ECA-EIA-364-107-2000.pdf
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1、EIA STANDARD TP-107 Eye Pattern and Jitter Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems EIA-364-107 MAY 2000 ELECTRONIC COMPONENTS, ASSEMBLIES see figure B.5. 4.3.1.4 DSO, manual method Copyright Electronic Components, Assemblies see figure B.6. 4.3.
2、1.4.2 Read the jitter value from the delta (distance between) the cursor positions. 4.3.2 Method D, pulse test, (single pattern) 4.3.2.1 Set the generator for a DC balanced test pattern. This shall be a square wave or PRBS pattern at the specified frequency. 4.3.2.2 Set the oscilloscope to infinite
3、persistence display mode, and adjust the vertical position to center the waveform vertically on the display, with half amplitude at center screen. 4.3.2.3 Adjust the generator to produce the specified test pattern. This pattern may be chosen to simulate a long idle sequence, and is specific to the d
4、ata pattern to be used in the application. It is typically a pattern of a logic “1” followed by twenty or more logic “0”s. For single ended measurements: measure the logic “1“ and logic “0“ levels, and adjust the generator if necessary to ensure the half amplitude of the waveform is still at center
5、screen. For differential measurements: measure the logic “1“ and logic “0“ levels of both channels. Adjust the generator to minimize the offset in voltage or time between channels. If any voltage offset is present between channels, the amount of offset shall be added to or subtracted from (as approp
6、riate) the half-amplitude measurement point for the pulse width in 4.3.2.4. 4.3.2.4 Measure the width of the pulse that crosses the half-amplitude point (center screen), using cursors or oscilloscope measurement functions; see figure B.7. 4.3.2.5 Subtract the half-amplitude pulse width measured in 4
7、.3.2.4 from the bit time (1 divided by the clock frequency of the generator) to obtain the jitter. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Signal rise time, amplitude, and clock frequency 5.2 Data pattern; e.g., a (223-1) for PRBS or a 1+(2
8、0x0) for pulse pattern 5.3 Single-ended or differential 5.4 Termination value (and tolerances) 5.5 Signal/ground pattern, including the number and location of signal and grounds to be wired for this test Copyright Electronic Components, Assemblies see figure B.1. Figure B.1 - Typical eye pattern res
9、ponse B.1.2 Historically the eye pattern has been used as a qualitative measurement tool. Modern digital storage oscilloscopes permit the eye pattern to be used as a quantitative measurement tool. The open area in the center of an eye pattern pulse is an indicator of data transmission quality. The l
10、arger the eye opening, the better the quality of transmission, i.e. the lower the bit error rate. Copyright Electronic Components, Assemblies see figure B.2. The greater the eye height, the lower is the probability that a “1” and “0” will be confused. Figure B.2 - Eye pattern response showing eye he
11、ight and eye width B.1.4 The opening at the center of the eye between the adjacent vertical transitions at the edges of the pulse is called the “eye width”; see figure B.2. The larger the eye width, the less likely there will be an error when the digital signal is read (sampled and decoded) by the r
12、eceiver circuitry to determine the instantaneous binary value. Errors occur when either the eye height or eye width is sufficiently small to confuse the receiver circuitry. B.1.5 The eye pattern is typically generated using a PRBS to simulate normal random data. A specific worst-case word pattern ca
13、n also be used to explore pattern dependent effects. Copyright Electronic Components, Assemblies no energy should fall within the mask. An eye pattern having sufficient opening so that no part of the signal falls within the mask area typically indicates reliable, error- free transmission; see figure
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