IEC-61338-1-4-2005.pdf
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1、 INTERNATIONAL STANDARD IEC 61338-1-4 First edition 2005-11 Waveguide type dielectric resonators Part 1-4: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency Reference number IEC 61338-1-4:2005(E
2、) Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:46:21 MSTNo reproduction or networking permitted without license from IHS -,-,- Publication numbering As from 1 January 1997
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8、 email. Please contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03
9、00 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:46:21 MSTNo reproduction or networking permitted without license from IHS -,-,- INTERNATIONAL STANDARD IEC 61338-1-4 First e
10、dition 2005-11 Waveguide type dielectric resonators Part 1-4: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency IEC 2005 Copyright - all rights reserved No part of this publication may be reprod
11、uced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax:
12、 +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch V For price, see current catalogue PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1
13、111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:46:21 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 61338-1-4 ? IEC:2005(E) CONTENTS FOREWORD4 1Scope and object6 2Normative references6 3Measurement parameter7 4Dielectric rod resonator method excited by NRD-gu
14、ide .8 4.1Measurement equipment and apparatus .8 4.2Theory and calculation equations. 11 4.3Measurement procedure . 16 4.4Example of measurement result. 19 5Cut-off waveguide method excited by coaxial cables with small loops 21 5.1Measurement equipment and apparatus . 21 5.2Theory and calculation eq
15、uations. 23 5.3Measurement procedure . 28 Annex A (informative) Errors on r ? caused by air gap between dielectric specimen and upper conducting plate . 30 Annex B (informative) Derivation of equation (15) for r ? 31 Bibliography. 33 Figure 1 Schematic diagram of measurement equipment .8 Figure 2 Me
16、asurement apparatus of dielectric rod resonator method excited by NRD-guide.9 Figure 3 Waveguide transducer from NRD-guide to waveguide. 11 Figure 4 Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel conducting plates 12 Figure 5 Calculations of 2 u
17、andW as a function of 2 v for TE011, TE021 and TE031 resonance modes. 13 Figure 6 Configuration of reference dielectric resonator for measurement of r ? of conducting plates . 15 Figure 7 Diameter d of TE011, TE021 and TE031 mode resonators with resonance frequency of 60 GHz. 18 Figure 8 Diameter d
18、of TE011, TE021 and TE031mode resonators with resonance frequency of 77 GHz. 19 Figure 9 Example of TE021mode resonant peak . 20 Figure 10 Measurement result of temperature dependence of 0 f and? of sapphire 21 Figure 11 Measurement apparatus for cut-off waveguide method 22 Figure 12 Frequency respo
19、nse for the empty cavity with dimensions of d = 7 mm and h = 31 mm . 24 Figure 13 Correction term a ?/? 26 Figure 14 Correction termsAA/? andBB/?. 27 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for
20、 Resale, 03/10/2007 02:46:21 MSTNo reproduction or networking permitted without license from IHS -,-,- 61338-1-4 ? IEC:2005(E) 3 Figure 15 Measurement apparatus for temperature coefficient of relative permittivity 28 Figure 16 Mode chart of TE011 and TE013 modes for an empty cavity 29 Figure A.1 Err
21、or on? caused by air gap between dielectric specimen and upper conducting plates . 30 Table 1 Diameter of conducting plate. 10 Table 2 Dimension of dielectric strip of NRD-guide 10 Table 3 Dimensions of waveguide transducer . 10 Table 4 Dimensions of reference sapphire resonators and their partial e
22、lectric energy filling factor Pe and geometric factor G . 15 Table 5 Diameter d of test specimens for 60 and 77 GHz measurement. Height h is fixed to 2,25 mm and 1,80 mm for 60 GHz and 77 GHz measurement, respectively. 17 Table 6 Measurement results of r ? of conducting plates 20 Table 7 Measurement
23、 results of? and tan? of sapphire and PTFE specimen. 20 Table 8 Recommended dimensions for conducting cylinder 23 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:46:21 MSTNo r
24、eproduction or networking permitted without license from IHS -,-,- 4 61338-1-4 ? IEC:2005(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ WAVEGUIDE TYPE DIELECTRIC RESONATORS Part 1-4: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator
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