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1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61069-7 Premire dition First edition 1999-05 Mesure et commande dans les processus industriels Apprciation des proprits dun systme en vue de son valuation Partie 7: Evaluation de la scurit dun systme Industrial-process measurement and control Evalu
2、ation of system properties for the purpose of system assessment Part 7: Assessment of system safety Numro de rfrence Reference number CEI/IEC 61069-7:1999 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie No
3、t for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- Numros des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE
4、I incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le conten
5、u technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux
6、en cours entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Site web de la CEI* Catalogue des publications de la CEI Publi annuellement et mis jour rgulirement (Catalogue en ligne)* Bulletin de la C
7、EI Disponible la fois au site web de la CEI* et comme priodique imprim Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CEI 60050: Vocabulaire Electro- technique International (VEI). Pour les symboles graphiques, les symboles littrau
8、x et les signes dusage gnral approuvs par la CEI, le lecteur consultera la CEI 60027: Symboles littraux utiliser en lectrotechnique, la CEI 60417: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CEI 60617: Symboles graphiques pour schmas.
9、 * Voir adresse site web sur la page de titre. Numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 a
10、nd 1.2 refer, respectively, to the base publication, the base publication incor- porating amendment 1 and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the con
11、tent reflects current technology. Information relating to the date of the reconfirmation of the publication is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as th
12、e list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogue of IEC publications Published yearly with regular updates (On-line catalogue)* IEC Bulletin Available both at the IEC web site* and as a printed periodical Terminology, graphical and letter symbols Fo
13、r general terminology, readers are referred to IEC 60050: International Electrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC
14、60417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for diagrams. * See web site address on title page. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111
15、111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61069-7 Premire dition First edition 1999-05 Mesure et commande dans les processus industriels Apprciation des p
16、roprits dun systme en vue de son valuation Partie 7: Evaluation de la scurit dun systme Industrial-process measurement and control Evaluation of system properties for the purpose of system assessment Part 7: Assessment of system safety Commission Electrotechnique Internationale International Electro
17、technical Commission Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 1999 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mca
18、nique, y compris la photo-copie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Elec
19、trotechnical Commission3, rue de Varemb Geneva, Switzerland Telefax: +41 22 919 0300e-mail: inmailiec.ch IEC web site http:/www.iec.ch CODE PRIX PRICE CODER Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie
20、Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 61069-7 CEI:1999 SOMMAIRE Pages AVANT-PROPOS . 4 INTRODUCTION 8 Clause 1 Domaine dapplication 12 2 Rfrences normatives. 12 3 Dfinitions 14 4 Proprit de scurit 14 4.1 Gnralits . 14 4.2 Type
21、s de dangers . 16 4.3 Rcepteurs des consquences dun danger. 18 4.4 Chemins de propagation . 22 4.5 Mesures visant rduire le risque. 22 5 Examen critique du cahier des charges du systme (CdC) 24 6 Examen critique du cahier des spcifications du systme (CdS) . 24 7 Procdure dvaluation. 26 7.1 Gnralits
22、. 26 7.2 Analyse du cahier des charges et du cahier des spcifications du systme 26 7.3 Conception du programme dvaluation. 28 7.4 Programme dvaluation 30 8 Techniques dapprciation 30 8.1 Gnralits . 30 8.2 Techniques analytiques dapprciation 32 8.3 Techniques empiriques dapprciation. 32 9 Excution de
23、 lvaluation et rdaction du rapport dvaluation. 34 Annexe A (informative) Bibliographie 36 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networkin
24、g permitted without license from IHS -,-,- 61069-7 IEC:1999 3 CONTENTS Page FOREWORD 5 INTRODUCTION 9 Clause 1Scope 13 2Normative references. 13 3Definitions 15 4Safety property. 15 4.1General. 15 4.2Kinds of hazards . 17 4.3Receivers of the consequences of a hazard. 19 4.4Propagation paths. 23 4.5R
25、isk reduction measures. 23 5Review of the system requirement document (SRD) 25 6Review of the system specification document (SSD). 25 7Assessment procedure. 27 7.1General. 27 7.2Analysis of the system requirement document and specification document. 27 7.3Designing the assessment programme 29 7.4Ass
26、essment programme 31 8Evaluation techniques 31 8.1General. 31 8.2Analytical evaluation techniques 33 8.3Empirical evaluation techniques 33 9Execution and reporting of the assessment. 35 Annex A (informative) Bibliography . 37 Copyright International Electrotechnical Commission Provided by IHS under
27、license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 61069-7 CEI:1999 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ MESURE ET COMMANDE DANS LES PROCESSUS INDUSTRIELS APPRCIAT
28、ION DES PROPRITS DUN SYSTME EN VUE DE SON VALUATION Partie 7: Evaluation de la scurit dun systme AVANT-PROPOS 1)La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI).
29、La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales. Leur laboration est confie des comits dtudes, aux travaux desque
30、ls tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des co
31、nditions fixes par accord entre les deux organisations. 2)Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsentent, dans la mesure du possible un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit
32、 dtudes. 3)Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, rapports techniques ou guides et agrs comme tels par les Comits nationaux. 4)Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent ap
33、pliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes nationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5)La CEI na fi
34、x aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un matriel est dclar conforme lune de ses normes. 6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit
35、 intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CEI 61069-7 a t tablie par le sous-comit 65A: Aspects systmes, du comit dtudes 65: Mesure et comma
36、nde dans les processus industriels. Le texte de cette norme est issu des documents suivants: FDISRapport de vote 65A/280/FDIS65A/283/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Lannexe A est donne uniquement ti
37、tre dinformation. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- 61069-7 IEC:1999 5 INTERNATIO
38、NAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL EVALUATION OF SYSTEM PROPERTIES FOR THE PURPOSE OF SYSTEM ASSESSMENT Part 7: Assessment of system safety FOREWORD 1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization compris
39、ing all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International
40、 Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The
41、 IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2)The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus
42、 of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3)The documents produced have the form of recommendations for international use and are published in the form of standards, technical reports or guides and they are accepte
43、d by the National Committees in that sense. 4)In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the c
44、orresponding national or regional standard shall be clearly indicated in the latter. 5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6)Attention is drawn to the possibility t
45、hat some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61069-7 has been prepared by subcommittee 65A: System aspects, of IEC technical committee 65: I
46、ndustrial-process measurement and control. The text of this standard is based on the following documents: FDISReport on voting 65A/280/FDIS65A/283/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annex A is for in
47、formation only. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:48:32 MSTNo reproduction or networking permitted without license from IHS -,-,- 6 61069-7 CEI:1999 La CEI 61069 comprend les parties suivantes, prsentes sous le titre gnral: Mesure et commande dans les processus industriels Apprciation des proprits dun systme en vue de son valuation: Partie 1: Considrations gnrales et mthodologie Partie 2: Mthodologie
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