IEEE-1450.3-2007.pdf
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1、IEEE Std 1450.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Tester Target Specification IEEE 3 Park Avenue New York, NY 10016-5997, USA 7 September 2007 IEEE Computer Society Sponsored by the Test Technology Standards Committee 1450.3 TM Copy
2、right The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Elect
3、rical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE 1450
4、.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450TM-1999) for Tester Target Specification Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 24 August 2007 American National Standards Institute Approved 8 March 2007 IEEE SA-
5、Standards Board Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institut
6、e of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 7 September 2007. Printed in the United States of America. IEEE is a registered trademark in the U.
7、S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS
8、Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- ivCopyright 2007 IEEE. All rights reserved. Introduction STIL is a collection of standards with the base standard being 1450 and the dotted extensions
9、 used to define additional syntax for addressing additional areas; i.e., this standard addresses tester rules. The extensions follow the same conventions as the base standard. The base and the extensions are developed so as to work together; i.e., STIL is a single language that is defined (and has b
10、een developed) as separate IEEE standards. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations C
11、urrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no p
12、osition is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal valid
13、ity or scope of those patents that are brought to its attention. Participants The following is a list of participants in the STIL Working Group. Tony Taylor, Chair John V. Cosley David Dowding Oleg Erlich Yung D. Fan Dave Gallagher Bruce Kaufman Ken Mandl Gregory Maston Gary Murray Chris J. Nelson K
14、en Posse Paul J. Reuter Jose M. Santiago Doug Sprague Allen Yeats This introduction is not part of IEEE 1450.3-2007, Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450TM-1999) for Tester Target Specification. Copyright The Institute of Electrical and Electronics Engine
15、ers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2007 IEEE. All rights reservedv The following members of the individual ballot
16、ing committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 8 March 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Se
17、cretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Michelle D. Turner IEEE Standards Program Manager, Document Development Michael D. Kip
18、ness IEEE Standards Program Manager, Technical Program Development Keith Chow Tommy P. Cooper John V. Cosley Sourav K. Dutta Yung D. Fan Randall C. Groves Kazumi Hatayama Werner Hoelzl Chi Tin Hon Dennis Horwitz Hirofumi Kamitokusari Mark J. Knight Susan K. Land Adam W. Ley G. L. Luri Gregory Maston
19、 Tom Micek Gary L. Michel Yinghua Min Chris J. Nelson Michael S. Newman Noriaki Okumiya Ulrich Pohl Paul J. Reuter Robert A. Robinson Jose M. Santiago Bartien Sayogo Roger J. Sowada Walter Struppler K. S. Subrahmanyam Tony Taylor Srinivasa R. Vemuru Thomas M. Wandeloski Gregg Wilder Oren Yuen Alex G
20、elman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Julian Forster* Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Saha
21、zizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproducti
22、on or networking permitted without license from IHS -,-,- viCopyright 2007 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 2 1.2 Purpose. 2 1.3 TRC limitations 3 2.Normative references. 3 3.Definitions . 3 4.Structure of this standard. 4 4.1 Formats from STIL.0. 4 4.2 Additional formattin
23、g conventions 5 4.3 Dependencies on IEEE Std 1450.1 5 5.STIL syntax description. 6 5.1 Additional reserved words. 6 5.2 Keywords used in a TRC block. 6 6.Statement usage and organization by flow 7 6.1 TRC usage for ATE constraint specification. 8 6.2 TRC usage for design/pattern constraints 9 6.3 TR
24、C usage for pattern reporting 9 6.4 TRC usage for tester targetting 10 7.STIL statement. 10 7.1 STIL syntax 11 7.2 STIL example 11 8.Variables block extensions 11 8.1 Variables block syntax. 11 8.2 Variables example 12 9.Resource statement 13 9.1 Resource statement syntax. 13 10.TRC: TestResourceCon
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