IEC-61000-4-33-2005.pdf
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1、 INTERNATIONAL STANDARD IEC 61000-4-33 First edition 2005-09 Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters Reference number IEC 61000-4-33:2005(E) BASIC EMC PUBLICATION Publication numbering As from 1 January
2、 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the
3、base publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current tech
4、nology. Information relating to this publication, including its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee w
5、hich has prepared this publication, as well as the list of publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text
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7、ble by email. Please contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 9
8、19 03 00 INTERNATIONAL STANDARD IEC 61000-4-33 First edition 2005-09 Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or uti
9、lized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919
10、 03 00 E-mail: inmailiec.ch Web: www.iec.ch For price, see current catalogue PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission XB BASIC EMC PUBLICATION 2 61000-4-33 ? IEC:2005(E) CONTENTS FOREWORD4 INTRODUCTION 6 1Scope7 2Normative references7 3Terms and
11、 definitions8 4Measurement of high-power transient responses .9 4.1Overall measurement concepts and requirements9 4.2Representation of a measured response. 12 4.3Measurement equipment. 12 4.4Measurement procedures 27 5Measurement of low frequency responses. 27 6Calibration procedures 28 6.1Calibrati
12、on of the entire measurement channel 28 6.2Calibration of individual measurement channel components . 31 6.3Approximate calibration techniques 37 Annex A (normative) Methods of characterizing measured responses . 40 Annex B (informative) Characteristics of measurement sensors 45 Annex C (normative)
13、HPEM measurement procedures 59 Annex D (informative) Two-port representations of measurement chain components 62 Bibliography. 69 Figure 1 Illustration of a typical instrumentation chain for measuring high-power transient responses 10 Figure 2 Illustration of a balanced sensor and cable connecting t
14、o an unbalanced (coaxial) line where Iout + Iin = I1. 16 Figure 3 Examples of some simple baluns 4b . 18 Figure 4 A typical circuit for an in-line attenuator in the measurement chain. 18 Figure 5 Illustration of the typical attenuation of a nominal 20 dB attenuator for a 50? system, as a function of
15、 frequency. 19 Figure 6 Typical circuit diagram for an in-line integrator. 20 Figure 7 Plot of the transfer function of the integrating circuit of Figure 6. 20 Figure 8 Illustration of the frequency dependent per-unit-length signal transmission of a standard coaxial cable, and a semi-rigid coaxial l
16、ine 21 Figure 9 Illustration of sensor cable routing in regions not containing EM fields 24 Figure 10 Treatment of sensor cables when located in a region containing EM fields 25 Figure 11 Conforming cables to local system shielding topology. 26 Figure 12 Correct and incorrect methods of cable routin
17、g. 27 Figure 13 The double-ended TEM Cell for providing a uniform field illumination for probe calibration 29 Figure 14 Illustration of the single-ended TEM cell and associated equipment 30 Figure 15 Dimensions of a small test fixture for probe calibration 30 61000-4-33 ? IEC:2005(E) 3 Figure 16 Ele
18、ctrical representation of a measurement chain, (a) with the E-field sensor represented by a general Thevenin circuit, and (b) the Norton equivalent circuit for the same sensor 31 Figure 17 Example of a simple E-field probe. 34 Figure 18 Plot of the real and imaginary parts of the input impedance, Zi
19、, for the E- field sensor of Figure 17 34 Figure 19 Plot of the magnitude of the short-circuit current flowing in the sensor input for different angles of incidence, as computed by an antenna analysis code. 35 Figure 20 Plot of the magnitude of the effective height of the sensor for different angles
20、 of incidence. 36 Figure 21 High frequency equivalent circuit of an attenuator element 39 Figure A.1 Illustration of various parameters used to characterize the pulse component of a transient response waveform R(t) 41 Figure A.2 Illustration of an oscillatory waveform frequently encountered in high-
21、 power transient EM measurements. 41 Figure A.3 Example of the calculated spectral magnitude of the waveform of Figure A.2 . 44 Figure B.1 Illustration of a simple E-field sensor, together with its Norton equivalent circuit 46 Figure B.2 Magnitude and phase of the normalized frequency function)( ?F
22、for the field sensor 47 Figure B.3 Illustration of a simple B-field sensor, together with its Thevenin equivalent circuit 49 Figure B.4 Illustration of an E-field sensor over a ground plane used for measuring the vertical electric field, or equivalently, the surface charge density 50 Figure B.5 Illu
23、stration of the half-loop B-dot sensor used for measuring the tangential magnetic field, or equivalently, the surface current density 52 Figure B.6 Simplified concept for measuring wire currents . 53 Figure B.7 Construction details of a current sensor . 54 Figure B.8 Example of the measured sensor i
24、mpedance magnitude of a nominal 1 ? current sensor 55 Figure B.9 Geometry of the in-line I-dot current sensor 55 Figure B.10 Design concept for a coaxial cable current sensor . 56 Figure B.11 Shape and dimensions of a CIP-10 coaxial cable current sensor. 57 Figure B.12 Configuration of a coaxial cab
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