BS-QC-750106-1993 IEC-60747-8-2-1993.pdf
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1、BRITISH STANDARD BS QC 750106:1993 IEC 747-8-2: 1993 Specification for Harmonized system of quality assessment for electronic components Semiconductor discrete devices Blank detail specification Field-effect transistors for case-rated power amplifier applications Licensed Copy: London South Bank Uni
2、versity, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750106:1993 BSI 01-2000 ISBN 0 580 34163 1 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:
3、48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750106:1993 BSI 01-2000i Contents Page National forewordii Introduction1 Short description2 Mechanical description2 Categories of assessed quality2 Reference data2 4Limiting values (absolute maximum system)3 5Electrical characteristics4 6Marking6 7
4、Ordering information6 8Test conditions and inspection requirements6 9Group D Qualification approval tests14 10Additional information (not for inspection purposes)14 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) B
5、SI BS QC 750106:1993 ii BSI 01-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee. It is identical with IEC 747-8-2:1993: QC 750106 Semiconductor devices Discrete devices Part 8: Field-effect transistors Section
6、2. Blank detail specification for field-effect transistors for case-rated power amplifier applications, published by the International Electrotechnical Commission (IEC). A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsi
7、ble for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standarda Corresponding British Standard IEC 68-2-17:1978BS 2011 Environmental testing Part 2.1Q:1981 Test Q. Sealing (Identical) IEC 191-2:
8、1966BS 3934 Mechanical standardization of semiconductor devices Part 2:1992 Schedule of international drawings giving dimensions (Identical) IEC 747-1:1983 BS 6493 Semiconductor devices Section 1.1:1984 General (Identical) IEC 747-2:1983Section 1.2:1984 Recommendations for rectifier diodes (Identica
9、l) IEC 747-8:1984Section 1.8:1985 Recommendations for field-effect transistors (Identical) IEC 747-8-1:1988BS QC 750112:1988 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specificat
10、ion for single-gate field-effect transistors, up to 5 W and 1 GHz (Identical) IEC 747-10/ QC 700000:1981 BS QC 700000:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification for discrete devices and integrated circuits (Identical) IEC 747-
11、11/ QC 750000:1985 BS QC 750000:1986 Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification (Identical) IEC 749:1984BS 6493 Semiconductor devices Part 3:1985 Mechanical and climatic test methods (Identical) a Some standards are unda
12、ted in the text. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 14 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside fr
13、ont cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750106:1993 BSI 01-20001 Introduction The IEC quality assessment system for electronic components is operated in accordance with the statutes of
14、the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other pa
15、rticipating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC publications: 747-10/QC 700000:1991, Semiconductor devices. Discrete devices Part 10: Gener
16、ic specification for discrete devices and integrated circuits. 747-11/QC 750100:1985, Semiconductor devices. Discrete devices Part 11: Sectional specification for discrete devices. Required information Numbers shown in brackets on this and the following page correspond to the following items of requ
17、ired information, which should be entered in the spaces provided. Identification of the detail specification 1 The name of the national standards organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of t
18、he generic and sectional specifications. 4 The national number of the detail specification, date of issue and any further information, if required by the national system. Identification of the component 5 Type of component. 6 Information on typical construction and applications. If a device is desig
19、ned to satisfy several applications, this shall be stated here. Characteristics, limits and inspection requirements for these applications shall be met. If a device is electrostatic sensitive, or contains hazardous materials, e.g. beryllium oxide, a caution statement shall be added in the detail spe
20、cification. 7 Outline drawing and/or reference to the relevant document for outlines. 8 Category of assessed quality. 9 Reference data on the most important properties to permit comparison between component types. Throughout this standard, the texts given in square brackets are intended for guidance
21、 to the specification writer and shall not be included in the detail specification. Throughout this standard, when a characteristic or rating applies, “” denotes that a value shall be inserted in the detail specification. Licensed Copy: London South Bank University, London South Bank University, Fri
22、 Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750106:1993 2 BSI 01-2000 Name (address) of responsible NAI (and possibly of body from which specification is available). 1Number of IECQ detail specification, plus 2 issue number and/or date. ELECTRONIC COMPONENT OF ASSESSED QUALITY
23、IN ACCORDANCE WITH: Generic specification: Publication 747-10/QC 700000 Sectional specification: Publication 747-11/QC 750100 and national references if different. 3National number of detail specification.4 This box need not be used if national number repeats IECQ number. DETAIL SPECIFICATION FOR: F
24、IELD-EFFECT TRANSISTORS FOR CASE-RATED POWER AMPLIFIER APPLICATION Type number(s) of the relevant device(s). Ordering information: see clause 7 of this standard. 5 Mechanical description Outline references: IEC 191-2 mandatory if available and/or national if there is no IEC outline. Outline drawing
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