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1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61094-1 Deuxime dition Second edition 2000-07 Microphones de mesure Partie 1: Spcifications des microphones talons de laboratoire Measurement microphones Part 1: Specifications for laboratory standard microphones Numro de rfrence Reference number C
2、EI/IEC 61094-1:2000 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,- Numros des publications Dep
3、uis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CEI incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication
4、 de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements
5、 relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans
6、les documents ci- dessous: Site web de la CEI* Catalogue des publications de la CEI Publi annuellement et mis jour rgulirement (Catalogue en ligne)* Bulletin de la CEI Disponible la fois au site web de la CEI* et comme priodique imprim Terminologie, symboles graphiques et littraux En ce qui concerne
7、 la terminologie gnrale, le lecteur se reportera la CEI 60050: Vocabulaire Electro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le lecteur consultera la CEI 60027: Symboles littraux utiliser en lectrotechnique, la
8、 CEI 60417: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CEI 60617: Symboles graphiques pour schmas. * Voir adresse site web sur la page de titre. Numbering As from 1 January 1997 all IEC publications are issued with a designation in t
9、he 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incor- porating amendment 1 and the base publication incorpor
10、ating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the publication is available in the IEC cat
11、alogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogue of IEC publications Published yearl
12、y with regular updates (On-line catalogue)* IEC Bulletin Available both at the IEC web site* and as a printed periodical Terminology, graphical and letter symbols For general terminology, readers are referred to IEC 60050: International Electrotechnical Vocabulary (IEV). For graphical symbols, and l
13、etter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 60417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for
14、diagrams. * See web site address on title page. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,-
15、 NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61094-1 Deuxime dition Second edition 2000-07 Microphones de mesure Partie 1: Spcifications des microphones talons de laboratoire Measurement microphones Part 1: Specifications for laboratory standard microphones Commission Electrotechnique Intern
16、ationale International Electrotechnical Commission Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2000 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par a
17、ucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the
18、publisher. International Electrotechnical Commission3, rue de Varemb Geneva, Switzerland Telefax: +41 22 919 0300e-mail: inmailiec.ch IEC web site http:/www.iec.ch CODE PRIX PRICE CODEN Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1
19、111111001, User=Wing, Bernie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 61094-1 CEI:2000 SOMMAIRE Pages AVANT-PROPOS . 4 Articles 1Domaine dapplication 6 2Rfrences normatives 6 3Termes et dfinitions . 6 4Conditions ambiantes de rfr
20、ence 12 5Classification des microphones talons de laboratoire . 12 5.1Gnralits. 12 5.2Dsignation du type 14 6Caractristiques des microphones talons de laboratoire. 14 6.1Efficacit. 14 6.2Impdance acoustique 14 6.2.1Gnralits . 14 6.2.2Volume quivalent dun microphone 14 6.3Limite suprieure de ltendue
21、dynamique dun microphone 16 6.4Influence de la pression statique sur lefficacit dun microphone 16 6.5Influence de la temprature sur lefficacit dun microphone . 16 6.6Influence de lhumidit sur lefficacit dun microphone . 16 6.7Rsistance disolement lectrique. 18 6.8Stabilit de lefficacit dun microphon
22、e 18 6.9Fuite dgalisation de pression 18 7Spcifications 18 7.1Dimensions mcaniques . 18 7.2Configuration du blindage de rfrence. 22 7.3Spcifications lectroacoustiques . 24 7.4Marques didentification 26 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee
23、=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,- 61094-1 IEC:2000 3 CONTENTS Page FOREWORD . 5 Clause 1Scope 7 2Normative references. 7 3Terms and definitions. 7 4Reference environmental conditi
24、ons 13 5Classification of laboratory standard microphone . 13 5.1General. 13 5.2Type designation 15 6Characteristics of laboratory standard microphones . 15 6.1Sensitivity. 15 6.2Acoustic impedance 15 6.2.1General. 15 6.2.2Equivalent volume of a microphone. 15 6.3Upper limit of the dynamic range of
25、a microphone. 17 6.4Static pressure dependence of microphone sensitivity 17 6.5Temperature dependence of microphone sensitivity 17 6.6Humidity dependence of microphone sensitivity 17 6.7Electrical insulation resistance 19 6.8Stability of microphone sensitivity . 19 6.9Pressure-equalizing leakage. 19
26、 7Specifications 19 7.1Mechanical dimensions. 19 7.2Ground shield reference configuration 23 7.3Electroacoustical specifications 25 7.4Identification markings 27 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Be
27、rnie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 61094-1 CEI:2000 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ MICROPHONES DE MESURE Partie 1: Spcifications des microphones talons de laboratoire AVANT-PROPOS 1)La CEI (Commission Elec
28、trotechnique Internationale) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectrici
29、t et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernem
30、entales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2)Les dcisions ou accords officiels de la CEI concernant les questions techniqu
31、es reprsentent, dans la mesure du possible un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3)Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, spcifica
32、tions techniques, rapports techniques ou guides, et agrs comme tels par les Comits nationaux. 4)Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs
33、 normes nationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5)La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage q
34、uand un matriel est dclar conforme lune de ses normes. 6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identif
35、i de tels droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CEI 61094-1 a t tablie par le comit dtudes 29 de la CEI: Electroacoustique. Cette deuxime dition annule et remplace la premire dition et le corrigendum publis en 1992. Cette deuxime dition constitue une rvi
36、sion technique. Le texte de cette norme est bas sur la premire dition, le corrigendum et les documents suivants: FDISRapport de vote 29/452/FDIS29/461/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Cette publicati
37、on a t rdige selon les Directives ISO/CEI, Partie 3. Le comit a dcid que cette publication reste valable jusquen 2005. A cette date, selon dcision pralable du comit, la publication sera reconduite; supprime; remplace par une dition rvise, ou amende. Copyright International Electrotechnical Commissio
38、n Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 04:44:13 MSTNo reproduction or networking permitted without license from IHS -,-,- 61094-1 IEC:2000 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT MICROPHONES Part 1: Sp
39、ecifications for laboratory standard microphones FOREWORD 1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operatio
40、n on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with m
41、ay participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by a
42、greement between the two organizations. 2)The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3)The
43、 documents produced have the form of recommendations for international use and are published in the form of standards, technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4)In order to promote international unification, IEC National C
44、ommittees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5)The IEC provides no
45、marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall
46、 not be held responsible for identifying any or all such patent rights. International Standard IEC 61094-1 has been prepared by IEC technical committee 29: Electroacoustics. This second edition cancels and replaces the first edition and corrigendum published in 1992. This second edition constitutes
47、a technical revision. The text of this standard is based on the first edition, the corrigendum and the following documents: FDISReport on voting 29/452/FDIS29/461/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 3. The committee has decided that this publication remains valid until 2005. At this date, in accordance with the committees decision, the publication will be: reconfirmed; withdrawn; replaced by a revised edition, or
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