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1、P d a m in o v I W 0 /- -. EIA 535ABAD 87 3234600 0074022 b DETAIL S P E C I F I CAT I ON Fixed Tantalum Capacitors With Non-Solid Electrolyte And Porous Anode EIA-535ABAD ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT Copyright Electronic Components, Assemblies +,-lo%, +,-20% (see Table I
2、I) 55/85/21 85 C (see Table II) (see Table II) (see Table II) (see Table II) O ( N o reversal of voltage permitted) Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/20
3、07 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA 535ABAD 87 m 3234600 0074028 7 = EIA-535ABAD QC300202/USO004 Page 3 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001,
4、User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA 535ABAD 87 m 3234600 0074029 9 = TABLE II - STANDARD RATINGS (Continued) .-_I_- RATING CASE MAX. MAX. MAX. MAX. %CAP. (UF) ( U r ) 20 C 85 C 20 c -55 c -55 C 85 C 3.3 6
5、3.0 D 2.0 6.0 0.12 680 -25 +9 4.7 63.0 A 2.0 6.0 0.16 400 -30 +9 6.8 63.0 A 2.0 6.0 0.16 367 -30 +9 10.0 63.0 B 2.0 8.0 0.20 217 -35 +9 15.0 63.0 B 2.0 8.0 0.21 174 -35 +9 22.0 63.0 B 2.0 8.0 0.21 140 -30 +9 33.0 63.0 C 2.0 10.0 0.15 75 -35 +9 47.0 63.0 C 2.0 10.0 0.16 62 -40 +9 68.0 63.0 C 2.0 10.0
6、 0.16 51 -40 +9 CAP. WVDC SIZE DCL (UA) tan d IMP.(ohm) CHANGE FROM 20 C . 1.4 RELATED DOCUMENTS Generic Specification: IEC Publication 384-1 (1981) (QC 300000) Sectional Specification: IEC Publication 384-15 (1982) - a t (EIA-5350000) I present Document 40 (Central Office)462 ( E o o o o (EIA-535A0
7、00) 1.5 MARKING The marking of the capacitor and the packing s h a l l be i n accordance with t h e requirements of IEC Publication 384-15, Sub- c l a u s e 1.6. The following items are to be marked on t h e capacitor: a. Rated capacitance i n t h e form “XXXUF“. b. Rated DC voltage i n the form Iyy
8、yVDC“. c . Polarity i d e n t i f i c a t i o n by one or more p o s i t i v e signs near t h e positive termination. d. Tolerance code per IEC Publication 62. The code letter w i l l follow the marking of rated capacitance per i t e m a. or w i l l be on a separate l i n e . e. Date code per IEC Pu
9、blication 6 2 . f . Manufacturers name or t r a d e mark. g. Manufacturers type designation (optional) . h. Reference detail s p e c i f i c a t i o n ( o p t i o n a l ) . I I 1.6 ORDERING INFORMATION Orders f o r capacitors covered by t h i s s p e c i f i c a t i o n s h a l l contain, i n clear
10、or i n coded form, t h e following minimum information: a. Rated capacitance. b. Tolerance on rated capacitance. c. Rated d.c. voltage. d. iJurnber and issue reference of t h e d e t a i l s p e c i f i c a t i o n and s t y l e reference. Copyright Electronic Components, Assemblies & Materials Asso
11、ciation Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAD 87 m 323LIbOO 007LI030 5 m EIA-535ABAD QC300202/USOOO4 Page 5 1.7 CERTIFIED
12、RECORDS OF RELEASED LOTS Required 1.8 ADDITIONAL INFORMATION (not f o r inspection purposes) None. 1 . 9 ADDITIONAL OR INCREASED SEVERITIES OR REQUIREMENTS TO THOSE SPECIFIED I N THE GENERIC AND/OR SECTIONAL SPECIFICATION None. PART TWO - INSPECTION REQUIREMENTS 2.1 PROCEDURES 2.1.1 For Qualificatio
13、n Approval, the procedures s h a l l be i n accordance with the Sectional Specification, IEC Publication a 384-15, Sub-clause 3.4, 2.1.2 For Quality Conformance Inspection the test schedule (Table I V ) includes sampling, periodicity, severities and requirements. The formation of inspection lots is
14、covered by Sub-clause 3.5.1 of the Sectional Specification. TABLE I V N o t e 1: Clause numbers of tests and performance requirements refer to the Sectional Specification, ZEC Publication 384-15 and P a r t One of t h i s specification. Note 2: Inspection Levels and AQLs are selected from IEC Public
15、ation 410. N o t e 3: In t h i s table: P = periodicity ( i n months) n = sample s i z e C = acceptance criterion (permitted number of defectives ) D = destructive ND = non-destructive I L = inspection level (see IEC 410) AQL = acceptable quality level (see IEC 410) Copyright Electronic Components,
16、Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAD 87 H 3234600 0074033 7 E I A- 5 3 5 ABAD QC300202
17、/US0004 Page 6 TABLE IV (continued) Clause number and T e s t (see Note 1) D Conditions of I L IAQL Performance or test (see Note i) (see requirements ND Note 2 ) (see Note 1) Sub-group A l 4 . 1 Visual examination 4 . 1 Dimensions (gauging) ND s-4 2.5% 4s i n 4.1, l e g i b l e marking and as speci
18、- f i e d i n 1.5 of t h i s specifi- cation. A s specified i n Table I of t h i s specification. Sub-group A2 4.2.1 4 . 2 . 2 4.2.3 4 . 2 . 4 Leakage current Capacitance Tangent of loss angle Impedance ( i f applicable) ND Protective Resis- tance: 1000 ohms Frequency: 120Hz Frequency: 120Hz N o t A
19、 p p 1 ic ab 1 e a t 20 C II 1.0% Table II Within specified tolerance Table II Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or net
20、working permitted without license from IHS -,-,- E I A 535ABAD 87 m 3234600 0074032 9 m E I A-5 3 5 ABAD QC300202/USO004 Page 7 TABLE IV (continued) . Clause number and D Conditions of IL IAQL Performance T e s t (see Note i) or test (see Note i) (see requirements ND Note 2) (see Note i) Sub-group B
21、2 4.15 Characteristics a t high and low temperatures ( i f required) . YD rhe capacitors shall be measured it each s t e p Step 1: (+20 C) Leakage current Capacitance Tangent of loss angle tep 2: Lower (-55 C) category temperature Capacitance Tangent of loss angle Impedance Step 3: Rated temperature
22、 (+85 Cl Leakage Capacitance Current U r Tangent of loss angle 5-3 2.5% - For use as - reference value - Table II N o t applicable Table II Table II Table II Table II Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/111
23、1111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAD 87 3234b00 0074033 O EIA-535ABAD Q C 3 0 0 2 0 2 / Page 8 TABLE I V (continued) Sub-group C1A P a r t of sample of Sub-group C 1 4 . 3 . 1 I n i t i
24、a l measurement 4 . 3 Robustness of terminations 4.4 Resistance t o soldering heat 4.4.2 Final measurements D Capacitance T e s t U a Force = 10N T e s t U b ( 2 bends) T e s t U c ( 2 rotations) Visual Examination Method: Solder Bath Test Tb, Method 1A (10 +,-1s i m m e r - sion t i m e ) Visual Ex
25、amin- a t i o n - Not more than 1 defective for Subgroups Other p a r t of sample I Sub-group C1B ID 4 . 6 . 1 I n i t i a l measurement 4 . 6 Rapid change of temperature Capacitance 9 A = Lower category tempera t u r e (-55 C ) 6 9 C 1A 6 18 1 and 1 N o v i s i b l e damage and no leakage of e l e
26、c t r o l y t e N o v i s i b l e damage and no leakage of e l e c t r o l y t e Legible marking C1B combined- - Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007
27、00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAD 87 m 3234b00 0074034 2 m TABLE IV 4.6.3 Final measurements 4.7 Vibr ti n 4.7.2 Final mea sur emen ts 4.8 Bump 4.9 Shock (Sub-group C1B - continued) 0B = Upper category temperature (+85 C) 5 cycles Durati
28、on t = 30 minutes Leakage current Capacitance Tangent of loss angle Method of Mounting : see 1.1 of t h i s specification Procedure B4 Frequency Range : 10 t o 2000Hz Amplitude: 0.75 mm or acceler- ation 15g, whichever is less severe Total Duration: 6 h Visual Examination N o t Applicable Method of
29、Mounting : see 1.1 of t h i s specification Acceleration: 981 m/s/s Duration of pulse: 6 m s Rated Voltage applied EIA-53 5ABAD QC300202/USO004 Page 9 :,= 1.25 times Table II (cf-Ci)/Ci: +,- 5% of value measured in 4.6.1 / = 100M ohms N o breakdown or flashover Sub-group C3 4.12 Endurance 4 . 1 2 .
30、1 I n i t i a l mea sur ement 4.12.3 Final measurements Duration: 1000 h Ambient temperature: 1 +85 C Applied Voltage: 1 U r . Recovery: 1 6 h I Capacitance Visual examination Leakage current Capacitance Tangent of loss angle 3 24 1 Reference Value N o v i s i b l e Legible marking damage Table II (
31、Cf-Ci)/Ci: / = 15% of value measured i n 4 . 1 2 . 1 / = 1.3 t i m e s Table II Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or ne
32、tworking permitted without license from IHS -,-,- E I A 535ABAD 87 m 3234b00 0074038 T m ELA-535ABAD QC300202/USO004 Page 13 TABLE I V (continued) Clause nunber and T e s t (see Note 1) D ND or Conditions of test (see N o t e 1) Sample s i z e and c r i t e r i o n of accept- a b i l i t y (see Note
33、 3) Performance requirements (see Note 1) Sub-group C4A 4.13 Surge 4.13.1 I n i t i a l measurement 4.13.3 Final measurements D Number of cycles: 1000 Temperature:85 C Protective resistor: 1000 ohms +,-lo& Duration of charge: 30 s Duration of dis- charge: 5 min 30 s Capacitance Leakage current Capac
34、itance Tangent of loss angle Visual examination 12 3 - N o t more than 1 defective for Subgroups C4A I 12 I Sub-group C4B I D I II 4.14 Reverse voltage Not applicable ( i f required) a 6 1 and Reference Value Table II (Cf-Ci)/Ci: ,= 108 of value measured i n 4.13.1 ,= 1.3 t i m e s Table II No v i s
35、 i b l e damage and no leakage of e l e c t r o l y t e C4B combined- Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking p
36、ermitted without license from IHS -,-,- E I A 535ABAD 87 = 3234bQ0 0074039 1 ND E IA- 5 3 5ABA QC300202/USO004 Page 14 15 Clause number and T e s t (see Note 1) 1 D Conditions of or I test (see Note 1) Sample s i z e and c r i t e r i o n of accept- a b i l i t y (see Note 3 ) - PI4 Performance requ
37、irements (see Note 1) Sub-group C5 4.15 Characteristics a t high and l o w tenipera t u r e 4 . 1 6 Charge and discharge ( i f required) D N o t applicable T e s t made i n Group a2 Not applicable 6 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:27 MDTNo reproduction or networking permitted without license from IHS -,-,-
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