address) of responsible NAI (and possibly of body from which specification is available). e Number of IECQ detail specification, plus issue number and/or date. QC 750110 . f ELECTRON
22、IC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication 747-10/QC 700000 Sectional specification: Publication 747-11/QC 750100 and national references if different. g National number of detail specification.h This box need not be used if the National number repeats IE
23、CQ number. DETAIL SPECIFICATION FOR: Type number(s) of the relevant device(s). Ordering information: see Clause 7 of this standard. i 1 Mechanical description2 Short description Outline references: IEC 191-2 mandatory if available and/or national if there is no IEC outline. kReverse blocking triode
24、thyristors, ambient and case-rated, up to 100 A. Semiconductor material: Si Encapsulation: cavity or non-cavity. Application(s): see Clause 5 of this standard. j Outline drawing may be transferred to or given with more details in Clause 10 of this standard. Caution. Observe precautions for handling
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- BS-QC-750110-1990 IEC-60747-6-1-1989 BS QC 750110 1990 IEC 60747 1989
链接地址:https://www.31doc.com/p-3748259.html