IEEE-325-1996-R2002.pdf
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1、 Recognized as an American National Standard (ANSI) The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1997 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1997. Printed in the United
2、States of America ISBN 1-55937-885-9 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 325-1996(R2002) (Revision of IEEE Std 325-1986) IEEE Standard Test Procedures for Germanium
3、Gamma-Ray Detectors Sponsor Nuclear Instruments and Detectors Committee of the IEEE Nuclear and Plasma Sciences Society Reaffirmed 11 September 2002 Approved 18 October 2002 IEEE Standards Board Approved 6 January 1997 American National Standards Institute Abstract: Terminology and standard test pro
4、cedures for germanium radiation detectors that are used for the detection and high-resolution spectrometry of gamma rays, X rays, and charged parti- cles that produce hole-electron pairs in the crystal lattice are established so they have the same meaning to both manufacturers and users. Keywords: g
5、amma rays, germanium radiation detectors, X rays Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:12:35 MDTNo reproduction or networking permitted without license
6、from IHS -,-,- IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinat- ing Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed wi
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16、educational class- room use can also be obtained through the Copyright Clearance Center. Note: Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to
17、 the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention.
18、Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:12:35 MDTNo reproduction or networking permitted without license from IHS -,-,- iii Introduction (This introductio
19、n is not part of IEEE Std 325-1996, IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors.) IEEE Std 325-1996 provides standard test procedures for germanium gamma-ray detectors for ionizing radi- ation. It is a revision of IEEE Std 325-1986, updated to bring it into line with current prac
20、tices and technol- ogy. The revision was approved by the Nuclear Instruments and Detectors Committee (NIDC) of the IEEE Nuclear and Plasma Sciences Society and by the Accredited Standards Committee on Nuclear Instrumenta- tion of the American National Standards Institute. The previous revision of th
21、is standard, published as ANSI/ IEEE 325-1986, combined and updated ANSI/IEEE Std 325-1971, ANSI/IEEE Std 645-1987, and ANSI/ IEEE Std 680-1980. Companion documents are IEEE Std 300-1988 (Reaff 1993), IEEE Standard Test Procedures for Semicon- ductor Charged-Particle Detectors (ANSI); IEEE Std 301-1
22、988 (Reaff 1993), IEEE Standard Test Proce- dures for Amplifi ers and Preamplifi ers Used with Detectors of Ionizing Radiation (ANSI); and IEEE Std 759-1984 (Reaff 1990), IEEE Test Procedures for Semiconductor X-Ray Energy Spectrometers (ANSI). At the time it approved this standard, the NIDC had the
23、 following membership: Sanford Wagner, Chair Louis Costrell, Secretary Edward Fairstein and Sanford Wagner served as project leaders for the development of this standard. David J. Allard Martin L. Bauer Joseph G. Bellian William M. Bugg Christopher Cox Larry Darken W. Kenneth Dawson John Detko Edwar
24、d Fairstein Ronald M. Keyser Frederick A. Kirsten Glenn F. Knoll Hobard W. Kraner G. Laurie Miller Dennis E. Persyk Paul L. Phelps Donald E. Stilwell Kenneth L. Swinth James H. Trainor Michael Unterweger John Walter Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IH
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