IEEE-1445-1998-R2004.pdf
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1、 The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1999 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 March 1999. Printed in the United States of America. Print: ISBN 0-7381-1553
2、-3 SH94715 PDF: ISBN 0-7381-1554-1 SS94715 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF) Sponsor IEEE Standa
3、rds Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 8 December 1998 IEEE-SA Standards Board Abstract: The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic
4、 test equipment (ATE) for board-level printed circuit assemblies are dened. This information can be broadly grouped into data that denes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe. Keywords: automatic test equipment (ATE), digital automated test program generator (D
5、ATPG), digital test interchange format (DTIF), Fault Dictionary data Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:45:02 MDTNo reproduction or networking permit
6、ted without license from IHS -,-,- IEEE Std 1445-1998(R2004) Reaffirmed 25 March 2004 IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Com- mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees serve voluntarily
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18、to the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:45:02 MDTNo reproduction or net
19、working permitted without license from IHS -,-,- Copyright 1999 IEEE. All rights reserved. iii Introduction This introduction is not part of IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF). A digital automated test program generator (DATPG) produces test pattern and diag
20、nostic data that can be used for testing printed circuit assemblies on automatic test equipment (ATE). The use of several DATPGs, all with individual output formats, created a need for many unique post-processors to be developed and maintained for the life of the ATE. These post-processors supported
21、 the link from specic DATPGs to specic testers. The proliferation of unique formats and post-processors created logistical support problems and therefore identied a need for standardization. A DATPG and ATE independent output data format is required to limit the number of post-processors (one for ea
22、ch ATE) requiring life cycle support. The digital test interchange format (DTIF) was chosen because of its wide use and because it was becoming known in industry as the de facto standard. This document provides the basis to standardize digital test information for use on ATE. The digital test inform
23、ation consists of the unit under test (UUT) Model information, Stimulus and Response data, Fault Dictionary data, and Probe data. DTIF is unique from other standards such as IEEE P1450 (Draft 0.95, dated July 1998), 1 Draft Standard Test Interface Language (STIL) for Digital Test Vector Data, and IE
24、EE Std 1029.1-1991, IEEE Standard for Waveform and Vector Exchange Specication (WAVES). STIL is being developed to standardize the output interface of existing computer-aided engineering (CAE) tools with the input interface of ATE for integrated circuit (IC) testing only. WAVES is a hardware descrip
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