IEEE-82-2002.pdf
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1、IEEE Std 82-2002 (Revision of IEEE Std 82-1994) IEEE Standards 82 TM IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA 3 March 2003 IEEE Power Engineering
2、 Society Sponsored by the Insulated Conductors Committee IEEE Standards Print: SH95062 PDF: SS95062 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:10:0
3、8 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2003 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 3 March 200
4、3. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Note: Attention is called to the possi
5、bility that implementation of this standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying pa
6、tents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Emp
7、loyees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:10:08 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2003 IEEE. All rights reserved.iii Introduction (This introduction is not part of IEEE Std 82-2002, IEEE Standard Test Procedure for Impuls
8、e Voltage Tests on Insulated Conductors.) The revision to IEEE Std 82-1994, IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors, contains many changes which are designed to make the standard clearer and easier to follow. The revised standard is now completely metric and co
9、ntains more details particularly on test reports. Participants At the time this standard was approved, Working Group C14 of the Cable Systems Subcommittee C of the Insulated Conductors Committee of the IEEE Power Engineering Society had the following membership: Vern Buchholz, Chair Bill Taylor, Vic
10、e Chair The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 11 December 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vic
11、e Chair Judith Gorman, Secretary *Member Emeritus Alain T. Bolliger Thomas C. Champion, III John H. Cooper Yinsan Gau Richard A. Hartlein Wolfgang B. Haverkamp Lauri J. Hiivala Stanley R. Howell Gael R. Kennedy Frank J. Krajick Harry E. Orton Johannes Rickmann Dirk Russwurm John T. Smith, III Mark D
12、. Walton Torben Aabo Kenneth Bow Kraig Bader Vern Buchholz Thomas C. Champion, III Jack Cherry John H. Cooper Tommy Cooper Guru Dutt Dhingra Randall Dotson Robert Gear Luzzi Glenn William Goldbach Ajit Gwal Richard Harp Wolfgang B. Haverkamp Lauri J. Hiivala Edward Horgan, Jr. Dennis Johnson Gael R.
13、 Kennedy Albert Kong William Larzelere Maurice Linker Gregory Luri Keith Malmedal Eric Marsden James Medek Gary Michel Daleep Mohla Shantanu Nandi Johannes Rickmann James Ruggieri Frank Stepniak John Teixeira Milan Uzelac Gerald Vaughn Jonathan Woodworth Sid Bennett H. Stephen Berger Clyde R. Camp R
14、ichard DeBlasio Harold E. Epstein Julian Forster* Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Peter H. Lips Nader Mehravari Daleep C. Mohla William J. Moylan Malcolm V. Thaden Geoffrey O. Thompson How
15、ard L. Wolfman Don Wright Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:10:08 MDTNo reproduction or networking permitted without license from IHS -,-,
16、- ivCopyright 2003 IEEE. All rights reserved. Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Savoula Amanatidis IEEE Standards Managing Editor Copyright The Institute of Electrical and Electronics Eng
17、ineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:10:08 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2003 IEEE. All rights reserved.v Contents 1.Overview 1 1.1 Scope 1 1.2
18、Purpose. 1 2.References 1 3.Testing equipment 2 3.1 Impulse generator 2 3.2 Wave shape 2 4.Specimen 3 4.1 Length 3 4.2 Electrode arrangement. 3 4.3 Sample terminations 3 5.Test procedures 3 5.1 Test temperature 3 5.2 Sample conditioning 4 5.3 Basic Impulse Insulation Level (BIL) qualification tests
19、4 5.4 Impulse design test. 6 5.5 Switching impulse test. 8 5.6 Test reports 8 Annex A (informative) Bibliography 9 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/
20、29/2007 00:10:08 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:10:08 MDTNo r
21、eproduction or networking permitted without license from IHS -,-,- Copyright 2003 IEEE. All rights reserved.1 IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors 1. Overview Insulated conductors in service are subjected to voltage surges from lightning, switching, and othe
22、r sources. These surges vary widely in wave shape, magnitude, and frequency of occurrence. Laboratory tests cannot duplicate the wide variety of surges met in service. Standard test procedures, however, make it possible to compare the impulse strength of different insulations measured by different l
23、aboratories, at different times. 1.1 Scope This test procedure applies to both switching impulse and lightning impulse tests on cables or cable systems incorporating laminated or extruded insulations. The term laminated cable, as used in this procedure, includes high-pressure pipe cable, low-pressur
24、e gas-filled cable, self-contained liquid-filled cable, solid- paper cable, and other taped cable designs. A cable system is a cable with one or more accessories attached. This test procedure is not intended to replace any existing or future standards covering cable or cable acces- sories, impulse g
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