《BS-ISO-IEC-10373-3-2001.pdf》由会员分享,可在线阅读,更多相关《BS-ISO-IEC-10373-3-2001.pdf(90页珍藏版)》请在三一文库上搜索。
1、BRITISH STANDARD BS ISO/IEC 10373-3:2001 Identification cards Test methods Part 3: Integrated circuit(s) cards with contacts and related interface devices ICS 35.240.15 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52
2、:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS ISO/IEC 10373-3:2001 This British Standard, having been prepared under the direction of the DISC Board, was published under the authority of the Standards Committee and comes into effect on 15 July 2001 BSI 07-2001 ISBN 0 580 37735 0 National forewor
3、d This British Standard reproduces verbatim ISO/IEC 10373-3:2001 and implements it as the UK national standard. The UK participation in its preparation was entrusted to Technical Committee IST/17, Identification cards and Related Devices, which has the responsibility to: A list of organizations repr
4、esented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspond
5、ence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of
6、itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments a
7、nd promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the ISO title page, pages ii to vi, pages 1 to 80, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendm
8、ents issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Reference number ISO/IEC 10373-3:2001(E) INTERNATIONAL STANDARD ISO/IEC 10373-3 First edition 2001-02-15 Identification cards Test methods Pa
9、rt 3: Integrated circuit(s) cards with contacts and related interface devices Cartes didentification Mthodes dessai Partie 3: Cartes circuit(s) intgr(s) contacts et dispositifs dinterface assimils Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c)
10、BSI ISO/IEC 10373-3:2001(E) ii Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO/IEC 10373-3:2001(E) iii Contents Forewordvi 1Scope1 2Normative references.1 3Terms and definitions2 4General items applicable to the test methods 3 4.1Test en
11、vironment .3 4.2Pre-conditioning.3 4.3Default tolerance3 4.4Total measurement uncertainty.3 4.5Conventions for electrical measurements3 4.6Apparatus.3 4.6.1Default ICC-holder, reference axes and default measurement position3 4.6.2Apparatus for testing the integrated circuit(s) cards with contacts (I
12、CC-test-apparatus)5 4.6.3Apparatus for testing the interface device (IFD-test-apparatus)11 4.6.4Test Scenario .17 4.7Relationship of test methods versus base standard requirements.17 5Test methods for physical characteristics of ICCs with contacts .21 5.1Dimension and Location of Contacts21 5.1.1App
13、aratus.21 5.1.2Procedure.21 5.1.3Test report22 5.2Static electricity22 5.2.1Test Report.22 5.3Electrical surface resistance of contacts22 5.3.1Apparatus.22 5.3.2Procedure.23 5.3.3Test report23 5.3.4Preliminary requirement 23 5.4Surface profile of contacts 24 5.4.1Apparatus.24 5.4.2Procedure.24 5.4.3
14、Test report25 6Test methods for electrical characteristics of ICCs with contacts25 6.1VCC contact25 6.1.1Apparatus.25 6.1.2Procedure.25 6.1.3Test report26 6.2I/O contact 27 6.2.1Apparatus.27 6.2.2Procedure.27 6.2.3Test report29 6.3CLK contact29 6.3.1Apparatus.29 6.3.2Procedure.29 6.3.3Test report31
15、6.4RST contact31 6.4.1Apparatus.31 6.4.2Procedure.31 6.4.3Test report32 Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO/IEC 10373-3:2001(E) iv 6.5VPP contact32 7Test methods for logical operations of ICCs with contacts.33 7.1Answer to Re
16、set (ATR).33 7.1.1Cold Reset and Answer-to-Reset (ATR)33 7.1.2Warm Reset33 7.1.3Selection of the operation class A 34 7.2T=0 Protocol.35 7.2.1I/O transmission timing for T=0 protocol35 7.2.2I/O character repetition for T=0 protocol.36 7.2.3I/O reception timing and error signaling for T=0 protocol37
17、7.3T=1 Protocol.38 7.3.1I/O transmission timing for T=1 protocol38 7.3.2I/O reception timing for T=1 protocol39 7.3.3ICC Character Waiting Time (CWT) behavior41 7.3.4ICC-reaction to IFD exceeding character waiting time (CWT)41 7.3.5Block Guardtime (BGT)42 7.3.6Block sequencing by the ICC 43 7.3.7Rea
18、ctions of the ICC to protocol errors45 7.3.8Recovery of a transmission error by the ICC46 7.3.9Resynchronization.47 7.3.10IFSD negotiation.48 7.3.11Abortion by the IFD49 8Test methods for physical and electrical characteristics of the IFD50 8.1Activation of contacts50 8.1.1Apparatus.50 8.1.2Procedur
19、e.50 8.1.3Test report51 8.2VCC contact51 8.2.1Apparatus.51 8.2.2Procedure.51 8.2.3Test report53 8.3I/O contact53 8.3.1Apparatus.53 8.3.2Procedure.53 8.3.3Test report55 8.4CLK contact55 8.4.1Apparatus.56 8.4.2Procedure.56 8.4.3Test report58 8.5RST contact58 8.5.1Apparatus.58 8.5.2Procedure.58 8.5.3Te
20、st report59 8.6VPP contact59 8.7Deactivation of the contacts59 8.7.1Apparatus.60 8.7.2Procedure.60 8.7.3Test report60 9Test methods for logical operations of the IFD 60 9.1Answer to Reset (ATR).60 9.1.1ICC Reset (cold reset)60 9.1.2ICC Reset (warm reset)61 9.2T=0 Protocol.61 9.2.1I/O transmission ti
21、ming for T=0 protocol61 9.2.2I/O character repetition for T=0 protocol.62 9.2.3I/O reception timing and error signaling for T=0 protocol63 9.3T=1 Protocol.65 9.3.1I/O transmission timing for T=1 protocol65 Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled C
22、opy, (c) BSI ISO/IEC 10373-3:2001(E) v 9.3.2I/O reception timing for T=1 protocol66 9.3.3IFD Character Waiting Time (CWT) behavior 67 9.3.4IFD-reaction to ICC exceeding CWT68 9.3.5Block Guardtime (BGT)68 9.3.6Block sequencing by the IFD.69 9.3.7Recovery of a transmission error by the IFD73 9.3.8IFSC
23、 negotiation.73 9.3.9Abortion by the ICC74 Annex A (informative) Additional Test Methods76 A.1ICC Mechanical strength: 3 wheel test .76 A.1.1Apparatus.76 A.1.2Method78 A.1.3Test Report.79 A.2IFD Reaction of the IFD to invalid PCBs.79 A.2.1Apparatus.79 A.2.2Procedure.79 A.2.3Test report80 Licensed Co
24、py: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO/IEC 10373-3:2001(E) vi Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardizati
25、on. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual
26、interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3. In the field of information technology, ISO and IEC have
27、established a joint technical committee, ISO/IEC JTC 1. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is
28、 drawn to the possibility that some of the elements of this part of ISO/IEC 10373 may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. International Standard ISO/IEC 10373-3 was prepared by Joint Technical Committee ISO/IEC JTC
29、 1, Information technology, Subcommittee SC 17, Identification cards and related devices. ISO/IEC 10373 consists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics tests Part 2: Cards with magnetic stripes Part 3: Integrated circuit(s)
30、cards with contacts and related interface devices Part 4: Contactless integrated circuit cards Part 5: Optical memory cards Part 6: Proximity cards Part 7: Vicinity cards Annex A of this part of ISO/IEC 10373 is for information only. Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GM
31、T+00:00 2006, Uncontrolled Copy, (c) BSI INTERNATIONAL STANDARDISO/IEC 10373-3:2001(E) 1 Identification cards Test methods Part 3: 1 Scope This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices according to the d
32、efinition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which may be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptabilit
33、y do not form part of this International Standard but will be found in the International Standards mentioned above. This part of ISO/IEC 10373 deals with test methods, which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 deals with test methods which are common to one o
34、r more card technologies and other parts deal with other technology-specific tests. Test methods described in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods described in t
35、his part of ISO/IEC 10373 are based on specifications defined or to be defined in ISO/IEC 7816. Conformance of ICCs and IFDs determined using the test methods defined in this part of ISO/IEC 10373 do not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC
36、 10373. 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of ISO/IEC 10373. For dated references, subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to
37、 agreements based on this part of ISO/IEC 10373 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of ISO and IEC maintain reg
38、isters of currently valid International Standards. ISO/IEC 7810:1995, Identification cards Physical characteristics. ISO/IEC 7816-1:1998, Identification cards Integrated circuit(s) cards with contacts Part 1: Physical characteristics. ISO/IEC 7816-2:1999, Information technology Identification cards
39、Integrated circuit(s) cards with contacts Part 2: Dimensions and location of the contacts. ISO/IEC 7816-3:1997, Information technology Identification cards Integrated circuit(s) cards with contacts Part 3: Electronic signals and transmission protocols. ISO/IEC 7816-4:1995, Information technology Ide
40、ntification cards Integrated circuit(s) cards with contacts Part 4: Interindustry commands for interchange. ISO/IEC 10373-1:1998, Identification cards Test methods Part 1: General characteristics tests. Integrated circuit(s) cards with contacts and related interface devices 1 Licensed Copy: sheffiel
41、dun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO/IEC 10373-3:2001(E) 2 ISO/IEC 2001 All rihgts reservde United States of America, Department of Defense, Test Method Standard, Microcircuits, MIL-STD-883, Version E, 31 December 1996, Method 3015.7 Electrostatic d
42、ischarge sensitivity classification. 3 Terms and definitions For the purposes of this part of ISO/IEC 10373, the following terms and definitions apply. 3.1 test method method for testing characteristics of identification cards and related interface devices for the purpose of confirming their complia
43、nce with International Standards 3.2 testably functional has survived the action of some potentially destructive influence to the extent that: a) any magnetic stripe present on the card shows a relationship between signal amplitudes before and after exposure that is in accordance with the base stand
44、ard; b) any integrated circuit(s) present in the card continues to show an Answer to Reset response1 which conforms to the base standard; c) any contacts associated with any integrated circuit(s) present in the card continue to show electrical resistance which conforms to the base standard; d) any o
45、ptical memory present in the card continue to show optical characteristics which conform to the base standard 3.3 normal use use as an Identification card (see clause 4 of ISO/IEC 7810:1995), involving equipment processes appropriate to the card technology and storage as a personal document between
46、equipment processes 3.4 ICC integrated circuit(s) card with contacts as defined in the ISO/IEC 7816 series of standards 3.5 IFD interface device related to integrated circuit(s) cards with contacts as defined in the ISO/IEC 7816 series of standards 3.6 DUT device under test; within the scope of this
47、 document the ICC or the IFD subject to testing 1 This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit(s) cards. The test methods require only that the minimum functionality (testably functional) be verified. This may, in appropriate circums
48、tances, be supplemented by further, application specific functionality criteria which are not available in the general case. 2 Licensed Copy: sheffieldun sheffieldun, na, Tue Nov 21 05:52:50 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ISO/IEC 10373-3:2001(E) ISO/IEC 2001 All rihgts reserved3 3.7 typi
49、cal protocol and application specific communication any communication between a DUT and the corresponding test-apparatus based on protocol and application implemented in the DUT and representing its normal use 3.8 Test Scenario a defined typical protocol and application specific communication to be used with the test methods defined in this document 4 General items applicable to the test methods 4.1 Test environment Unless otherwise specified, testing of physical, electrical and logical characteristics sha
链接地址:https://www.31doc.com/p-3748821.html