IEC-62431-2008.pdf
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1、 IEC 62431 Edition 1.0 2008-07 INTERNATIONAL STANDARD Reflectivity of electromagnetic wave absorbers in millimetre wave frequency Measurement methods IEC 62431:2008(E) Copyright International Electrotechnical Commission Provided by IHS under license with IEC Licensee=Boeing Co/5910770001 Not for Res
2、ale, 07/25/2008 02:45:07 MDT -,-,- THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
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4、ember National Committee for further information. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Stand
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9、e Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright International Electrotechnical Commission Provided by IHS under license with IEC Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 02:45:07 MDT No reproduction or networking permitted without l
10、icense from IHS IEC 62431 Edition 1.0 2008-07 INTERNATIONAL STANDARD Reflectivity of electromagnetic wave absorbers in millimetre wave frequency Measurement methods INTERNATIONAL ELECTROTECHNICAL COMMISSION XA ICS 19.080; 17.120; 29.120.10 PRICE CODE ISBN 2-8318-9895-1 Registered trademark of the In
11、ternational Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IEC Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 02:45:07 MDT -,-,- 2 62431 IEC:2008(E) CONTENTS FOREWORD.5 1 Scope.7 2 Normative references .7 3 Terms, definiti
12、ons and acronyms 7 3.1 Terms and definitions7 3.2 Acronyms and symbols10 4 Specimen .12 4.1 Specimen specification12 4.2 Reference metal plate .12 4.2.1 Material and thickness.12 4.2.2 Surface roughness 12 4.2.3 Flatness 12 4.2.4 Size and shape12 4.3 Reference specimen for calibration .12 5 Specimen
13、 holder 13 6 Measurement equipment 13 6.1 Type of network analyzer 13 6.2 Antenna 13 6.2.1 Horn antenna.13 6.2.2 Lens antenna.13 6.3 Amplifier13 6.4 Cable 14 7 Measurement condition 14 7.1 Temperature and environment.14 7.2 Warming up of measurement equipment14 7.3 Electromagnetic environment 14 8 C
14、alibration of measurement system and measurement conditions 14 8.1 Calibration of measurement system.14 8.2 Measurement conditions14 8.2.1 Dynamic range 14 8.2.2 Setting up of the network analyzer for keeping adequate dynamic range.14 9 Horn antenna method .15 9.1 Measurement system 15 9.1.1 Configu
15、ration of the measurement system .15 9.1.2 Horn antenna.16 9.1.3 Specimen holder16 9.1.4 Mounting of the specimen18 9.1.5 Antenna stand .18 9.2 Measurement conditions18 9.2.1 Measurement environment 18 9.2.2 Measuring distance .18 9.2.3 Size of specimen .18 9.3 Measurement procedures19 10 Dielectric
16、 lens antenna method focused beam method 20 10.1 Outline 20 Copyright International Electrotechnical Commission Provided by IHS under license with IEC Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 02:45:07 MDT No reproduction or networking permitted without license from IHS 62431 IEC:2008
17、(E) 3 10.2 Measurement system 20 10.2.1 Transmitting and receiving antennas .20 10.2.2 Focused beam horn antenna .21 10.2.3 Specimen size .22 10.2.4 Reference metal plate size 22 10.2.5 Specimen holder22 10.2.6 Method of fixing the specimen and the reference metal plate.23 10.3 Measurement procedure
18、s23 11 Dielectric lens antenna method parallel beam method .25 11.1 Principle25 11.1.1 Outline 25 11.1.2 Parallel EM wave beam formed using a EM wave lens.25 11.2 Measurement system 26 11.2.1 Composition of measurement system 26 11.2.2 Dielectric lens antenna 29 11.3 Specimen 29 11.3.1 General .29 1
19、1.3.2 Reference metal plate .29 11.3.3 Size of specimen .30 11.4 Measurement procedures30 11.4.1 Normal incidence.30 11.4.2 Oblique Incidence30 12 Test report31 Annex A (informative) Reflection and scattering from metal plate Horn antenna method .33 Annex B (informative) Reflectivity of reference sp
20、ecimens using horn antenna method38 Annex C (informative) Specifications of commercially available antennas 39 Annex D (normative) Calibration using VNA.42 Annex E (informative) Dynamic range and measurement errors .51 Annex F (informative) Enlargement of dynamic range Calibration by isolation.53 An
21、nex G (informative) Relative permittivity of styrofoam and foamed polyethylene based on foam ratio 54 Annex H (informative) Calculation of Fraunhofer region Horn antenna method.55 Figure 1 Definition of reflectivity.10 Figure 2 Configuration of the measurement system normal incidence (S11).15 Figure
22、 3 Configuration of the measurement system oblique incidence (S21) 16 Figure 4 Mounting method of specimen17 Figure 5 The mechanism of adjusting azimuth and elevation17 Figure 6 Measurement system for normal incidence (side view).20 Figure 7 Measurement system for oblique incidence (top view)21 Figu
23、re 8 Structure of a dielectric lens antenna .22 Figure 9 Structure of specimen holder23 Figure 10 EM wave propagation using a horn antenna and a dielectric lens.26 Figure 11 Block diagram of the measurement system 27 Figure 12 A measurement system for normal incidence .28 Copyright International Ele
24、ctrotechnical Commission Provided by IHS under license with IEC Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 02:45:07 MDT -,-,- 4 62431 IEC:2008(E) Figure 13 Measurement system for oblique incidence 28 Figure 14 Position of a shielding plate .29 Figure 15 Items to be mentioned in a test
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