ECA-198-2-E-1998.pdf
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1、ANSI/ EIA- 1Q8-2-E- 19 9 7 Approved: December 12, 1997 EIA STANDARD Ceramic Dielectric Capacitors Classes I, II, III, and IV Part II: Test Methods EIA-198-2-E (Revision of EU-198-D) JANUARY 1998 ELECTRONIC INDUSTRIES ASSOCIATION ENGI“G DEPARTMEN“ NOTICE EIA Engineering Stanards and Publications are
2、designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existen
3、ce of such Standards and Publications shall not in any respect preclude any member or nonmember of EIA fiom manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than
4、 EIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it
5、 assume any obligation whatever to parties adopting the Standard or Publication. T h i s EIA Standard is considered to have International Standardization implication, but the Intemational Electrotechnkal Commission activity has not progressed to the point where a valid comparison between the EIA Sta
6、ndard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the app
7、licability of regulatory limitations before its use. (From Standards Proposal No. 3930, formulated under the cognizance of the EIA P-2.1 Subcommittee on Ceramic and Mica Dielectric.) Published by ELECTRONIC INDUSTRIES ASSOCIATION 1998 Engineering Department 2500 Wilson Boulevard Arlington, VA 2220 1
8、 PRICE: Please refer to the current Catalog of EM, JEDEC, and TIA STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada (1-800-854-7179) International (303-397-7956) Ail rights reserved Printed in U.S.A. -,-,- EIA-198-2-E Ceramic Dielectric Capacitors Classes I,
9、 I I , 1 1 1 , and IV Contents Page PART i: Characteristics and Requirements Description of changes V Forward Clarification statement 1 1 1 scope 3 1.1 Dielectric classification 1.2 Mechanical classification 1.3 Type designation 3 4 5 2 Marking 11 2.1 Leaded, coated devices 2.2 Unleaded multilayer c
10、apacitors 11 11 3 Test Sequence 15 3.1 3.2 Annex A A. 1 A.2 A.3 Annex B 6.1 8.2 8.3 Annex C c.1 c.2 c.3 c .4 c.5 Sampling plans Test requirements Other pertinent ANSI standards Scope Document sourcing Pertinent EIA and ANSIEIA documents Pertinent U.S. military standards Scope Document sourcing Perti
11、nant U.S. military specification documents Pertinent international standards Scope Document sourcing Pertinent IEC and CECC documents Pertinent EIN and JIS documents Pertinent IS0 documents 15 16 19 19 19 19 21 21 21 21 23 23 23 24 26 26 i -,-,- Eh-1 98-2-E Ceramic Dielectric Capacitors Cbsses I , I
12、 I , 1 1 1 , and N Contents (continued) Page PART II: Test Methods Description of changes Forward Clarification statement 1 Introduction 1.1 Scope 1.2 Numbering system 2 General Requirements 2.1 Test requirements 2.2 Test conditions Numerical list of test methods 3 Parametric conformance tests (1 O
13、0 class) Method 1 O 1 : Method 102: Quality factor Method 103: Method 104: Insulation resistance Method 105: Method 106: High frequency measurements Capacitance and dissipation factor Dielectric or case withstanding voltage Voltage-temperature characteristic of capacitance Environmental Derformance
14、tests (200 class) Method 201 : Method 202: Method 203: Method 204: Method 205: Method 206: Method 207: Method 208: Method 209: Method 210: Life (at elevated ambient temperature) Thermal shock Immersion Moisture resistance Humidity (steady state) Damp heat (steady state) Barometric pressure (reduced)
15、 Flammability (external flame) Seal Marking resistance to solvents iv 1 1 3 3 3 4 4 4 5 7 9 11 15 17 21 23 27 31 33 37 39 43 45 47 57 ii EIA-198-2-E Ceramic Dielectric Capacitors Classes I, II, Ill, and N Contents (continued) Page PART II: Test Methods - cont. Phwical conformance tests (300 class) M
16、ethod 301 : Solderability Method 302: Method 303: Terminal strength Method 304: Vibration, high frequency Method 305: Shock (specified pulse) Method 306: Method 307 Resistance to soldering heat Destructive physical analysis (DPA) Surface mount thermal shock Annex A A.l A.2 A.3 A.4 Annex B B.l B .2 B
17、.3 Annex C c.1 c .2 c.3 c.4 c .5 Other pertinent ANSI standards Scope Document sourcing Pertinent EIA and ANSIEIA documents Pertinent IPC documents Pertinant U.S. military standards Scope Document sourcing Pertinant U.S. military specification documents Pertinent international standards Scope Docume
18、nt sourcing Pertinent IEC and CECC documents Pertinent EIAJ and JIS documents Pertinent IS0 documents 59 67 73 79 87 97 99 1 o9 1 o9 1 o9 1 o9 Ill 113 113 113 113 115 115 115 116 117 117 iii -,-,- STD-EIA L98-2-E-ENGL 1778 D 3234b00 0587243 bb7 EIA-198-2-E Ceramic Dielectric Capacitors Classes i, II
19、, 1 1 1 , and N Contents (concluded) Page Part 1 1 1 : individual Specifications Description of changes V Forward Clarification statement 1 1 1 Individual product specifications 3 Annex A A. 1 A.2 A.3 Annex B B.l 8.2 8.3 Annex C c.1 c.2 c.3 c .4 c.5 Section 1 Section 2 Section 3 Section 4 Section 5
20、Section 6 Section 7 Section 8 Section 9 Other pertinent ANSI specificaons Scope Document sourcing Pertinent EIA and ANSEIA documents Pertinent U.S. military standards scope Document sourcing Pertinent US. military specification documents Other international documents scope Document sourcing Pernent
21、IEC and CECC documents Pertinent EIN and JIS documents Pertinent IS0 documents Radial-leaded, disc capacitors Radial-leaded 500 V tubular capacitors Unleaded multilayer chip capacitors Radial-leaded, conformally coated capacitors Radial-leaded, molded capacitors Axial-leaded, conformally coated capa
22、citors Axial-leaded, glass encapsulated capacitors Two-pin, dual-in-line, encapsulated capacitors High voltage, multilayer capacitors iv 5 5 5 5 9 9 9 9 11 11 11 12 1 3 1 3 - - - - - - - -,-,- STD-EIA 198-2-E-ENGL 1998 m 3234b00 0587244 5T3 I Title Page: Modify Part II title. Part II General: Add me
23、thod number and title to each page of all test methods; correct various typographical errors . Part II General: Redraw Figures as graphics files. Spec # - 1 Rev Tit1 e 2/24/97 All 2/24/97 Var. 2/24/97 EIA-198-E EIA-198-E Add new section2.2.1 Sample Conditioning with deaging requirements. At 2.2 defi
24、ne room temperature. EIA-198-E EIA-198-E I EIA-198-E 4 EIA-198-E EIA-198-E EIA-198-E Method 105: add note at 2.4 note that cap shall be measured per voltage and frequency specified in Method 101. Update 2.3 requirements to match those on page 4. Method 201 : Delete reference to English units at 3.2
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