IEC-TR-62240-2005.pdf
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1、 TECHNICAL REPORT IEC TR 62240 First edition 2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified temperature range Reference number IEC/TR 62240:2005(E) Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee
2、=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 20:19:48 MSTNo reproduction or networking permitted without license from IHS -,-,- Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now
3、 referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publication incorporating am
4、endments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity, is available in the IEC Catalogu
5、e of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the
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8、vice Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicense
9、e=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 20:19:48 MSTNo reproduction or networking permitted without license from IHS -,-,- TECHNICAL REPORT IEC TR 62240 First edition 2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified
10、 temperature range PRICE CODE IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnic
11、al Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch XA For price, see current catalogue Commission Electrotechnique Internationale International Electrotechnical Commission Copyright In
12、ternational Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 20:19:48 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 TR 62240 IEC:2005(E) 5 CONTENTS FOREWORD.4 INTRODUCTION.6
13、 1 Scope.7 2 Normative references .7 3 Terms and definitions .7 4 Objectives 10 5 Using devices outside the manufacturers specified temperature ranges.10 5.1 Device selection, usage and alternatives.10 5.2 Device capability assessment12 5.3 Device quality assurance in wider temperature ranges 15 5.4
14、 Documentation 16 5.5 Device identification 16 Annex A (informative) Device parameter re-characterisation19 A.1 Glossary of Symbols19 A.2 Rationale for parameter re-characterisation .20 A.3 Capability assurance .21 A.4 Quality assurance28 A.5 Factors to be considered in parameter re-characterisation
15、.28 A.6 References 30 Annex B (informative) Stress balancing .32 B.1 General .32 B.2 Glossary of symbols 32 B.3 Stress balancing33 B.4 Application example.36 B.5 Other notes39 Annex C (informative) Parameter conformance assessment.42 C.1 General .42 C.2 Test plan .42 Annex D (informative) Higher ass
16、embly level testing49 D.1 General .49 D.2 Process .49 Bibliography52 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 20:19:48 MSTNo reproduction or networking permitted without l
17、icense from IHS -,-,- TR 62240 IEC:2005(E) 3 Figure 1 Flow chart for semiconductor devices in wider temperature ranges 17 Figure 2 Report form for documenting device usage in wider temperature ranges18 Figure A.1 Parameter re-characterisation.20 Figure A.2 Flow diagram of parameter re-characterisati
18、on capability assurance process.23 Figure A.3 Margin in electrical parameter measurement based on the results of sample test.26 Figure A.4 Schematic diagram of parameter limit modifications27 Figure A.5 Parameter Re-Characterisation Part Quality Assurance 28 Figure A.6 Schematic of outlier products
19、that may invalidate sample testing 29 Figure A.7 Example of intermediate peak of an electrical parameter: voltage feedback input threshold change for Motorola MC34261 power factor controller 4 30 Figure A.8 Report form for documenting device parameter re-characterisation.31 Figure B.1 Iso-TJ curve:
20、the relationship between ambient temperature and dissipated power.34 Figure B.2 Graph of electrical parameters versus dissipated power .35 Figure B.3 Iso-TJ curve for the Fairchild MM74HC244 .38 Figure B.4 Power versus frequency curve for the Fairchild MM74HC24439 Figure B.5 Flow chart for stress ba
21、lancing .40 Figure B.6 Report form for documenting stress balancing 41 Figure C.1 Relationship of temperature ratings, requirements and margins43 Figure C.2 Typical Fallout Distribution versus Treq-max45 Figure C.3 Parameter conformance assessment flow.47 Figure C.4 Report form for documenting param
22、eter conformance testing .48 Figure D.1 Flow chart of higher level assembly testing.50 Figure D.2 Report form for documenting higher level assembly test at temperature extremes.51 Table A.1 Example of sample size calculation24 Table A.2 Parameter re-characterisation example: SN74ALS244 Octal Buffer/
23、Driver .27 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 20:19:48 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 TR 62240 IEC:2005(E) 5 INTERNATION
24、AL ELECTROTECHNICAL COMMISSION _ PROCESS MANAGEMENT FOR AVIONICS USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS SPECIFIED TEMPERATURE RANGE FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical com
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