BS-QC-750107-1991.pdf
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1、BRITISH STANDARD BS QC 750107:1991 IEC 747-7-4: 1991 Specification for Harmonized system of quality assessment for electronic components Semiconductor discrete devices Blank detail specification Case-rated bipolar transistors for high-frequency amplifications Licensed Copy: London South Bank Univers
2、ity, London South Bank University, Fri Dec 08 17:07:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750107:1991 BSI 12-1999 ISBN 0 580 35532 2 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:07:12 G
3、MT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750107:1991 BSI 12-1999i Contents Page National forewordii Introduction1 1Mechanical description2 2Short description2 3Categories of assessed quality2 4Limiting values (absolute maximum rating system)2 5Electrical characteristics3 6Marking6 7Ordering i
4、nformation6 8Test conditions and inspection requirements6 9Group D Qualification approval tests12 10Additional information (not for inspection purposes)12 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:07:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 7
5、50107:1991 ii BSI 12-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication 747-7-4:1991: QC 750107 “Semiconductor devices Discrete devices Part 7: Bipolar transistors Sec
6、tion 4: Blank detail specification for case-rated bipolar transistors for high-frequency amplification” published by the International Electrotechnical Commission (IEC). Cross-references The British Standard harmonized with QC 001001 and QC 001002 is BS 9000 “General requirements for a system for el
7、ectronic components of assessed quality”. There is no corresponding British Standard for IEC 191, but BS 3934 “Specification for dimensions of semiconductor devices and integrated electronic circuits” is a related standard. A British Standard does not purport to include all the necessary provisions
8、of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standarda Corresponding British Standard IEC 68-2-17:1978BS 2011 Environmental testing Part 2.1Q:1981 T
9、est Q. Sealing (Identical) BS 6493 Semiconductor devices Part 1: Discrete devices IEC 747-1:1983Section 1.1:1984: General (Identical) IEC 747-2:1983Section 1.2:1984 Recommendations for rectifier diodes (Identical) IEC 747-7:1988Section 1.7:1989 Recommendations for bipolar transistors (Identical) IEC
10、 747-10/QC 700000:1991BS QC 700000:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification discrete devices and integrated circuits (Identical) IEC 747-11/QC 750000:1985BS QC 750000:1986 Harmonized system of quality assessment for electron
11、ic components. Discrete semiconductor devices. Sectional specification (Identical) IEC 749:1984BS 6493: Semiconductor devices Part 3:1985 Mechanical and climatic test methods (Identical) a Some standards are undated in the text Summary of pages This document comprises a front cover, an inside front
12、cover, pages i and ii, pages 1 to 12 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri
13、 Dec 08 17:07:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750107:1991 BSI 12-19991 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define qualit
14、y assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specificati
15、on is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC publications: 747-10/QC 700000:1991, Semiconductor devices Part 10: Generic specification for discrete devices and integrated circuits. 747-11/QC 750100:1985, Semiconductor devices
16、 Part 11: Sectional specification for discrete devices. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in the spaces provided. Identification of the detail specification 1 The name of t
17、he National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification, date of issue and any further in
18、formation required by the national system. Identification of the component 5 Type of component. 6 Information on typical construction and applications. If a device is designed to satisfy several applications, this shall be stated here. Characteristics, limits and inspection requirements for these ap
19、plications shall be met. If a device is electrostatic sensitive, or contains hazardous material, e.g. beryllium oxide, a caution statement shall be added in the detail specification. 7 Outline drawing and/or reference to the relevant standard for outlines. 8 Category of assessed quality. 9 Reference
20、 data on the most important properties to permit comparison between component types. Throughout this standard, the texts given in square brackets are intended for guidance to the specification writer and should not be included in the detail specification. Throughout this standard, when a characteris
21、tic or rating applies, “” denotes that a value shall be inserted in the detail specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:07:12 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 750107:1991 2 BSI 12-1999 4 Limiting values (absolute maximum
22、rating system) These values apply over the operating temperature range unless otherwise specified. Repeat only subclause numbers used, with the title. Any additional values should be given at the appropriate place, but without subclause number(s). Curves should preferably be given under clause 10 of
23、 this standard. Name (address) of responsible NAI (and possibly of body from which specification is available). 1Number of IECQ detail specification plus issue number and/or date. QC 750107-XXX 2 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication 747-10/Q
24、C 700000 Sectional specification: Publication 747-11/QC 750100 and national references if different. 3National number of detail specification. This box need not be used if the National number repeats IECQ number. 4 DETAIL SPECIFICATION FOR: Type number(s) of the relevant device(s). Ordering informat
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