BS-QC-790131-1992.pdf
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1、BRITISH STANDARD BS QC 790131:1992 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Blank detail specification Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) Licensed Copy: London South Bank Unive
2、rsity, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790131:1992 BSI 11-1999 ISBN 0 580 35649 3 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:02
3、 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790131:1992 BSI 11-1999i Contents Page National forewordii Introduction1 1Marking and ordering information3 2Application related description3 3Specification of the function3 4Limiting values3 5Operating conditions4 6Electrical characteristics4 7Progr
4、amming6 8Mechanical and environmental ratings, characteristics and data6 9Additional information6 10Screening6 11Quality assessment procedures6 12Structural similarity procedures6 13Test conditions and inspection requirements7 14Additional measurement method10 Table I7 Table II8 Table III9 Table IV1
5、0 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790131:1992 ii BSI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Com
6、mittee, ECL/-. It is identical with IEC Publication 748-2-5 (QC 790131) “Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section 5: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)” published by the Internationa
7、l Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ system of quality assessment for electronic components. This blank detail specification is one of a series of blank detail specifications for semiconductor devices to be used with BS QC 700000:1991 “Harmonized syst
8、em of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance wit
9、h a British Standard does not of itself confer immunity from legal obligations. Cross-references International StandardaCorresponding British Standard IEC 68-2-17BS 2011 Environmental testing Part 2.1 Q:1981 Test Q. Sealing (Identical) IEC 617-12BS 3939 Guide for graphical symbols for electrical pow
10、er, telecommunications and electronics diagrams Part 12:1985 Binary logic elements (Identical) IEC 747-10BS QC 700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits (Identical) IEC 748-2-4BS QC 790104:1992 Ha
11、rmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family Specification for complementary MOS digital integrated circuits, series 4 000 B and 4 000 UB (Identical) IEC 748-11BS QC 790100:1991 Harmonized system of quality assessment for electro
12、nic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits (Identical) IEC 749BS 6493 Semiconductor devices Part 3:1985 Mechanical and climatic test methods (Identical) QC 001002BS QC 001002:1991 Rules of Procedure of the IEC Qualit
13、y Assessment System for Electronic Components (IECQ) (Identical) a Undated in the text. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 10 and a back cover. This standard has been updated (see copyright date) and may have had amendments incor
14、porated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:02 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790131:1992 BSI 11-19991 Introduction The IEC Quality Assessment System fo
15、r Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirement
16、s of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC publication: 747-10/
17、QC 700000, Semiconductor devices Part 10: Generic specification for discrete devices and integrated circuits. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in the spaces provided. Iden
18、tification of the detail specification 1 The name of the National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic, sectional and family specifications. 4 The national number
19、 of the detail specification, date of issue and any further information, if required by the national system. Identification of the component 5 Main function and type number. 6 Information on typical construction (materials, main technology) and package. If the device has several kinds of derivative
20、products, those differences shall be indicated, e.g. features of characteristics in the comparison table. If the device is electrostatic sensitive, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification, marking and/or reference to the relevant doc
21、ument for outlines. 8 Category of assessed quality according to subclause 2.6 of the generic specification. 9 Reference data. The clauses given in square brackets on the next pages of this standard, which form the front page of the detail specification, are intended for guidance to the specification
22、 writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:43:0
23、2 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 790131:1992 2 BSI 11-1999 Name (address) of responsible NAI (and possibly of body from which specification is available). 1Number of IECQ detail specification, plus issue number and/or date. 2 QC 790131-. ELECTRONIC COMPONENT OF ASSESSED QUALITY IN
24、ACCORDANCE WITH: 3National number of detail specification.4 Generic specification: Publication 747-10/QC 700000 This box need not be used if national number repeats IECQ number. Sectional specification: Publication 748-11/QC 790100 Family specification: Publication 748-2-4/QC 790104 and national ref
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