EIA-364-66A-2000-R2007.pdf
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1、 ANSI/EIA-364-66A-2000(R2007) Approved: May 5, 2000 Reaffirmed: March 1, 2007 EIA STANDARD EIA-364-66A TP-66A EMI Shielding Effectiveness Test Procedure for Electrical Connectors EIA-364-66A (Revision of EIA-364-66) MAY 2000 ELECTRONIC COMPONENTS, ASSEMBLIES see figure 1. Copyright Electronic Compon
2、ents, Assemblies therefore, the average response for the effective aperture of a receiving antenna (or the connector under test) placed inside the chamber approaches a value equivalent to a gain of unity. 1), 2) 1.2.3 Measurement of connector Shielding Effectiveness (SE) 1.2.3.1 The measurement of S
3、E is based on the comparison of the rf power induced into the CUT on the rf power induced into a reference antenna; see figure 1. The shielding effectiveness of the CUT (expressed in dB) is then defined as: = cut ref P P log 10 SE(dB) where: Pcut = Power coupled to the connector under test Pref = Po
4、wer coupled to the reference antenna 1.2.3.2 Both the value of Pcut and Pref are determined statistically as a function of tuner position and are determined for the same net input power applied to the chamber. 1.2.3.3 The leakage to be measured is principally that which enters the connector shells u
5、nder test at the main point of interface. Leakage at the accessory joints is to be prevented by appropriate fixturing. 1) M. L. Crawford, G. H. Koepke, “Design, Evaluation, and Use of a Reverberation Chamber for Performing Electromagnetic Susceptibility/Vulnerability Measurements,” Technical Note 10
6、92, National Bureau of Standard. 2) M. L. Crawford and J. M. Ladbury, “Mode-Stirred Chamber for Measuring Shielding Effectiveness of Cables and Connectors,” IEEE August 1988 International Symposium on Electromagnetic compatibility, Seattle, Washington, pp. 30-36. Copyright Electronic Components, Ass
7、emblies see annex D for further discussion on corrections for mismatch errors. Copyright Electronic Components, Assemblies see annex E. 3.2.3 Test specimen installation 3.2.3.1 Install the CUT/cable assembly in the chamber and terminate it with 50 ohm load as shown in figure 3. The CUT shall be plac
8、ed in the chamber so that the shortest distance between any point on the CUT and any chamber wall is at least one wavelength at the lowest test frequency. NOTE At test frequencies below 1 GHz, the length of the CUT/conduit assembly may be reduced to a length of greater than or equal to 2.0 wavelengt
9、hs at the lowest test frequency. The distance from the test specimen from the wall of the chamber (see Figure 3) shall then be greater than or equal to 0.5 wavelength. 1) 3.2.3.2 The points where the test specimen conduit penetrates the test chamber should be well shielded. The shielding effectivene
10、ss at these points should be equal to or exceed that of the test chamber. 4 Test procedure 4.1 Test frequencies 4.1.1 The shielding effectiveness tests are to be performed over the frequency range of 1.0 GHz to 10 GHz in steps of 1 GHz unless otherwise specified in the referencing document. Copyrigh
11、t Electronic Components, Assemblies see 4.2. 4.3.3.1 Alternatively, the signal levels measured at the reference antenna and at the CUT for each of the 200 positions of the mode-tuner may be stored as two separate groups of data. Each group of data is then averaged individually. NOTE Data shall be co
12、nverted to units of power before averaging. 4.4 Continuous tuning, test frequencies above 2 GHz 4.4.1 Acquiring test data 4.4.1.1 At each test frequency, take 3000 readings of the signal level from the reference antenna, and 3000 readings of the signal from the CUT using the following steps: 4.4.1.1
13、.1 Set the mode-tuner drive for continuous stepping (or rotation) at a rate of between two and four minutes for one full revolution; see note. NOTE The rate of rotation of the mode-tuner is to be adjusted to meet the response time requirements of the monitoring instrumentation in the reference anten
14、na and the CUT signal lines. 4.4.1.1.2 Adjust the receiver to capture data at a rate of at least 3000 specimens per complete rotation of the mode-tuner. 4.4.1.1.3 As the mode-tuner slowly rotates through one full rotation, read the signal levels from the reference antenna and the signal levels from
15、the CUT. 4.4.1.1.4 Monitor the incident power level to the test chamber to ensure that it remains constant during 4.4.1.1.1 through 4.4.1.1.3. 4.4.2 The signal power levels measured may be in the form of the maximum peak level obtained from each signal channel during one full rotation of the mode-tu
16、ner; see 4.2. Copyright Electronic Components, Assemblies see 4.4. C.3 Signal source The signal source should have the following characteristics to enable the proper operation of the receiver/spectrum analyzer, and thereby enable the measurement of the low-level signals from the CUT: frequency synth
17、esizer stability, low residual frequency modulation, sufficient output level to drive the power amplifiers to rated output. Copyright Electronic Components, Assemblies see figure 1. Copyright Electronic Components, Assemblies 7.0 can be met (VSWR 2.5) is theoretically limited to the TEM mode of tran
18、smission line propagation. E.1.3 For circular connectors, the shortest wavelength for TEM propagation is approximated by the mean circumference of the annular space in the coaxial structure (equal to 4.1 GHz for a shell size 25 circular connector). NOTE The above frequency limit is a theoretical val
19、ue. In short structures (such as a standard MIL-C-38999 connector), high order modes occur at significantly higher frequencies than indicated by the theoretical limit given above. E.1.4 For rectangular connectors, the theoretical upper frequency limit is one that the internal width of the connector
20、is greater than a half-wavelength. The overall length of the CUT/adapter assembly should be kept as short as possible. NOTE Swept-frequency VSWR or transmission loss measurements may be used as an aid in determining at what frequency any non-TEM modes occur. However, the CUT/conduit adapters may mas
21、k spurious modes within the connector itself. E.2 Circular connectors E.2.1 A circular connector with an impedance-matching center conductor rod and tapered adapter is shown in figure 3. NOTE It shall be acceptable to use matching structures other than the tapered adapter to achieve the required imp
22、edance match. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 08/04/2008 03:16:33 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-364-66A Page E
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