BS-ISO-22489-2006.pdf
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1、BRITISH STANDARD BS ISO 22489:2006 Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy ICS 71.040.99 ? Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 20
2、07, Uncontrolled Copy, (c) BSI BS ISO 22489:2006 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 28 February 2007 BSI 2007 ISBN 978 0 580 50237 8 National foreword This British Standard was published by BSI. It is the UK implementation of ISO
3、 22489:2006. The UK participation in its preparation was entrusted to Technical Committee CII/9, Microbeam analysis. A list of organizations represented on CII/9 can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. User
4、s are responsible for its correct application. Compliance with a British Standard cannot confer immunity from legal obligations. Amendments issued since publication Amd. No. DateComments Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Un
5、controlled Copy, (c) BSI INTERNATIONAL STANDARD ISO 22489 First edition 2006-12-15 Reference number ISO 22489:2006(E) Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy Analyse par microfaisceaux Analyse par m
6、icrosonde de Castaing Analyse quantitative ponctuelle dchantillons massifs par spectromtrie X dispersion de longueur donde BS ISO 22489:2006 Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy, (c) BSI ii Licensed Copy: Lon
7、don South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy, (c) BSI iii Contents Page 1Scope 1 2Normative references 1 3Abbreviated terms . 2 4Procedure for quantification . 2 4.1General procedure for quantitative microanalysis . 2 4.2Specimen prep
8、aration . 3 4.3Calibration of the instrument . 3 4.4Analysis conditions 4 4.5Correction method based on analytical models 7 4.6Calibration curve method . 8 4.7Uncertainty . 8 5Test report 8 Annex A (informative) Physical effects and correction . 10 Annex B (informative) Outline of various correction
9、 techniques . 11 Annex C (normative) Measurement of the -ratios in the case of “chemical effects” . 13 Bibliography . 14 BS ISO 22489:2006 Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy, (c) BSI iv Foreword ISO (the In
10、ternational Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee h
11、as been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical
12、 standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodi
13、es for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any
14、or all such patent rights. ISO 22489 was prepared by Technical Committee ISO/TC 202, Microbeam analysis, Subcommittee SC 2, Electron probe microanalysis. BS ISO 22489:2006 Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy
15、, (c) BSI v Introduction Electron microanalysis is widely used for the quantitative analysis of elemental composition in materials. It is a typical instrumental analysis and the electron probe microanalyser has been greatly improved to be user- friendly. Obtaining accurate results with this powerful
16、 tool requires that it be properly used. In order to obtain reliable data, however, optimum procedures must be followed. These procedures, such as preparation of specimens, measurement of intensities of characteristic X-rays and calculation of concentrations from X-ray intensities, are given, for us
17、e as standard procedures, in this International Standard. BS ISO 22489:2006 Licensed Copy: London South Bank University, London South Bank University, Thu Mar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy, (c) BSI blank Licensed Copy: London South Bank University, London South Bank University, Thu M
18、ar 01 08:55:31 GMT+00:00 2007, Uncontrolled Copy, (c) BSI 1 Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy 1Scope This International Standard specifies requirements for the quantification of elements in a
19、micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength-dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM). It describes: the principle of the quantitative
20、analysis; the general coverage of this technique in terms of elements, mass fractions and reference specimens; the general requirements for the instrument; the fundamental procedures involved, such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these
21、 and the report. This International Standard is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such
22、as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used. 2Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applie
23、s. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 14594, Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy ISO 14595, Microbeam analysis Ele
24、ctron probe microanalysis Guidelines for the specification of certified reference materials (CRMs) ISO/IEC 17025:2005, General requirements for the competence of testing and calibration laboratories ISO 17470, Microbeam analysis Electron probe microanalysis Guidelines for qualitative point analysis
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