DD-IEC-PAS-62396-2-2007.pdf
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1、DRAFT FOR DEVELOPMENT DD IEC/PAS 62396-2:2007 Process management for avionics Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems ICS 31.020; 49.060 ? Licensed Copy: London South Bank University, London South Bank University, Wed Jan 23 02:16:38 GMT
2、+00:00 2008, Uncontrolled Copy, (c) BSI DD IEC/PAS 62396-2:2007 This Draft for Development was published under the authority of the Standards Policy and Strategy Committee on 31 December 2007 BSI 2007 ISBN 978 0 580 56735 3 National foreword This Draft for Development is the UK implementation of IEC
3、/PAS 62396-2:2007. This publication is not to be regarded as a British Standard. It is being issued in the Draft for Development series of publications and is of a provisional nature. It should be applied on this provisional basis, so that information and experience of its practical application can
4、be obtained. A PAS is a Technical Specification not fulfilling the requirements for a standard, but made available to the public and established in an organization operating under a given procedure. A review of this Draft for Development will be carried out not later than three years after its publi
5、cation. Notification of the start of the review period, with a request for the submission of comments from users of this Draft for Development, will be made in an announcement in the appropriate issue of Update Standards. According to the replies received, the responsible BSI Committee will judge wh
6、ether the validity of the PAS should be extended for a further three years or what other action should be taken and pass their comments on to the relevant international committee. Observations which it is felt should receive attention before the official call for comments will be welcomed. These sho
7、uld be sent to the Secretary of the responsible BSI Technical Committee at British Standards House, 389 Chiswick High Road, London W4 4AL. The UK participation in its preparation was entrusted to Technical Committee GEL/107, Process management for avionics. A list of organizations represented on thi
8、s committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Amendments issued since publication Amd. No. DateComments Licensed Copy: London South Bank University,
9、London South Bank University, Wed Jan 23 02:16:38 GMT+00:00 2008, Uncontrolled Copy, (c) BSI IEC/PAS 62396-2 Edition 1.0 2007-09 PUBLICLY AVAILABLE SPECIFICATION PRE-STANDARD Process management for avionics Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionic
10、s systems DD IEC/PAS 62396-2:2007 Licensed Copy: London South Bank University, London South Bank University, Wed Jan 23 02:16:38 GMT+00:00 2008, Uncontrolled Copy, (c) BSI CONTENTS 1 General 3 1.1 Use of existing SEE data.3 1.2 Deciding to perform dedicated SEE tests.4 2 Availability of existing SEE
11、 data for avionics applications .4 2.1 Types of existing SEE data that may be used4 2.1.1 Sources of data, proprietary versus published data .5 2.1.2 Data based on the use of different sources6 2.1.3 Ground level versus avionics applications .9 2.2 Sources of existing data 10 3 Considerations for SE
12、E Testing11 3.1 Selection of hardware to be tested 12 3.2 Selection of test method12 3.3 Selection of facility providing energetic particles .13 3.3.1 Spallation neutron source13 3.3.2 Monoenergetic and quasi-monoenergetic beam sources14 3.3.3 Thermal neutron sources.15 4 Converting test results to
13、avionics SEE rates .15 4.1 Use of spallation neutron source .15 4.2 Use of SEU cross section curve over energy.16 Bibliography19 Figure 1 Comparison of Los Alamos and TRIUMF neutron spectra with terrestrial neutron spectrum7 Figure 2 Variation of high energy neutron SEU cross section per bit as a fu
14、nction of device feature size8 Figure 3 Comparison of mono-energetic SEU cross sections with Weibull and Piece-Wise Linear Fits18 Table 1 Sources of existing data11 DD IEC/PAS 62396-2:2007 2 Licensed Copy: London South Bank University, London South Bank University, Wed Jan 23 02:16:38 GMT+00:00 2008
15、, Uncontrolled Copy, (c) BSI PROCESS MANAGEMENT FOR AVIONICS ATMOSPHERIC RADIATION EFFECTS Part 2: Guidelines for single event effects testing for avionics systems 1 General The purpose of this PAS is to provide guidance related to the testing of microelectronic devices for purposes of measuring the
16、ir susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atm
17、ospheric neutrons in the atmosphere at aircraft altitudes. The type of SEE data available can be viewed from many different perspectives. As indicated, the SEE testing can be performed using a variety of radiation sources, all of which can induce single event effects in ICs. In addition, many tests
18、are performed on individual devices, but some tests expose an entire single board computer to radiation fields that can induce SEE effects. However, a key discriminator is deciding on whether existing SEE data is available that may be used, or whether there really is no existing data and therefore,
19、a SEE test on the device or board of interest has to be carried out. 1.1 Use of existing SEE data The simplest solution is to find previous SEE data on a specific IC device. This is not nearly as simple as it appears. First, the largest interest lies in SEE data that is directly usable for purposes
20、of estimating the SEE rate in avionics. Thus, SEE tests that have been carried out on devices using heavy ions, data which is directly applicable for space missions, is data that is not directly applicable for avionics purposes. This heavy ion SEE data can be used to calculate SEE data from high ene
21、rgy neutrons and protons by utilizing a number of different calculation methods, but this requires the active involvement of a radiation effects expert in the process. Therefore, heavy ion SEE data should not be used for application to the atmospheric neutron environment, except by scientists and en
22、gineers who have extensive experience in using this kind of data. For that reason, unless otherwise stated explicitly, when SEE data is discussed in the remainder of this PAS, it refers only to single event testing using a neutron or proton source, not to the results from testing with heavy ions. If
23、 SEE data on a device of interest is found from SEE tests using high energy neutrons or protons, it will still require expertise regarding how the data is to be utilized in order to calculate a SEE rate at aircraft altitudes. Data obtained by IC vendors for their standard application to ground level
24、 systems are often expressed in totally different units, FIT units, where one FIT is one error in 109 device hours, which is taken to apply at ground level. IC devices are constantly changing. In some cases, devices which had been tested, become obsolete and are replaced by new devices which have no
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